Disclosed is an operating method of a metal sorting system using laser induced breakdown spectroscopy (LIBS), which may include: analyzing a metal component distribution for various metals using LIBS library information; setting multiple clusters according to the metal component distribution; performing first regression component analysis with respect to spectral data of a metal sample; calculating a probability that the spectral data will belong to each of the set multiple clusters using the first regress component analysis result; performing second regression component analysis with respect to the spectral data which belong to each cluster; and discriminating a type of metal sample by a weighted sum of the calculated probability and the second regression component analysis result.

A system and method for mapping a tissue sample is provided. The system includes a light source, a scanner, a digital mirror device (DMD), a light detector, and an analyzer. The DMD has an array of micromirrors. The analyzer controls the light source, controls the scanner, controls the DMD to have on-state micromirrors aligned with a light beam, and other micromirrors in an off-state. The on-state micromirrors direct the light beam to a tissue sample. The analyzer assigns one or more location codes to the on-state micromirrors, controls the light detector to receive Raman light emitted from the tissue sample, correlates the location codes of the on-state micromirrors with light detector signals representative of the Raman emitted light, and produces a spatial map of the Raman emitted light.

An optical metrology device is capable of detection of any combination of photoluminescence light, specular reflection of broadband light, and scattered light from a line across the width of a sample. The metrology device includes a first light source that produces a first illumination line on the sample. A scanning system may be used to scan an illumination spot across the sample to form the illumination line. A detector collects the photoluminescence light emitted along the illumination line. Additionally, a broadband illumination source may be used to produce a second illumination line on the sample, where the detector collects the broadband illumination reflected along the second illumination line. A signal collecting optic may collect the photoluminescence light and broadband light and focus it into a line, which is received by an optical conduit. The output end of the optical conduit has a shape that matches the entrance of the detector.

An optoelectronic sensor (10) for detecting objects in a monitored zone (20) is provided which has the following: a front screen (38); a light transmitter (12) for transmitting a light beam (16); a movable deflection unit (18) for the periodic sampling of the monitored zone (20) by the light beam (16); a light receiver (26) for generating a received signal from the light beam (22) remitted by the objects; at least one test light transmitter (42); at least one test light transmitter (42), at least one test light receiver (44) and at least one test light reflector (48) which span a test light path (46a-b) through the front screen (38); and an evaluation unit (32) which is configured to acquire pieces of information on the objects in the monitored zone (20) from the received signal and to recognize an impaired light permeability of the front screen (38) from a test light signal which the test light receiver (44) generates from test light which is transmitted from the test light transmitter (42) and which is reflected at the test light reflector (48). In this respect, the test light reflector (48) is arranged such that it moves along with the deflection unit (18).

A system for processing Raman scattering light from a sample is provided. The system includes a source, a digital mirror device (DMD), a detector, and an analyzer. The DMD is configured to reflect Raman scattering light and includes micromirrors selectively controllable between ON and OFF states. The detector is configured to detect Raman scattering light and to produce signals representative of the Raman scattering light. The analyzer is in communication with the light source, the DMD, the detector, and a memory storing instructions, which instructions when executed cause the processor to: a) control the light source to produce a beam of light for interrogating the sample; b) control the DMD to place in an ON or OFF state based on one or more known spectral shapes stored in the memory; and c) process the Raman scattering light reflected by the micromirrors in the ON state.

A detecting unit 4 receives light reflected from the object 2. A detecting unit 4 has a plurality of light guiding members 404 and 405 adjacently arranged so that longitudinal surfaces thereof are arranged along a longitudinal direction of the object 2, and photo sensors 410 and 411 which receive rays that are incident from the longitudinal surfaces constituting a light incident surface of each of the light guiding members and are emitted from light emitting surfaces of the light guiding members. An image forming device 3 forms an image of the reflected light, on the vicinity of the light incident surface. The surface shape of the object 2 in a portion in which the reflected light has been reflected is measured according to an output distribution of each of the photo sensors 410 and 411 arranged to face the light emitting surfaces.

A system for processing Raman scattering light from a sample is provided. The system includes a source, a digital mirror device (DMD), a detector, and an analyzer. The DMD is configured to reflect Raman scattering light and includes micromirrors selectively controllable between ON and OFF states. The detector is configured to detect Raman scattering light and to produce signals representative of the Raman scattering light. The analyzer is in communication with the light source, the DMD, the detector, and a memory storing instructions, which instructions when executed cause the processor to: a) control the light source to produce a beam of light for interrogating the sample; b) control the DMD to place in an ON or OFF state based on one or more known spectral shapes stored in the memory; and c) process the Raman scattering light reflected by the micromirrors in the ON state.

Systems and methods for analyzing samples, such as tissue samples, and measuring the emissions when these samples are exposed to light are disclosed. Embodiments include illuminating multiple target locations on a sample with laser light, which may first be manipulated by a scanner, and receiving decaying emissions from the target location. At least some embodiments include the emissions traveling backwards along a substantial portion of the laser light pathway and being received by a detector. Additional embodiments include converting the received emissions into streak lines of position versus time, converting the streak lines to plots of signal strength versus time, and curve fitting the plots to determine representative decay times. In some embodiments, the decay times are presented as plots of position on the surface of the sample versus emission strength, which may be color coded. Some embodiment dwell on each target location for multiple scans of the laser.

Systems and methods for analyzing samples, such as tissue samples, and measuring the emissions when these samples are exposed to light are disclosed. Embodiments include illuminating multiple target locations on a sample with laser light, which may first be manipulated by a scanner, and receiving decaying emissions from the target location. At least some embodiments include the emissions traveling backwards along a substantial portion of the laser light pathway and being received by a detector. Additional embodiments include converting the received emissions into streak lines of position versus time, converting the streak lines to plots of signal strength versus time, and curve fitting the plots to determine representative decay times. In some embodiments, the decay times are presented as plots of position on the surface of the sample versus emission strength, which may be color coded. Some embodiment dwell on each target location for multiple scans of the laser.

There are provided a welding monitoring system which can multidimensionally monitor a welding portion with high accuracy and a monitoring method thereof, by using a relatively simple configuration. There is provided a welding monitoring system which monitors a subject, including: a mechanical portion; and an imaging portion, in which the mechanical portion includes a transport arm which transports the subject, a subject holding portion which holds the subject, and an energizing device which causes welding with respect to the subject to be performed, and in which the imaging portion includes imaging means for obtaining imaging data of the subject, a data recording portion which records the imaging data, an analyzing portion which extracts predetermined characteristics from the imaging data, a comparison determination portion which compares the extracted characteristics and normal characteristics to each other to determine the presence or absence of abnormality, and a determination result output portion which outputs a determination result by the comparison determination portion.