Patent classifications
G01N21/21
Systems and methods for lymph node and vessel imaging
This disclosure provides a method for imaging lymph nodes and lymphatic vessels without a contrast agent. The method includes providing, using an optical source, an infrared illumination to a region of a subject having at least one lymphatic component, detecting a reflected portion of the infrared illumination directly reflected from the region using a sensor positioned thereabout, and generating at least one image indicative of the at least one lymphatic component in the subject using the reflected portion of the infrared illumination.
Systems and methods for lymph node and vessel imaging
This disclosure provides a method for imaging lymph nodes and lymphatic vessels without a contrast agent. The method includes providing, using an optical source, an infrared illumination to a region of a subject having at least one lymphatic component, detecting a reflected portion of the infrared illumination directly reflected from the region using a sensor positioned thereabout, and generating at least one image indicative of the at least one lymphatic component in the subject using the reflected portion of the infrared illumination.
VIBRATION INSENSITIVE INTERFEROMETRY FOR MEASURING THICKNESS AND PROFILE OF MULTILAYER THIN-FILM
The present disclosure relates to an apparatus and a method for a thickness and a profile of a multilayer thin film using a vibration insensitive interference method are provided, which allow measuring the phase of a measurement object by acquiring a plurality of different phase-shifted interference signal images at a time through interference signals between a reference flat and the measurement object by a polarizing beam splitter, a quarter-wave plate, a shutter and a pixelated polarizing camera, and which also allow measuring reflectance of the measurement object by acquiring a plurality of reflected signal images obtained at a time through respective reflected lights for each of a reference surface and the measurement object by a plurality of different polarizers.
VIBRATION INSENSITIVE INTERFEROMETRY FOR MEASURING THICKNESS AND PROFILE OF MULTILAYER THIN-FILM
The present disclosure relates to an apparatus and a method for a thickness and a profile of a multilayer thin film using a vibration insensitive interference method are provided, which allow measuring the phase of a measurement object by acquiring a plurality of different phase-shifted interference signal images at a time through interference signals between a reference flat and the measurement object by a polarizing beam splitter, a quarter-wave plate, a shutter and a pixelated polarizing camera, and which also allow measuring reflectance of the measurement object by acquiring a plurality of reflected signal images obtained at a time through respective reflected lights for each of a reference surface and the measurement object by a plurality of different polarizers.
QUANTUM ENHANCED MAGNETO-OPTICAL MICROSCOPY AND SPECTROSCOPY
A system comprising a nonlinear medium (NLM), an optical transduction module, a dual homodyne detector and a processor is provided. The NLM receives at least a pump beam and issues the pump, probe and conjugate beams, where the beams are linearly polarized. Optics route the probe, the conjugate or both beams to the sample. The sample imparts polarization rotation to light that interacts therewith. The optical transduction module imparts to the interacted light an optical phase shift that is a 1:1 transduction of the polarization rotation, where at least one of the probe light or the conjugate light carries the imparted optical phase shift. The processor obtains the optical-phase shift based on respective detection signals from the dual homodyne detector and determines, based on the obtained optical-phase shift, at least one of a Faraday polarization rotation, a Kerr polarization rotation or a spin noise spectrum.
ELECTROMAGNETIC WAVE DETECTOR AND GAS ANALYSIS DEVICE
An electromagnetic wave detector including a first electromagnetic wave sensor including a light reception unit held in midair above a substrate by a support leg and a second electromagnetic wave sensor including a light reception unit held in midair above the substrate by a support leg having same structure as the support leg of the first electromagnetic wave sensor and provided adjacent to the first electromagnetic wave sensor. The light reception unit of the first electromagnetic wave sensor includes a reflective film, the light reception unit of the second electromagnetic wave sensor includes an electromagnetic wave absorption body for detecting light of a prescribed wavelength band or a prescribed polarization, and the difference between the output of the second electromagnetic wave sensor and the first electromagnetic wave sensor is output.
ELECTROMAGNETIC WAVE DETECTOR AND GAS ANALYSIS DEVICE
An electromagnetic wave detector including a first electromagnetic wave sensor including a light reception unit held in midair above a substrate by a support leg and a second electromagnetic wave sensor including a light reception unit held in midair above the substrate by a support leg having same structure as the support leg of the first electromagnetic wave sensor and provided adjacent to the first electromagnetic wave sensor. The light reception unit of the first electromagnetic wave sensor includes a reflective film, the light reception unit of the second electromagnetic wave sensor includes an electromagnetic wave absorption body for detecting light of a prescribed wavelength band or a prescribed polarization, and the difference between the output of the second electromagnetic wave sensor and the first electromagnetic wave sensor is output.
Multi-dimensional spectroscopy of macromolecules
Information relating to a target molecule in a sample volume containing sample molecules is obtained by applying a sequence of temporally varying fields in a field direction to the sample volume caused by acoustic forces and/or by electromagnetic fields where the sequence of temporally varying fields is chosen to produce a sequence of at least two different perturbed molecular configurations for said target molecule in the sample and where the perturbed molecular configurations are at least in part correlated with the direction of said applied fields. A sequence of probe radiation is applied on the sample molecules and interaction radiation is collected for measuring amplitudes of the interaction radiation collected for a plurality of directions and/or polarizations which are related to the field direction. Where reference spectra are available from previous experiments, the method can be used for identifying a target molecule in the sample volume.
SYSTEMS AND METHODS FOR PREDICTING AND CONTROLLING THE PROPERTIES OF A CHEMICAL SPECIES DURING A TIME-DEPENDENT PROCESS
Devices and methods for controlling the properties of chemical species during time-dependent processes. A device includes a reactor for containing one or more chemical species of a time-dependent process, an extraction pump for automatically and continuously extracting an amount of the one or more chemical species from the reactor, one or more detectors for measuring property changes of the one or more extracted chemical species and generating a continuous stream of data related to the one or more property changes to the one or more chemical species during a time interval, and a process controller configured to fit the continuous stream of data to a mathematical function to predict one or more properties of the one or more chemical species at a future time point and make one or more process decisions based on the prediction of one or more properties at the future time point.
Systems and methods of detecting pipe defects
An example system for detecting pipe defects is provided. The system includes a transmitter, a receiver and a processing device. The transmitter is oriented to transmit Terahertz (THz) waveform pulses towards at least one of an outer surface of a pipe or an inner surface of the pipe. The receiver is oriented to receive reflected Terahertz (THz) waveform pulses from at least one of the outer surface of the pipe or the inner surface of the pipe. The processing device configured is to receive as input the Terahertz (THz) waveform pulses transmitted from the transmitter and the reflected Terahertz (THz) waveform pulses received by the receiver and, based on the received input, determine if a defect in the pipe exists.