Patent classifications
G01N2201/1245
System and method for calibrating a PET scanner
A method and system for calibrating a PET scanner are described. The PET scanner may have a field of view (FOV) and multiple detector rings. A detector ring may have multiple detector units. A line of response (LOR) connecting a first detector unit and a second detector unit of the PET scanner may be determined. The LOR may correlate to coincidence events resulting from annihilation of positrons emitted by a radiation source. A first time of flight (TOF) of the LOR may be calculated based on the coincidence events. The position of the radiation source may be determined. A second TOF of the LOR may be calculated based on the position of the radiation source. A time offset may be calculated based on the first TOF and the second TOF. The first detector unit and the second detector unit may be calibrated based on the time offset.
SYSTEM AND METHOD FOR CALIBRATING A PET SCANNER
A method and system for calibrating a PET scanner are described. The PET scanner may have a field of view (FOV) and multiple detector rings. A detector ring may have multiple detector units. A line of response (LOR) connecting a first detector unit and a second detector unit of the PET scanner may be determined. The LOR may correlate to coincidence events resulting from annihilation of positrons emitted by a radiation source. A first time of flight (TOF) of the LOR may be calculated based on the coincidence events. The position of the radiation source may be determined. A second TOF of the LOR may be calculated based on the position of the radiation source. A time offset may be calculated based on the first TOF and the second TOF. The first detector unit and the second detector unit may be calibrated based on the time offset.
GRANULAR-SUBSTANCE COMPONENT MEASURING METHOD AND GRANULAR-SUBSTANCE COMPONENT MEASURING INSTRUMENT
A granular-substance component measuring method comprises steps of emitting detection light to granular substances filled in a space, receiving a reflected light from the granular substances and measuring a component of granular substances by a spectroscopy, and a displacement is given to the granular substances at each measurement, measurements are performed a plurality of times, and measurement results are averaged.
SYSTEM AND METHOD FOR CALIBRATING A PET SCANNER
A method and system for calibrating a PET scanner are described. The PET scanner may have a field of view (FOV) and multiple detector rings. A detector ring may have multiple detector units. A line of response (LOR) connecting a first detector unit and a second detector unit of the PET scanner may be determined. The LOR may correlate to coincidence events resulting from annihilation of positrons emitted by a radiation source. A first time of flight (TOF) of the LOR may be calculated based on the coincidence events. The position of the radiation source may be determined. A second TOF of the LOR may be calculated based on the position of the radiation source. A time offset may be calculated based on the first TOF and the second TOF. The first detector unit and the second detector unit may be calibrated based on the time offset.
System and method for calibrating a PET scanner
A method and system for calibrating a PET scanner are described. The PET scanner may have a field of view (FOV) and multiple detector rings. A detector ring may have multiple detector units. A line of response (LOR) connecting a first detector unit and a second detector unit of the PET scanner may be determined. The LOR may correlate to coincidence events resulting from annihilation of positrons emitted by a radiation source. A first time of flight (TOF) of the LOR may be calculated based on the coincidence events. The position of the radiation source may be determined. A second TOF of the LOR may be calculated based on the position of the radiation source. A time offset may be calculated based on the first TOF and the second TOF. The first detector unit and the second detector unit may be calibrated based on the time offset.
Automatic analyzer
According to one embodiment, an automatic analyzer comprises a light source, a spectroscope, a photo detection unit, a storage unit, a selection unit, and a calculation unit. The storage unit stores photo detector identifiers related to photo detectors and wavelength band identifiers in association with each other. The selection unit selects a specific photo detector from photo detectors. The specific photo detector corresponds to a specific photo detector identifier associated with a wavelength band identifier of a wavelength band according to a measurement item of a sample. The calculation unit calculates an absorbance related to the measurement item based on a signal from the selected specific photo detector.
PROCESSING APPARATUS, PROCESSING SYSTEM, PROCESSING METHOD, AND STORAGE MEDIUM
A processing apparatus includes: a first obtaining unit configured to obtain first image information relating to brightness adjustment of a first image obtained from light including light of a first light source and light of a second light source different from the first light source; a second obtaining unit configured to obtain second image information relating to brightness adjustment of a second image obtained from light of the second light source; and a control unit configured to control each of intensity of a first irradiation light emitted by the first light source and sensitivity of the first image and intensity of a second irradiation light emitted by the second light source and sensitivity of the second image.
Systems and methods for statistical measurement control of spectrophotometric data
A computer implemented method. The method includes obtaining, using a processor, spectral reflectance data from a coated surface having a target coating theron; and determining, using the processor, whether the data includes any outlier data points. The method also includes removing, using the processor, at least one of the outlier data points to produce final spectral reflectance data; and calculating, using the processor, a characteristic of the target coating based at least in part on the final spectral reflectance data.
SYSTEM AND METHOD FOR CALIBRATING A PET SCANNER
A method and system for calibrating a PET scanner are described. The PET scanner may have a field of view (FOV) and multiple detector rings. A detector ring may have multiple detector units. A line of response (LOR) connecting a first detector unit and a second detector unit of the PET scanner may be determined. The LOR may correlate to coincidence events resulting from annihilation of positrons emitted by a radiation source. A first time of flight (TOF) of the LOR may be calculated based on the coincidence events. The position of the radiation source may be determined. A second TOF of the LOR may be calculated based on the position of the radiation source. A time offset may be calculated based on the first TOF and the second TOF. The first detector unit and the second detector unit may be calibrated based on the time offset.
METHOD AND DEVICE FOR DIFFUSE REFLECTANCE SPECTROSCOPY COMPRISING INTENSITY AND/OR OPTICAL FREQUENCY MODULATION OF THE OPTICAL RADIATION
A method for measuring the attenuation coefficient of a scattering and/or absorbing part of a body using diffuse reflectance spectroscopy. The method includes emitting optical radiation, the intensity and/or the optical frequency of which are modulated, with at least part of the optical radiation, called a probe signal, irradiating the body; receiving part of the probe signal, called a backscattered signal, that is scattered and reflected by the body and measuring the path length of the backscattered signal; measuring the reflectance of the part of the body traversed by the backscattered signal; and computing the attenuation coefficient based on the measured path length and on the reflectance.