A process for detecting oil or lubricant contamination in the production of an article by adding a Stokes-shifting taggant to an oil or lubricant of a machine utilized to produce the article or a component thereof, irradiating the articles produced with a first wavelength of radiation, and monitoring the articles for emission of radiation at a second wavelength. The taggant can be in the form of a composition containing a Stokes-shifting taggant, which absorbs radiation at a first wavelength and emits radiation at a second wavelength, different from said first wavelength, dissolved or dispersed in an oil or lubricant.

A process for detecting oil or lubricant contamination in the production of an article by adding a Stokes-shifting taggant to an oil or lubricant of a machine utilized to produce the article or a component thereof, irradiating the articles produced with a first wavelength of radiation, and monitoring the articles for emission of radiation at a second wavelength. The taggant can be in the form of a composition containing a Stokes-shifting taggant, which absorbs radiation at a first wavelength and emits radiation at a second wavelength, different from said first wavelength, dissolved or dispersed in an oil or lubricant.

Irradiation light in a visible light region is irradiated to a sample while switching irradiation of infrared light IR having a wavelength that corresponds to the infrared absorption spectrum of an observation target material included in the sample between a first state and a second state. A first image and a second image are generated based on the phase distribution, the intensity distribution, and the polarization direction distribution of the light including the irradiation light that has passed through the sample in synchronization with the switching of the infrared light IR irradiation between the first state and the second state. Subsequently, an output image is generated so as to represent one from among the position, size, and shape based on the difference and/or ratio with respect to the pixel values for each pixel between the first image and the second image.

Irradiation light in a visible light region is irradiated to a sample while switching irradiation of infrared light IR having a wavelength that corresponds to the infrared absorption spectrum of an observation target material included in the sample between a first state and a second state. A first image and a second image are generated based on the phase distribution, the intensity distribution, and the polarization direction distribution of the light including the irradiation light that has passed through the sample in synchronization with the switching of the infrared light IR irradiation between the first state and the second state. Subsequently, an output image is generated so as to represent one from among the position, size, and shape based on the difference and/or ratio with respect to the pixel values for each pixel between the first image and the second image.

Systems and methods for thermal radiation detection utilizing a thermal radiation detection system are provided. The thermal radiation detection system includes one or more mercury-cadmium-telluride (HgCdTe)-based photodiode infrared detectors or Indium Antimonide (InSb)-based photodiode infrared detectors and a temperature sensing circuit. The temperature sensing circuit is configured to generate signals correlated to the temperatures of one or more of the plurality of infrared sensor elements. The thermal radiation detection system also includes a signal processing circuit.

Mid-infrared photothermal heterodyne imaging (MIR-PHI) techniques described herein overcome the diffraction limit of traditional MIR imaging and uses visible photodiodes as detectors. MIR-PHI experiments are shown that achieve high sensitivity, sub-diffraction limit spatial resolution, and high acquisition speed. Sensitive, affordable, and widely applicable, photothermal imaging techniques described herein can serve as a useful imaging tool for biological systems and other submicron-scale applications.

Mid-infrared photothermal heterodyne imaging (MIR-PHI) techniques described herein overcome the diffraction limit of traditional MIR imaging and uses visible photodiodes as detectors. MIR-PHI experiments are shown that achieve high sensitivity, sub-diffraction limit spatial resolution, and high acquisition speed. Sensitive, affordable, and widely applicable, photothermal imaging techniques described herein can serve as a useful imaging tool for biological systems and other submicron-scale applications.

A cutting tool with a cutting region and a connecting support region where the support region is designed to connect to an external motor assembly. The cutting tool is also has a porous region that is integrated within a portion of the tool such that as the tool cuts material the porous region can allow samples of the cut material to permeate into an internal chamber of the tool. Once in the internal chamber material samples can be analyzed in-situ for direct composition analysis.

A cutting tool with a cutting region and a connecting support region where the support region is designed to connect to an external motor assembly. The cutting tool is also has a porous region that is integrated within a portion of the tool such that as the tool cuts material the porous region can allow samples of the cut material to permeate into an internal chamber of the tool. Once in the internal chamber material samples can be analyzed in-situ for direct composition analysis.

A spectroscopic measuring device includes a halogen lamp as a light source, a lens of an irradiating system, a mirror, and a spectrometer. The lens of the irradiating optical system emits light from the halogen lamp to a measurement object. The mirror is an optical member, and the mirror is arranged coaxial with the lens and conducts detecting light between the halogen lamp and the measurement object, to the spectrometer. The spectrometer is an analyzing part and analyzes material of the measurement object on the basis of the light received via the mirror. The light from the halogen lamp to the measurement object passes through the peripheral part of the optical axis of the lens, and the light to be received by the spectrometer passes through the center part of the optical axis of the lens, at the position of the mirror.