The sample introduction device includes a nebulizer that atomizes a sample liquid; a spray chamber that has one end into which a spray port part of the nebulizer is inserted and the other end from which at least a part of liquid droplets of the sample liquid sprayed from the spray port part is discharged to an outside; and a heating electromagnetic wave radiation unit that is arranged outside the spray chamber, wherein the heating electromagnetic wave radiation unit performs radiation of heating electromagnetic waves from the outside of the spray chamber toward at least a part of the spray chamber other than a part into which the spray port part of the nebulizer is inserted.

The sample introduction device includes a nebulizer that atomizes a sample liquid; a spray chamber that has one end into which a spray port part of the nebulizer is inserted and the other end from which at least a part of liquid droplets of the sample liquid sprayed from the spray port part is discharged to an outside; and a heating electromagnetic wave radiation unit that is arranged outside the spray chamber, wherein the heating electromagnetic wave radiation unit performs radiation of heating electromagnetic waves from the outside of the spray chamber toward at least a part of the spray chamber other than a part into which the spray port part of the nebulizer is inserted.

Provided is a flow analyzer and a flow analysis method each of which makes it possible to stably and continuously measure a sample. The flow analyzer and the flow analysis method each include: a marker introducing device (2) which is for introducing a marker into a tube (3); and a marker detecting device (5) which detects the marker and outputs a detection signal to an analyzing device (4), the analyzing device (4) acquiring analysis data on the basis of the detection signal.

Methods and systems of testing for a gas leak between an inlet zone and an outlet zone of a gas flow component in a shut state are provided. Different tracer and carrier gases are used. The carrier gas is circulated through the outlet zone of the gas flow component to purge the tracer gas from this outlet zone. A spectroscopic emission from the carrier gas indicative of an amount of the purged tracer gas is monitored. A test flow of the tracer gas is introduced in the inlet zone of the gas flow component, and the inlet pressure is increased for successive pressure increments. The presence of a gas leak is determined upon detecting an intensity step variation in the monitored spectroscopic emission following one of the pressure increments in the inlet pressure.

Methods and systems of testing for a gas leak between an inlet zone and an outlet zone of a gas flow component in a shut state are provided. Different tracer and carrier gases are used. The carrier gas is circulated through the outlet zone of the gas flow component to purge the tracer gas from this outlet zone. A spectroscopic emission from the carrier gas indicative of an amount of the purged tracer gas is monitored. A test flow of the tracer gas is introduced in the inlet zone of the gas flow component, and the inlet pressure is increased for successive pressure increments. The presence of a gas leak is determined upon detecting an intensity step variation in the monitored spectroscopic emission following one of the pressure increments in the inlet pressure.

The present disclosure is directed to a system and a method for hydride generation. In some embodiments, the system includes an assembly for introducing hydride generation reagents into a mixing path or mixing container, where the assembly includes first chamber configured to contain a first hydride generation reagent and a second chamber configured to contain a second hydride generation reagent. A first plunger is configured to translate within the first chamber and cause a displacement of the first hydride generation reagent, and a second plunger is configured to translate within the second chamber and cause a displacement of the second hydride generation reagent. The assembly further includes base coupling the first plunger and the second plunger together.

A thin film induction nebulizer is disclosed herein. The nebulizer has a gas capillary and a liquid capillary that are aligned in the same direction within a nebulizer housing and are substantially aligned with a main axis of the nebulizer housing. The nebulizer includes a liquid opening configured to allow liquid to exit the liquid capillary and a gas orifice configured to allow gas to exit the gas capillary. The liquid capillary opens into a chamber that is formed from a liquid channel having a roughened surface and a cover plate. The cover plate interfaces with the liquid channel to partially seal the chamber. The chamber includes an opening where the liquid opening opens into the chamber and also includes another opening proximal to the gas orifice. The end of the nebulizer housing that is proximal to the liquid opening and the gas orifice includes two angled exterior surfaces.

Systems and methods are described for integrated decomposition and scanning of a semiconducting wafer, where a single chamber is utilized for decomposition and scanning of the wafer of interest.

Systems and methods are described for integrated decomposition and scanning of a semiconducting wafer, where a single chamber is utilized for decomposition and scanning of the wafer of interest.

A spectrometer with a Schmidt reflector is described. The spectrometer may include a Schmidt corrector and a dispersive element as separate components. Alternatively, the Schmidt corrector and dispersive element may be combined into a single optical component. The spectrometer may further include a field-flattener lens.