A method includes acquiring a first dataset of projection measurements at a first energy spectrum and a second dataset of projection measurements at a second energy spectrum different from the first energy spectrum by switching between acquiring the first dataset for a set number of consecutive views at different projection angles at the first energy spectrum and acquiring the second dataset for the set number of consecutive views at different projection angles at the second energy spectrum. The set number of consecutive views is greater than one. The method includes supplementing both the first dataset with estimated projection measurements at the first energy spectrum and the second dataset with estimated projection measurements at the second energy spectrum to provide missing projection measurements at different projection angles not acquired during the imaging scan for the first dataset and the second dataset.

A multisource volumetric spectral computed tomography imaging device includes an x-ray source array with multiple spatially distributed x-ray focal spots, an x-ray beam collimator with an array of apertures, each confining the radiation from a corresponding x-ray focal spot to illuminate a corresponding segment of an object, a digital area x-ray detector, and a gantry to rotate the x-ray source array and the detector around the object. An electronic control unit activates the radiations from the x-ray focal spots to scan the object multiple times as the gantry rotates around the object. The images are used to reconstruct a volumetric CT image of the object with reduced scattered radiation. For dual energy and multi energy imaging, radiation from each focal spot is filtered by a corresponding spectral filter to optimize its energy spectrum.

Methods and systems for measuring structural and material characteristics of semiconductor structures based on wavelength resolved, soft x-ray reflectometry (WR-SXR) at multiple diffraction orders are presented. WR-SXR measurements are simultaneous, high throughput measurements over multiple diffraction orders with broad spectral width. The availability of wavelength resolved signal information at each of the multiple diffraction orders improves measurement accuracy and throughput. Each non-zero diffraction order includes multiple measurement points, each different measurement point associated with a different wavelength. In some embodiments, WR-SXR measurements are performed with x-ray radiation energy in a range of 10-5,000 electron volts at grazing angles of incidence in a range of 1-45 degrees. In some embodiments, the illumination beam is controlled to have relatively high divergence in one direction and relatively low divergence in a second direction, orthogonal to the first direction. In some embodiments, multiple detectors are employed, each detecting different diffraction orders.

A method for analyzing flow of a multiphase fluid through a flowmeter is provided. In one embodiment, the method includes transmitting two beams of electromagnetic radiation along different paths through a multiphase fluid and detecting the two transmitted beams with detectors. The method also includes determining a gas fraction and a water-in-liquid ratio of the multiphase fluid. The gas fraction is determined based on the detected first beam of electromagnetic radiation and the water-in-liquid ratio of the multiphase fluid is determined based on the detected second beam of electromagnetic radiation. Additional systems, devices, and methods are also disclosed.

A higher accuracy beam hardening correction with a low calculation load is performed with objects whose elements have a wider range of effective atomic numbers Z.sub.eff, thereby contributing to presentation of more quantitative X-ray images. Of two or more X-ray energy bins, two X-ray bins are selected to normalize X-ray attenuation amount μt in those bins such that one or more normalized X-ray attenuation amounts are obtained at each pixel areas. From reference information indicating a theoretical relationship of correspondence between the normalized X-ray attenuation amounts and effective atomic numbers of elements, one ore more effective atomic numbers are estimated every pixel area. Among the one or more effective atomic numbers (Z.sub.High, Z.sub.Low) and an effective atomic number (Zm) preset for the beam hardening correction, two or more atomic numbers are subjected to their equality determination.

A cabinet X-ray image system for obtaining X-ray images and colorized or grey scale density X-ray images of a specimen includes a sampling chamber for containing the specimen, a display, an X-ray system including, an X-ray source, a photon counting X-ray detector, and a specimen platform, and a controller configured to selectively energize the X-ray source, control the photon counting X-ray detector to collect a projection X-ray image of the specimen when the X-ray source is energized, determine the density of different areas of the specimen from data collected from the photon counting X-ray detector of the projection X-ray image, create a density X-ray image of the specimen wherein different areas of the specimen are indicated as a density or range of densities based on the determined density of different areas of the specimen, and selectively display the density X-ray image of the specimen on the display.

Methods and systems for measuring structural and material characteristics of semiconductor structures based on wavelength resolved, soft x-ray reflectometry (WR-SXR) at multiple diffraction orders are presented. WR-SXR measurements are simultaneous, high throughput measurements over multiple diffraction orders with broad spectral width. The availability of wavelength resolved signal information at each of the multiple diffraction orders improves measurement accuracy and throughput. Each non-zero diffraction order includes multiple measurement points, each different measurement point associated with a different wavelength. In some embodiments, WR-SXR measurements are performed with x-ray radiation energy in a range of 10-5,000 electron volts at grazing angles of incidence in a range of 1-45 degrees. In some embodiments, the illumination beam is controlled to have relatively high divergence in one direction and relatively low divergence in a second direction, orthogonal to the first direction. In some embodiments, multiple detectors are employed, each detecting different diffraction orders.

The present disclosure relates to the field of a cabinet X-ray incorporating an X-ray tube, an X-ray detector, and a real-time camera, either high definition or standard resolution, for the production of organic and non-organic images and a system and method wherein the attained X-ray radiograph may be colorized to designate different densities. In particular, the disclosure relates to a system and method with corresponding apparatus for capturing a real-time image simultaneously with the X-ray image allowing a cabinet X-ray unit to attain and optimize images either in grayscale or colorized with exact orientation of the 2 images and display the resultant images overlaid/blended upon each other and then saved and transmitted in various formats, i.e. .jpeg., .tiff, DICOM, etc.

An inspection system (100) having: a source (101) configured to generate inspection radiation (40); a collimator (103) configured to collimate the inspection radiation into an inspection beam (41) configured to irradiate a section of a vehicle (20); a filter (102) located between the source and the collimator, the filter having at least a cargo configuration and an attenuation configuration; and a controller (104) configured to control the configuration of the filter, such that the filter is in the cargo configuration when the inspection beam irradiates a container (23), and in the attenuation configuration when the inspection beam irradiates a cabin (21).

There is provided a method for assigning an attribute to x-ray attenuation including scanning in an x-ray scanning device first and second reference materials each having known atomic composition, dimensions and orientation in the scanning device. The device emits x-rays which pass through the first reference material with first reference material path lengths and the second reference material with second reference material path lengths. The x-rays are detected by detectors to provide a plurality of dual-energy attenuation images having dual-energy x-ray attenuation information. The dual-energy x-ray attenuation information in the dual-energy attenuation images is associated with the first and second reference material path lengths. Then, each of the first and second reference material path lengths are expressed collectively as a function of the associated attenuation information to define attenuation surfaces upon which may be imposed dual-energy attenuation values to determine corresponding first and second reference material equivalent path lengths.