An example system for detecting pipe defects is provided. The system includes a transmitter, a receiver and a processing device. The transmitter is oriented to transmit Terahertz (THz) waveform pulses towards at least one of an outer surface of a pipe or an inner surface of the pipe. The receiver is oriented to receive reflected Terahertz (THz) waveform pulses from at least one of the outer surface of the pipe or the inner surface of the pipe. The processing device configured is to receive as input the Terahertz (THz) waveform pulses transmitted from the transmitter and the reflected Terahertz (THz) waveform pulses received by the receiver and, based on the received input, determine if a defect in the pipe exists.

An example system for detecting pipe defects is provided. The system includes a transmitter, a receiver and a processing device. The transmitter is oriented to transmit Terahertz (THz) waveform pulses towards at least one of an outer surface of a pipe or an inner surface of the pipe. The receiver is oriented to receive reflected Terahertz (THz) waveform pulses from at least one of the outer surface of the pipe or the inner surface of the pipe. The processing device configured is to receive as input the Terahertz (THz) waveform pulses transmitted from the transmitter and the reflected Terahertz (THz) waveform pulses received by the receiver and, based on the received input, determine if a defect in the pipe exists.

An object permittivity measurement apparatus according to the present disclosure includes: a light wave distance measurement device configured to measure reciprocating time t of a light wave with which an object is irradiated and that is reflected and returned from the object, and calculate a distance L to the object using the following equation (1),

L=ct/2   (1)

c: light speed;
an electromagnetic wave phase measurement device configured to measure a rotated phase φ of an electromagnetic wave having a frequency f with which the object is irradiated and that is reflected and returned from the object; and
a permittivity calculation circuit configured to calculate permittivity ε of a foreign material on an object surface using the following equation (2),

φ=4πLf/c+4π(ε).sup.1/2df/c  (2)

d: a thickness of the foreign material on the object surface.

An object permittivity measurement apparatus according to the present disclosure includes: a light wave distance measurement device configured to measure reciprocating time t of a light wave with which an object is irradiated and that is reflected and returned from the object, and calculate a distance L to the object using the following equation (1),

L=ct/2   (1)

c: light speed;
an electromagnetic wave phase measurement device configured to measure a rotated phase φ of an electromagnetic wave having a frequency f with which the object is irradiated and that is reflected and returned from the object; and
a permittivity calculation circuit configured to calculate permittivity ε of a foreign material on an object surface using the following equation (2),

φ=4πLf/c+4π(ε).sup.1/2df/c  (2)

d: a thickness of the foreign material on the object surface.

This far-infrared spectroscopy device comprises a holding mechanism that is capable of holding a sample in humid air, a detector for detecting light obtained by emitting far infrared light onto the sample, and a signal processing unit for calculating an absorption spectrum of the sample from a signal from the detector. The signal processing unit comprises a threshold processing unit that subjects the signal from the detector to threshold processing and removes the part of the signal influenced by the absorption by the water vapor in the humid air, a signal interpolation unit that carries out interpolation on the signal that has been subjected to the removal by the threshold processing unit, and an absorbance calculation unit for calculating an absorbance from the signal that has been subjected to the interpolation by the signal interpolation unit.

This far-infrared spectroscopy device comprises a holding mechanism that is capable of holding a sample in humid air, a detector for detecting light obtained by emitting far infrared light onto the sample, and a signal processing unit for calculating an absorption spectrum of the sample from a signal from the detector. The signal processing unit comprises a threshold processing unit that subjects the signal from the detector to threshold processing and removes the part of the signal influenced by the absorption by the water vapor in the humid air, a signal interpolation unit that carries out interpolation on the signal that has been subjected to the removal by the threshold processing unit, and an absorbance calculation unit for calculating an absorbance from the signal that has been subjected to the interpolation by the signal interpolation unit.

Methods and systems for determining water status in plant tissue are provided. A number of systems are capable of using terahertz signals to generate signals measuring total water content in plant tissue, including plant leaves. Using these signals, methods are capable of determining water status variables, including water mass per leaf area, relative water content, and leaf water potential, which can aid in agricultural, ecological, and environmental health, such as dehydration and droughst stress of plants.

Methods and systems for determining water status in plant tissue are provided. A number of systems are capable of using terahertz signals to generate signals measuring total water content in plant tissue, including plant leaves. Using these signals, methods are capable of determining water status variables, including water mass per leaf area, relative water content, and leaf water potential, which can aid in agricultural, ecological, and environmental health, such as dehydration and droughst stress of plants.

A method and a system are disclosed for detecting the features of a water layer in layered enclosures of single unit dose products. Thanks to the method and the system of the invention, the layered enclosures may be manufactured to higher specifications and quality owing to real time control of the features of the water layer between the enclosure layers. The technical advantage of the method of the invention consists in the possibility to detect the features after formation of the layered enclosure is complete—hence inspecting the finished product—and to feed back the detected information to the very water laying device for a real time adjustment of the features of the water layer at the areas where acceptance criteria are not met.

A method and a system are disclosed for detecting the features of a water layer in layered enclosures of single unit dose products. Thanks to the method and the system of the invention, the layered enclosures may be manufactured to higher specifications and quality owing to real time control of the features of the water layer between the enclosure layers. The technical advantage of the method of the invention consists in the possibility to detect the features after formation of the layered enclosure is complete—hence inspecting the finished product—and to feed back the detected information to the very water laying device for a real time adjustment of the features of the water layer at the areas where acceptance criteria are not met.