Patent classifications
G01N2021/8925
THz MEASURING DEVICE AND THz MEASURING METHOD FOR MEASURING A TRANSPORTED MEASURING OBJECT
The present disclosure relates to a THz measuring device for measuring an extruded measuring object.
METHOD AND DEVICE FOR DETECTING PLASTIC FOREIGN OBJECTS WITH LOW CHROMATICITY DIFFERENCE IN SHREDDED TOBACCO THROUGH ONLINE PULSE SPECTRAL IMAGING
A method and a device for detecting plastic foreign objects with low chromaticity difference in shredded tobacco through online pulse spectral imaging are provided. The method includes three steps: negative pressure thin-layer loading of shredded tobacco, pulse line-scanning identification of shredded tobacco, and positive pressure online elimination of foreign objects. Loose shredded tobacco is formed into a fixed and continuous thin layer on a surface of a conveying cylinder under the effect of a negative pressure adsorption force. The surface of the conveying cylinder is coded by areas. An LED linear array light source containing characteristic wavelengths of plastics with low chromaticity difference emits optical pulses, and a line-scanning camera is used to obtain characteristic signals of the plastic foreign objects with low chromaticity difference efficiently in real time.
DEFECT INSPECTION METHOD AND APPARATUS THEREFOR
A defect inspection apparatus includes a first slit light source together with a machine base in which a through hole is formed. A second slit light source and a half mirror are provided inside the through hole. First slit light from the first slit light source is directly incident on an object to be photographed (for example, an automobile body). On the other hand, second slit light from the second slit light source proceeds in a direction perpendicular to the direction in which the first slit light proceeds, and thereafter, is refracted by the half mirror, led out from the through hole, and made incident on the object to be photographed.
METHOD OF TESTING CRYSTALLINITY IN AMORPHOUS PHARMACEUTICAL COMPOSITIONS
Methods of testing pharmaceutical compositions for the presence or absence of active pharmaceutical ingredient (API) crystallinity in an amorphous solid dispersion or solid-state solution using UV/vis spectrometry is provided. Testing may be performed standalone or during manufacturing of a pharmaceutical composition. A predictive model provides for quantitative analysis of the amount of crystalline API based on UV/vis data of corresponding reference samples. Also provided is an apparatus for manufacturing a pharmaceutical composition.
METHODS AND SYSTEMS FOR INCLUSION ANALYSIS
Various methods and systems are provided for analyzing sample inclusions. As one example, a correction factor may be generated based on inclusion properties of a first sample determined using both an optical emission spectrometry (OES) system and a charged-particle microscopy with energy dispersive X-ray spectroscopy (CPM/EDX) system. The OES system may be calibrated with the correction factor. The inclusion properties of a second, different, sample may be determined using the calibrated OES system.
Method and device for detecting plastic foreign objects with low chromaticity difference in shredded tobacco through online pulse spectral imaging
A method and a device for detecting plastic foreign objects with low chromaticity difference in shredded tobacco through online pulse spectral imaging are provided. The method includes three steps: negative pressure thin-layer loading of shredded tobacco, pulse line-scanning identification of shredded tobacco, and positive pressure online elimination of foreign objects. Loose shredded tobacco is formed into a fixed and continuous thin layer on a surface of a conveying cylinder under the effect of a negative pressure adsorption force. The surface of the conveying cylinder is coded by areas. An LED linear array light source containing characteristic wavelengths of plastics with low chromaticity difference emits optical pulses, and a line-scanning camera is used to obtain characteristic signals of the plastic foreign objects with low chromaticity difference efficiently in real time.
Methods and systems for inclusion analysis
Various methods and systems are provided for analyzing sample inclusions. As one example, a correction factor may be generated based on inclusion properties of a first sample determined using both an optical emission spectrometry (OES) system and a charged-particle microscopy with energy dispersive X-ray spectroscopy (CPM/EDX) system. The OES system may be calibrated with the correction factor. The inclusion properties of a second, different, sample may be determined using the calibrated OES system.
STATIC FULL WIDTH MEASUREMENT SYSTEM
A full width measurement system includes a frame having a first and second rails. The first and second rails are positioned transverse to a moving sheet of material such that the first and second rails are positioned on opposite sides of the moving sheet. Sources may be positioned along the first rail in a predetermined arrangement across a width of the moving sheet. Each of the sources are configured to emit energy toward the moving sheet in a predetermined pattern. Detectors may be positioned along the second rail in a predetermined alignment with respect to the sources such that each of the detectors detect an energy level from multiple respective sources after the energy from the respective sources has passed through the moving sheet. Controller circuitry is configured to receive signals from the detectors and provide real time measured parameters spanning the width of the moving sheet of material.
METHODS AND SYSTEMS FOR INCLUSION ANALYSIS
Various methods and systems are provided for analyzing sample inclusions. As one example, a correction factor may be generated based on inclusion properties of a first sample determined using both an optical emission spectrometry (OES) system and a charged-particle microscopy with energy dispersive X-ray spectroscopy (CPM/EDX) system. The OES system may be calibrated with the correction factor. The inclusion properties of a second, different, sample may be determined using the calibrated OES system.
Methods and systems for inclusion analysis
Various methods and systems are provided for analyzing sample inclusions. As one example, a correction factor may be generated based on inclusion properties of a first sample determined using both an optical emission spectrometry (OES) system and a charged-particle microscopy with energy dispersive X-ray spectroscopy (CPM/EDX) system. The OES system may be calibrated with the correction factor. The inclusion properties of a second, different, sample may be determined using the calibrated OES system.