Patent classifications
G01N2223/055
System, method, and apparatus for x-ray backscatter inspection of parts
Disclosed herein is an x-ray backscatter apparatus for non-destructive inspection of a part. The apparatus comprises an emission shaping mechanism that is configured to receive an electron emission from a cathode and to adjust a shape of the electron emission from a circular cross-sectional shape into a first elliptical cross-sectional shape. The x-ray source further comprises an anode that is configured to convert the electron emission into an unfiltered x-ray emission having a second elliptical cross-sectional shape. The apparatus also comprises an x-ray filter that comprises an emission aperture having a cross-sectional area smaller than an area of the second elliptical cross-sectional shape of the unfiltered x-ray emission. The x-ray filter is located relative to the unfiltered x-ray emission to allow only a portion of the unfiltered x-ray emission to pass through the emission aperture and form a filtered x-ray emission.
SYSTEMS, DEVICES, AND METHODS FOR MULTISOURCE VOLUMETRIC SPECTRAL COMPUTED TOMOGRAPHY
A multisource volumetric spectral computed tomography imaging device includes an x-ray source array with multiple spatially distributed x-ray focal spots, an x-ray beam collimator with an array of apertures, each confining the radiation from a corresponding x-ray focal spot to illuminate a corresponding segment of an object, a digital area x-ray detector, and a gantry to rotate the x-ray source array and the detector around the object. An electronic control unit activates the radiations from the x-ray focal spots to scan the object multiple times as the gantry rotates around the object. The images are used to reconstruct a volumetric CT image of the object with reduced scattered radiation. For dual energy and multi energy imaging, radiation from each focal spot is filtered by a corresponding spectral filter to optimize its energy spectrum.
SYSTEM, METHOD, AND APPARATUS FOR X-RAY BACKSCATTER INSPECTION OF PARTS
Disclosed herein is an x-ray backscatter apparatus for non-destructive inspection of a part. The apparatus comprises an emission shaping mechanism that is configured to receive an electron emission from a cathode and to adjust a shape of the electron emission from a circular cross-sectional shape into a first elliptical cross-sectional shape. The x-ray source further comprises an anode that is configured to convert the electron emission into an unfiltered x-ray emission having a second elliptical cross-sectional shape. The apparatus also comprises an x-ray filter that comprises an emission aperture having a cross-sectional area smaller than an area of the second elliptical cross-sectional shape of the unfiltered x-ray emission. The x-ray filter is located relative to the unfiltered x-ray emission to allow only a portion of the unfiltered x-ray emission to pass through the emission aperture and form a filtered x-ray emission.
Systems, devices, and methods for multisource volumetric spectral computed tomography
A multisource volumetric spectral computed tomography imaging device includes an x-ray source array with multiple spatially distributed x-ray focal spots, an x-ray beam collimator with an array of apertures, each confining the radiation from a corresponding x-ray focal spot to illuminate a corresponding segment of an object, a digital area x-ray detector, and a gantry to rotate the x-ray source array and the detector around the object. An electronic control unit activates the radiations from the x-ray focal spots to scan the object multiple times as the gantry rotates around the object. The images are used to reconstruct a volumetric CT image of the object with reduced scattered radiation. For dual energy and multi energy imaging, radiation from each focal spot is filtered by a corresponding spectral filter to optimize its energy spectrum.