A method of determining at least one x-ray scanning system geometric property includes the steps of positioning a calibration device inside a scanning chamber of the scanning device, the chamber being intersected by at least one fan beam of x-rays during a scanning operation, measuring a distance between the calibration device and at least one inner wall of the chamber, scanning the calibration device to produce an image of the calibration device, identifying pixels representing the a geometric feature of the calibration device in the image, determining a position and orientation of the pixels representing the geometric feature in the image and, determining a scanning system property based on the position and orientation of the pixels representing the geometric feature in the image. The position and orientation of the feature in the scanning chamber and the x-ray scanning system property may be determined simultaneously.

A system and method is provided for performing material decomposition using a computed tomography (CT) system. The method includes acquiring CT imaging data of an object including data subsets corresponding to at least two different energy spectral bins and using the CT imaging data at each of the at least two different energy spectral bins to form a series of equations for basis material decomposition. The method also includes using a general physical constraint, which quantifies how each basis material in the object is mixed together to form the object, within the series of equations. The method also includes determining at least one basis material density of the object using the physical constraint and the CT imaging data and generating an image of the object using the CT imaging data and the mass densities of at least one basis material.

Molecular structure of a crystal may be solved based on at least two diffraction tilt series acquired from a sample. The two diffraction tilt series include multiple diffraction patterns of at least one crystal of the sample acquired at different electron doses. In some examples, the two diffraction tilt series are acquired at different magnifications.

Methods and system for decomposing a high-energy dual-energy X-ray CT material are disclosed. In the method, two types of effect such as Compton effect and electron pairing effect which dominates are reserved and the influence of the other effect such a photoelectric effect is removed so as to improve the accuracy of the material decomposition. The unique advantage of the present disclosure is to effectively remove the error of the calculated atomic number Z due to directly selecting two effects during processes of material decomposition in the conventional dual-energy CT method. This may greatly improve the accuracy of dual-energy CT identification of the material, and it is important to improve the conventional dual-use CT imaging system applications, such as clinical therapy, security inspection, industrial non-destructive testing, customs anti-smuggling and other fields.

There is provided a method and corresponding system and apparatus for image reconstruction based on image data from a photon-counting multi-bin x-ray detector. The method includes determining (S1) parameter(s) of a given functional form of the relationship between comparator settings expressed in voltage in the read-out chain of the x-ray detector and the corresponding energy threshold values expressed in energy based on a fitting procedure between a first set of data representative of a measured pulse height spectrum and a second set of data representative of a reference pulse height spectrum. The method also includes performing (S2) image reconstruction based on the image data and the determined parameter(s). In this way, efficient high-quality image reconstruction can be achieved.

High-contrast, subtraction, x-ray images of an object are produced via scanned illumination by a laser-Compton x-ray source. The spectral-angle correlation of the laser-Compton scattering process and a specially designed aperture and/or detector are utilized to produce/record a narrow beam of x-rays whose spectral content consists of an on-axis region of high-energy x-rays surrounded by a region of slightly lower-energy x-rays. The end point energy of the laser-Compton source is set so that the high-energy x-ray region contains photons that are above the k-shell absorption edge (k-edge) of a specific contrast agent or specific material within the object to be imaged while the outer region consists of photons whose energy is below the k-edge of the same contrast agent or specific material. Scanning the illumination and of the object by this beam will simultaneously record and map the above edge and below k-edge absorption response of the object.

Provided is a highly reliable X-ray inspection device having two line sensors, in which accurate inspection results can be obtained even when there is displacement of the mounting position of the line sensors. The X-ray inspection device is provided with a conveyor unit for conveying an article, an X-ray emitter, a first line sensor, a second line sensor, a detection unit, and a corrected-image generation unit. The X-ray emitter emits X-rays to the article conveyed by the conveyor unit. The first line sensor detects, in a low energy band, X-rays that have passed through the article. The second line sensor detects, in a high energy band, X-rays that have passed through the article. The detection unit detects positional displacement of the second line sensor with respect to the first line sensor in horizontal direction and vertical direction.

Devices and methods are disclosed for identifying compounds using spectra generated by X-rays at two different voltage levels.

A cabinet X-ray image system for obtaining X-ray images and colorized or grey scale density X-ray images of a specimen includes a sampling chamber for containing the specimen, a display, an X-ray system including, an X-ray source, a photon counting X-ray detector, and a specimen platform, and a controller configured to selectively energize the X-ray source, control the photon counting X-ray detector to collect a projection X-ray image of the specimen when the X-ray source is energized, determine the density of different areas of the specimen from data collected from the photon counting X-ray detector of the projection X-ray image, create a density X-ray image of the specimen wherein different areas of the specimen are indicated as a density or range of densities based on the determined density of different areas of the specimen, and selectively display the density X-ray image of the specimen on the display.

A system includes a stage for supporting a sample having at least first and second atomic elements. The first atomic element has a first characteristic x-ray line with a first energy and the second atomic element has a second characteristic x-ray line with a second energy, the first and second energies lower than 8 keV and separated from one another by less than 1 keV. The system further includes an x-ray source of x-rays having a third energy between the first and second energies and at least one x-ray optic configured to receive and focus at least some of the x-rays as an x-ray beam to illuminate the sample. The system further includes at least one x-ray detector configured to detect fluorescence x-rays produced by the sample in response to being irradiated by the x-ray beam.