Patent classifications
G01N2021/8816
Image inspection device and lighting device
An image inspection device and a lighting device capable of setting an irradiation solid angle for each location of a visual field and capable of miniaturization are provided. The image inspection device includes a photographing portion that photographs the target, and a light transmissible lighting portion that is disposed between the target and the photographing portion and configured to irradiate light in a direction toward the target. The lighting portion includes a plurality of light-emitting portions that is arranged in a matrix form and configured to be capable of selectively emitting light, and an optical system configured to control irradiation directions of the light emitted from each of the plurality of light-emitting portions to be directions corresponding to positions of each of the plurality of light-emitting portions.
Method for producing a prophylactic article
The invention relates to a method for the manufacture of a prophylactic article, especially of a glove, from a (carboxylated) diene rubber, according to which a layer of a (carboxylated) diene latex is applied on a former and the (carboxylated) diene latex is cross-linked with a cross-linking agent, which is immobilized on inorganic and/or organic particles with formation of modified particles, and the modified particles are added to the (carboxylated) diene latex.
VISUAL INSPECTION APPARATUS AND SYSTEM ASSOCIATED THEREWITH
The present disclosure relates to an inspection apparatus for visually inspecting a substantially dark area. The inspection apparatus includes an inspection casing having a sidewall extending between a casing inspection end and a connecting end, an omnidirectional video camera mounted to the casing inspection end of the inspection casing; and a light-emitting assembly at least partially contained in the inspection casing. The sidewall of the inspection casing has a light-permeable section extending along 360 degrees and the light-emitting assembly is configured to emit light through the light-permeable section and from the casing inspection end, and away therefrom. An inspection system is also described.
IV Bag Inspection Apparatus And Method
An apparatus for inspection of IV bags includes a base having a working surface. A conveyor is raised above the working surface with conveyor supports and includes a plurality of bag clips, each adapted to hold one of the IV bags in an inverted position at one of a plurality of workstations. A controller moves the conveyor such that the bag clips each move from one workstation to the next at set intervals. A loading workstation places one of the IV bags into one of the bag clips. A bubble mitigation station agitates a fluid within the IV bag to dislodge any air bubbles. Two particle agitation stations agitate the fluid and any debris particles. An inspection station includes a backlighting apparatus, a camera, a display, and a rejection chute leading to a disposal receptacle. An unloading workstation unloads IV bags that have passed inspection.
Baffles for three-dimensional sensors having spherical fields of view
In one example, a distance sensor includes a camera to capture images of a field of view, a plurality of light sources arranged around a lens of the camera, wherein each light source of the plurality of light sources is configured to project a plurality of beams of light into the field of view, and wherein the plurality of beams of light creates a pattern of projection artifacts in the field of view that is visible to a detector of the camera, a baffle attached to a first light source of the plurality of light sources, wherein the baffle is positioned to limit a fan angle of a plurality of beams of light that is projected by the first light source, and a processing system to calculate a distance from the distance sensor to an object in the field of view, based on an analysis of the images.
SHRIMP PROCESSING SYSTEM
A shrimp processing system conveys raw peeled shrimps to an imaging chamber in which shrimp bits and shrimps with residual shell are detected and diverted from the stream of acceptable shrimps allowed to pass on to downstream processing. An ultraviolet (UV) light source in the imaging chamber is constantly on. A visual inspection system takes images of the passing stream of shrimp when a white-light source is turned on to illuminate an exposure region to detect bits, clumps of shrimps, and acceptable individual shrimps. The visual inspection system takes images of the passing stream when the white-light source is turned off and the exposure region is subjected only to ultraviolet radiation. The visual inspection system detects shrimps with residual shell in the V images. Shrimp bits and shrimps with residual shell are diverted from the stream of shrimps by air jet nozzles to corresponding reject destinations.
ADAPTIVE LIGHTING SYSTEM AND METHOD FOR INSPECTION OF COMPLEX OBJECTS
Illumination systems and methods of designing and construction of the same are disclosed. The resulting illumination systems comprising both Front and Back light modules, provides selectable and programmable illumination according to the requirements of the invention for optimal performance of enhancing defects on a multidimensional object. The light guides are suitably aligned to the Backlight module and mechanically integrated with spring loaded mechanisms to enable them to move freely and subsequently re-postion them to a reference home position as determined at the time of setup of the illumination assembly. The Front light module is utilised to highlight surface defects and mechanically integrated to the illumination system. The illumination modules, may include multiple discrete light emitting components of different spatial intensity distribution and color spectrum mounted in specific layout such that the application oriented combined illuminating effect is created.
LUMINAIRE ELEMENT FOR AN INSPECTION TUNNEL, LUMINAIRE STRIP, AND INSPECTION TUNNEL
The invention relates to a luminaire element (10, 11) for an inspection tunnel (100), in particular for checking shiny surfaces, in particular painted surfaces, comprising at least two, preferably strip-like, arrangements (12) of light sources (13) in a luminaire housing (14) having at least two edge regions (15) lying opposite one another along a longitudinal extension (L) of the luminaire housing (14), wherein the strip-like arrangements (12) of the light sources (13) are formed along the longitudinal extension (L) at the edge regions (16), wherein a light exit surface (20) of the luminaire housing (14) has a higher radiation intensity along the edge regions (16) than in a central region (30). The invention further relates to a luminaire strip (50) having an arrangement of luminaire elements (10, 11) of this kind and to an inspection tunnel having an arrangement of a plurality of luminaire strips (50).
Operator guided inspection device, system, and method
A device, system, and method related to operator guided inspection is disclosed. A portable inspection device (“PID”) is comprised of a housing, display, camera, light array, gyro, location sensor, a non-transitory computer-readable medium, a processor, and a computer-executable instruction set stored on the non-transitory computer-readable medium. The method is comprised of the steps of selecting an inspection task using the PID; capturing an image of the DUT; providing a reference image with reference dimensions; fixing the focal distance on the camera; providing a region of interest (“ROI”) and an alignment region (“AR”) on the display of the PID; adjusting the lighting of the PID to match the illumination on the DUT with the illumination in the reference image; adjusting the distance between the PID and the DUT such that the DUT fits in the ROI; rotating the PID until the ROI and AR merge into a Merged Region; calibrating the Merged Region with the reference image by scaling the pixel-level distances of the Merged Region with the reference dimensions of the reference image; and performing an automated inspection routine on one or more special characteristics of the DUT. The operator guided inspection system (“OGIS”) includes a plurality of PIDs capable of measuring a plurality of DUTs.
INSPECTION APPARATUS AND INSPECTION METHOD FOR INSPECTION OF THE SURFACE APPEARANCE OF A FLAT ITEM THAT REPRESENTS A TEST SPECIMEN
Reflective or embossed regions are supposed to be illuminated as uniformly as possible over the greatest possible angle range for optical inspection using in one aspect an apparatus for inspection having a passive lighting body spotlighted by a spotlight light source, which body illuminates a test region, as well as at least one optical sensor directed at the test region. The lighting body is configured to be partially transmissible, and the optical sensor is disposed, with reference to the test region, optically beyond the lighting body, detecting the test region through the lighting body, and/or the spotlight light source is directed at the lighting body and the lighting body extends continuously over at least 120° in a section plane that stands perpendicular to the surface of the flat items to be tested or inspected.