A method of identifying a defect in a wet film comprises conveying said wet film (20), in a wet state, on a conveyor (10), providing a laser projection (1511) onto the wet film, acquiring a series of images, each depicting an area of the wet film, wherein at least a portion of the laser projection is visible, and using at least some of said images to identify said defect. There is also disclosed a method and device for producing a film.

A method of identifying a defect in a wet film comprises conveying said wet film (20), in a wet state, on a conveyor (10), providing a laser projection (1511) onto the wet film, acquiring a series of images, each depicting an area of the wet film, wherein at least a portion of the laser projection is visible, and using at least some of said images to identify said defect. There is also disclosed a method and device for producing a film.

A method for determining properties of a coating on a transparent film, a method for manufacturing a capacitor film and a device configured to determine properties of a coating on a transparent film are disclosed. In an embodiment a method includes moving the transparent film with the coating on a path which passes between a light source and a sensor, illuminating, by the light source, the coating on the transparent film, detecting, by the sensor, an intensity of transmitted light from the light source and calculating, by a processor, the properties of the coating on the transparent film based on the detected intensity of transmitted light.

A method for determining properties of a coating on a transparent film, a method for manufacturing a capacitor film and a device configured to determine properties of a coating on a transparent film are disclosed. In an embodiment a method includes moving the transparent film with the coating on a path which passes between a light source and a sensor, illuminating, by the light source, the coating on the transparent film, detecting, by the sensor, an intensity of transmitted light from the light source and calculating, by a processor, the properties of the coating on the transparent film based on the detected intensity of transmitted light.

The optical sensor of the present disclosure includes: a light source configured to emit irradiation light to a target; a light receiver configured to receive a first incident light, a second incident light, and a third incident light travelling from the target and having different wavelength bands; and a controller configured to control the light source. The light receiver includes: a first light-receiving element configured to receive the first incident light and the second incident light and not to receive the third incident light; and a second light-receiving element configured to receive the third incident light and to receive neither the first incident light nor the second incident light.

The optical sensor of the present disclosure includes: a light source configured to emit irradiation light to a target; a light receiver configured to receive a first incident light, a second incident light, and a third incident light travelling from the target and having different wavelength bands; and a controller configured to control the light source. The light receiver includes: a first light-receiving element configured to receive the first incident light and the second incident light and not to receive the third incident light; and a second light-receiving element configured to receive the third incident light and to receive neither the first incident light nor the second incident light.

Measurement apparatus including an optical sensor, which performs repeatedly transmission measurements through moving sheet of paper or board at at least one wavelength band dominantly absorbed by water, at at least one wavelength band dominantly absorbed by cellulose. The apparatus also includes an X-ray sensor, which performs repeatedly transmission measurements through the moving sheet of paper or board with photons of electromagnetic radiation (1 keV to 10 keV). The apparatus comprises a data processing unit, which receives signals with information on intensities of the optical and X-ray radiations passed through the sheet from the optical sensor and the X-ray sensor, and determines, based on the information, all of the following of the moving sheet: the dry stuff content as a function of the cellulose mass per unit area of the sheet, water mass per unit area of the sheet and the ash mass per unit area of the sheet.

Measurement apparatus including an optical sensor, which performs repeatedly transmission measurements through moving sheet of paper or board at at least one wavelength band dominantly absorbed by water, at at least one wavelength band dominantly absorbed by cellulose. The apparatus also includes an X-ray sensor, which performs repeatedly transmission measurements through the moving sheet of paper or board with photons of electromagnetic radiation (1 keV to 10 keV). The apparatus comprises a data processing unit, which receives signals with information on intensities of the optical and X-ray radiations passed through the sheet from the optical sensor and the X-ray sensor, and determines, based on the information, all of the following of the moving sheet: the dry stuff content as a function of the cellulose mass per unit area of the sheet, water mass per unit area of the sheet and the ash mass per unit area of the sheet.

A method of inspecting a substantially transparent light control layer for an optically variable security device and a corresponding inspection apparatus, the substantially transparent light control layer including a surface relief defined by an array of substantially transparent refractive microstructures. The method includes: directing a beam of substantially collimated light towards a first region that is expected to contain the surface relief of the light control layer so as to generate an inspection light pattern; providing reference data that is indicative of a light control layer that meets a predetermined quality threshold; comparing the inspection light pattern with the reference data; and determining whether the light control layer meets the predetermined quality threshold based on the comparison.

A method of inspecting a substantially transparent light control layer for an optically variable security device and a corresponding inspection apparatus, the substantially transparent light control layer including a surface relief defined by an array of substantially transparent refractive microstructures. The method includes: directing a beam of substantially collimated light towards a first region that is expected to contain the surface relief of the light control layer so as to generate an inspection light pattern; providing reference data that is indicative of a light control layer that meets a predetermined quality threshold; comparing the inspection light pattern with the reference data; and determining whether the light control layer meets the predetermined quality threshold based on the comparison.