G01N2201/0233

METHOD FOR DETECTING HELICOBACTER PYLORI
20180011081 · 2018-01-11 · ·

A method through which a more rapid detection of Helicobacter pylori in a gaseous sample is practicable, in which the .sup.13C content is measured only until a minimum number of measurement values of the .sup.13C content meets a standard deviation to be specified. The known .sup.13C urea breath test has become established for clinical diagnosis for detecting Helicobacter pylori infections and known methods for detecting Helicobacter pylori provide that each method step corresponds to a fixed, specified time, which is disadvantageous, especially for performing a large number of such tests.

Sample cup assembly, system and method for purging
09841360 · 2017-12-12 ·

A sample analysis cup assembly, system and method for purging including a cell body, including a top end; a bottom end; a cell body wall extending axially from the top end to the bottom end; a transverse wall adjacent the top end, including a plurality of apertures extending therethrough; and a raised portion on the transverse wall including a central aperture extending therethrough; a rotatable cap, including a top surface; a bottom surface; and a series of apertures extending from the top surface through the bottom surface, the rotatable cap being structured to engage with the top end of the cell body; and a ring member structured to couple with the bottom end of the cell body are provided.

HIGH-TEMPERATURE OPTICAL PROBE

A probe body (12) in a optical probe (10) including a measurement tube (14) having a plurality of probe vents (16) adapted to allow process fluid to flow there through; two or more purge rings, each including a process window, a purge gas inlet, and a plurality of purge gas outlet openings adapted to direct purge gas toward or adjacent to the process window; and a measurement region defined by a portion of the measurement tube and two or more of the purge rings.

Apparatus and method of hydroxyl detection

The present invention relates to measuring hydroxyl in an atmosphere, including forwarding sunlight and ultraviolet light into a gas cell; switching between nitrogen gas only, or nitrogen gas and water vapor, into the gas cell; emitting ultraviolet rays into the cell which breaks down the water vapor into hydroxyl; and detecting a difference between two states, including 1) an OFF state where only nitrogen gas does not react to the ultraviolet light or the sunlight and there is no OH filter and the detector detects light that OH absorbs; and 2) an ON state where the water vapor is broken down by the ultraviolet rays to produce hydroxyl, and the gas cell acts as an OH filter and does not detect the light that OH absorbs; where a difference in signals measured by the detector in the two states is proportional to a column abundance of OH in earth atmosphere.

GAS FLOW CONFIGURATIONS FOR SEMICONDUCTOR INSPECTIONS

Methods and systems for inspecting a specimen are provided. One system includes an inspection subsystem configured for directing light to an area on the specimen and for generating output responsive to light from the area on the specimen. The system also includes a first gas flow subsystem configured for replacing a gas in a first local volume surrounding the area on the specimen with a first medium that scatters less of the light than the gas. In addition, the system includes a second gas flow subsystem configured for replacing the gas in a second local volume proximate the first local volume with a second medium different than the first medium. The system further includes a computer subsystem configured for detecting abnormalities on the specimen based on the output.

Probe for gas sensor having purge gas protection

A probe for an IR or UV sensor comprising a light emitter and detector is described comprising a lens. The detector detects the spectrums of the emitted light after it has passed a gas to be measured. The sensor of the present invention is especially suitable for such as harsh or aggressive environments measuring the exhaust gasses, for example in ships, vehicles, chimneys etc., and comprises purge gas protections for delicate optical parts to prevent particles etc. from the exhaust gas depositing on the optics. The sensor further has a flow of sample gas from the gas to be measured being adapted to prevent the purge gas from inferring with the measurements.

Nephelometric turbidimeter and method for controlling the humidity of venting air in a nephelometric turbidimeter

A nephelometric turbidimeter for measuring a turbidity of a liquid sample in a transparent sample cuvette. The nephelometric turbidimeter includes a cuvette chamber housing with a cuvette chamber having the transparent sample cuvette arranged therein, and a drying apparatus. The drying apparatus includes a cuvette chamber inlet opening which vents the cuvette chamber, a cuvette chamber outlet opening which de-vents the cuvette chamber, an air circulator which circulates air from the cuvette chamber outlet opening to the cuvette chamber inlet opening, and a drying body. The drying body is provided as a container of a hygroscopic agent defined by a drying substance which is arranged in a drying path between the cuvette chamber outlet opening and the cuvette chamber inlet opening so that air flows through the drying body.

GAS ANALYSIS DEVICE AND LASER LIGHT TRANSMISSION MECHANISM

In order to provide a more practical gas analysis device than that having conventionally been, while keeping the laser source and the photodetector separated from the gas cell, thereby preventing exposure to a high temperature, the gas analysis device includes: a gas cell; a laser source or a photodetector separated from the gas cell; and a laser light transmission mechanism provided between the gas cell and the laser source or the photodetector. The laser light transmission mechanism includes one or a plurality of tubular members, and an inner space of the one or the plurality of tubular members provides a light path for the laser light.

High-temperature optical probe

A probe body (12) in a optical probe (10) including a measurement tube (14) having a plurality of probe vents (16) adapted to allow process fluid to flow there through; two or more purge rings, each including a process window, a purge gas inlet, and a plurality of purge gas outlet openings adapted to direct purge gas toward or adjacent to the process window; and a measurement region defined by a portion of the measurement tube and two or more of the purge rings.

GAS FLOW CONFIGURATIONS FOR SEMICONDUCTOR INSPECTIONS

Methods and systems for inspecting a specimen are provided. One system includes an inspection subsystem configured for directing light to an area on the specimen and for generating output responsive to light from the area on the specimen. The system also includes a first gas flow subsystem configured for replacing a gas in a first local volume surrounding the area on the specimen with a first medium that scatters less of the light than the gas. In addition, the system includes a second gas flow subsystem configured for replacing the gas in a second local volume proximate the first local volume with a second medium different than the first medium. The system further includes a computer subsystem configured for detecting abnormalities on the specimen based on the output.