G01N21/951

Sintered ceramic and ceramic sphere

Provided are a sintered ceramic and a ceramic sphere which are inhibited from suffering surface peeling due to fatigue resulting from repetitions of loading and can attain an improvement in dimensional accuracy when subjected to surface processing and which have excellent wear resistance and durability.

Egg Sorting Device, Egg Sorting Method and Recording Medium
20220174912 · 2022-06-09 ·

The egg sorting device includes an image data acquisition unit that acquires image data representing an image obtained by photographing an egg; a first determination unit that determines a state of an egg according to image data acquired by the image data acquisition unit by a learning model trained using training data including information indicating a state of an egg and image data related to the egg; and a decision unit that decides a classification of the egg according to a determination result of a state of an egg.

Defective Soldering Point Intensive Extent Analysis System For Solder Paste Inspection And Method Thereof
20220163461 · 2022-05-26 ·

A defective soldering point intensive extent analysis system for solder paste inspection and a method thereof are disclosed. After the circuit board is set with soldering pastes, the solder paste inspection can immediately detect a circuit board to generate a detection log, the information of defective soldering points in the detection log is analyzed to determine an aggregate of the defective soldering points set on the circuit board, so as to find a defective soldering point area, and generate and display defective soldering point alert information according to statistics of the defective soldering point area, thereby achieving the technical effect of conveniently analyzing the defective soldering points on the circuit board for accurate repair.

Methods and systems for sorting and imaging insects

The present embodiments of the invention generally relate to methods for sorting and imaging insects, including egg and larval life stages, useful for automated high throughput bioassays.

Ceramic ball automatic sorting system and method

The present invention discloses a ceramic ball automatic sorting system and method. The system automatically sucks a ceramic ball on a ceramic ball feeding track for image acquisition, identifies whether the ceramic ball is defective according to the acquired image information, and determines a ball storage device into which the ceramic ball is placed, and the whole process does not require manual participation, which achieves the automation of ceramic ball defect identification and sorting and improves the ceramic ball defect identification accuracy and sorting efficiency. According to the method, images of the ball surface shot at each angle are automatically spliced by using an automatic image splicing technology to achieve full coverage. A defect is identified by using a threshold segmentation algorithm according to a set threshold, and whether the ceramic ball is defective and the ball storage device where the ceramic ball should be placed are determined, thereby achieving the automation of ceramic ball defect identification and sorting, and improving the ceramic ball defect identification accuracy and sorting efficiency.

Methods And Systems For Sorting And Imaging Insects

Systems and methods for sorting and imaging insects, including egg and larval life stages, useful for automated high throughput bioassays.

SYSTEM AND METHOD FOR AUTOMATEDLY DETECTING AND REJECTING CORES HAVING A NON-CONFORMING CORE COLOR PRIOR TO COVERING
20220112035 · 2022-04-14 · ·

Automated system and method wherein the color of each core is detected and distinguished before the core is covered, and any core having a non-conforming core color is rejected and released/removed/eliminated from further processing.

Method for inspecting ball grid array-type semiconductor chip package

Disclosed are a method, an apparatus, and a system for inspecting a ball grid array-type semiconductor chip package. A first embodiment of the present invention provides an apparatus for inspecting a semiconductor chip package, the apparatus comprising: a first image acquisition unit for acquiring a reference image using a three-dimensional image of a semiconductor chip serving as a reference, the reference image being obtained by removing a region of interest from the three-dimensional image; a second image acquisition unit for acquiring a two-dimensional image of a semiconductor chip to be inspected; and an image processing unit for deriving an image of a region of interest of the semiconductor chip to be inspected, from the difference between the reference image and the two-dimensional image.

Ceramic Ball Automatic Sorting System and Method

The present invention discloses a ceramic ball automatic sorting system and method. The system automatically sucks a ceramic ball on a ceramic ball feeding track for image acquisition, identifies whether the ceramic ball is defective according to the acquired image information, and determines a ball storage device into which the ceramic ball is placed, and the whole process does not require manual participation, which achieves the automation of ceramic ball defect identification and sorting and improves the ceramic ball defect identification accuracy and sorting efficiency. According to the method, images of the ball surface shot at each angle are automatically spliced by using an automatic image splicing technology to achieve full coverage. A defect is identified by using a threshold segmentation algorithm according to a set threshold, and whether the ceramic ball is defective and the ball storage device where the ceramic ball should be placed are determined, thereby achieving the automation of ceramic ball defect identification and sorting, and improving the ceramic ball defect identification accuracy and sorting efficiency.

Method and apparatus for inspection of spherical surfaces
11047675 · 2021-06-29 ·

Disclosed are a method and an apparatus for inspection of workpieces and products having curved and, in particular, spherical surfaces. The method is based on scanning inspected objects with a narrow probing beam of electromagnetic radiation and concurrently measuring the radiation scattered on the surface. The method and apparatus improve the detectability of features and imperfections on inspected surfaces by providing invariable parameters and conditions of scanning, robust mechanical stability of scanning systems, high positioning accuracy of the probing electromagnetic beam and efficient collection of the scattered radiation. The apparatus allows surface defect classification, determining defect dimensions and convenient automation of inspection.