Patent classifications
G01N2201/121
Exhaust gas analyzer, and exhaust gas analysis method
An exhaust gas analyzer to analyze exhaust gas discharged from an internal combustion engine includes an infrared light source, a photodetector, a CO.sub.2 concentration calculation part and an O.sub.2 concentration calculation part. The infrared light source irradiates infrared light to the exhaust gas. The photodetector detects infrared light after passing through the exhaust gas. The CO.sub.2 concentration calculation part calculates a CO.sub.2 concentration in the exhaust gas on the basis of a detection signal obtained by the photodetector. The O.sub.2 concentration calculation part calculates an O.sub.2 concentration in the exhaust gas from the CO.sub.2 concentration by using a fuel combustion reaction equation and an EGR rate in an exhaust gas recirculation system or a value related to the EGR rate.
METHOD AND DEVICE ASSEMBLY FOR PREDICTING A PARAMETER IN A BIOPROCESS BASED ON RAMAN SPECTROSCOPY AND METHOD AND DEVICE ASSEMBLY FOR CONTROLLING A BIOPROCESS
A method of predicting a parameter of a medium to be observed in a bioprocess based on Raman spectroscopy including the steps of acquiring a first series of preparatory Raman spectra of an aqueous medium using a first measuring assembly; normalizing the first series of preparatory Raman spectra based on a characteristic band of water from at least one Raman spectrum acquired with the first measuring assembly; building a multivariate model for the parameter based on the normalized preparatory Raman spectra; acquiring predictive Raman spectra of the medium to be observed during the bioprocess with another measuring assembly; normalizing the predictive Raman spectra based on a characteristic band of water from at least one Raman spectrum acquired with the other measuring assembly; and applying the built model to the predictive Raman spectra for predicting the parameter.
Systems and methods for an absorbance detector with optical reference
Systems and methods are provided for a UV-VIS spectrophotometer, such as a UV-VIS detector unit included in a high-performance liquid chromatography system. In one example, a system for the UV-VIS detector unit may include a first light source, a signal detector, a flow path positioned intermediate the first light source and the signal detector, a second light source, and a reference detector. The first light source, the signal detector, and the flow path may be aligned along a first axis, and the second light source and the reference detector may be aligned along a second axis, different than the first axis.
LIGHT EMITTING APPARATUS, LIGHT EMITTING METHOD, LIGHT DETECTION APPARATUS, SPECTRUM DETECTION METHOD AND LIGHTING CORRECTION METHOD
A light emitting apparatus has light emitting units. The light emitting units can be respectively provided with current densities, so that the light emitted by each of the light emitting unit has a light intensity, wherein the current densities are different from each other, or partial of the current densities are different from each other. A number of the light emitting units can be larger than or equal to four, all of the four lighting frequencies of the four light emitting units are different from each other, or partial of the four lighting frequencies of the four light emitting units are identical to each other, and the light emitting apparatus and the object under test rotate relative to each other. A light emitting method, a spectrum detection method and a lighting correction method are also illustrated for increasing SNR, correcting the light intensity or the spectrum signal.
SYSTEMS AND METHODS FOR AN ABSORBANCE DETECTOR WITH OPTICAL REFERENCE
Systems and methods are provided for a UV-VIS spectrophotometer, such as a UV-VIS detector unit included in a high-performance liquid chromatography system. In one example, a system for the UV-VIS detector unit may include a first light source, a signal detector, a flow path positioned intermediate the first light source and the signal detector, a second light source, and a reference detector. The first light source, the signal detector, and the flow path may be aligned along a first axis, and the second light source and the reference detector may be aligned along a second axis, different than the first axis.
SEMICONDUCTOR DEVICE MEASURING DEVICE AND METHOD FOR MEASURING SEMICONDUCTOR DEVICE
A semiconductor device measuring device includes: a light generator which generates light; a polarizer which polarizes the light; a wafer stage including a first load port on which an undoped reference wafer is loaded, and a second load port on which a doped sample wafer is loaded, the wafer stage being movable to first and second positions at which the polarized light is incident on the reference wafer and the sample wafer, respectively; a spectroscope which collects first and second Raman spectral information of light reflected from the reference and sample wafers, respectively; a photodetector which detects first and second Raman scattering signals based on the first and second Raman spectral information, respectively; a spectrum corrector which corrects the second Raman scattering signal using the first Raman scattering signal; and a controller which calculates a concentration of the dopant of the sample wafer using the corrected scattering signal.
METHOD OF TESTING DISPLAY DEVICE
A method of testing a display device includes obtaining a photographed image by photographing a target substrate, where the target substrate includes patterns arranged in a first direction and a second direction, obtaining grayscale values of the patterns by grayscaling the photographed image, determining an inspection target pattern from among the patterns, obtaining a first comparison value by comparing a grayscale value of the inspection target pattern with a grayscale value of a first vertically adjacent pattern adjacent in the first direction, obtaining a second comparison value by comparing the grayscale value of the inspection target pattern with a grayscale value of a first diagonally adjacent pattern adjacent in a third direction crossing the first and second directions, obtaining a compensated comparison value by compensating the first comparison value based on the second comparison value, and determining a defect of the inspection target pattern based on the compensated comparison value.
OPTICAL SENSOR FOR EXAMINING VALUABLE DOCUMENTS
An optical sensor for examining value documents, such that at a point in time before the check of the value documents, a self-test of the optical sensor is carried out, during which the light sources thereof are switched on, and, with the aid of monitor elements, the respective light intensity of the light source assigned to the respective monitor element is detected which impinges on the respective monitor element at the time of the self-test. During the check of a value document following the self-test, the light sources illuminate the value document, and measured values are recorded. The recorded measured values are then corrected with the aid of the light intensities detected by the monitor elements at the time of the self-test to take into account a change in the light intensity emitted by the light sources that occurs in the course of the service life of the light sources.
DEVICES, SYSTEMS AND METHODS FOR SORTING AND LABELLING FOOD PRODUCTS
Devices, systems and methods for sorting and labeling food products are provided. Respective spectra of food products for a plurality of segments of a line are received at a controller from at least one line-scan dispersive spectrometer configured to acquire respective spectra of the food products for the plurality of segments of the line. The controller applies one or more machine learning algorithms to the respective spectra to classify the plurality of segments according to at least one of one or more food parameters. The controller controls one or more of a sorting device and a labeling device according to classifying the plurality of segments to cause the food products to be one or more of sorted and labeled according to the at least one of the one or more food parameters.
BIOLOGICAL SAMPLE QUALITY APPARATUS
The present invention relates to a biological sample quality apparatus for determining the quality of a biological sample. The apparatus includes a sample receiver for receiving the biological sample. One or more light sources are provided for supplying light to the sample. An image sensor is provided for capturing an image of the lit sample. The apparatus also includes an image processor for image processing the captured image to determine the quality of the sample. Advantageously, image processing may be used to determine the quality of a sample for use in collection sites and screening laboratories so that acceptability can be determined prior to analyzing the sample. Determination that the sample is of sufficient quality (e.g. sufficient biomaterial) prior to analyzing saves wastage of laboratory time and expense of materials and chemicals. The apparatus may be in the form of desktop or hand-held portable variations.