The present disclosure describes an apparatus for identifying a refrigerant fluid contained in a tank or in a measuring cell of a system for recharging an air-conditioning plant. The apparatus includes at least one infrared source configured to emit at least radiations with a first emitting intensity at a first wavelength and a second emitting intensity at a second wavelength. A first photodetector is configured to detect a first intensity of infrared radiations at the first wavelength, and a second photodetector is configured to detect a second intensity of infrared radiations at the second wavelength. A processing unit is configured to: calculate a ratio between the first intensity detected by the first photodetector and the second intensity detected by the second photodetector; and according to the Lambert-Beer law, obtain from said ratio a physical magnitude representative of the refrigerant fluid.

An inspection system includes one or more processors and an infrared (IR) camera operably coupled to the one or more processors. The one or more processors control a microwave transmitter to sequentially emit microwaves having different frequencies within a designated frequency range into an object during a first sweep. The IR camera generates thermal image data of the object after the object is heated by each of the different frequencies of microwaves. The one or more processors analyze the thermal image data and determine a selected frequency within the designated frequency range that provides greater heating of the object than one or more other frequencies in the designated frequency range. The one or more processors also analyze select thermal image data of the object, responsive to heating of the object by the selected frequency of microwaves, to detect an element in the object.

An analysis apparatus comprises: a moveable stage assembly; a sample holder on a top surface of the stage assembly; a first photon source and a first photon detector or detector array, the first photon source being configured to emit a first beam of photons that intercepts the surface of a sample at a first location on the sample and the first photon detector or detector array being configured to detect photons that are emitted from the first location; and a second photon source and a second photon detector or detector array, the second photon source being configured to emit a second beam of photons that intercepts the surface of the sample at a second location on the sample, the second location being spaced apart from the first location, and the second photon detector or detector array being configured to detect photons that are emitted from the second location.

Techniques including methods and apparatuses for inert real-time measurement and monitoring of metal and acid concentrations in a processing solution are provided. Methods include performing an analytical method (e.g., spectral measurements) of the processing solution to determine a metal concentration and performing another analytical method (e.g., density measurements) of the processing solution to determine an acid concentration with compensation of raw results based on the determined metal concentration. The determination of the acid concentration can also include compensation of raw results based on another analytical method (e.g., temperature measurements) of the processing solution. The analytical methods can be performed in any order or in parallel. Both metal and acid concentrations in the processing solution can therefore be inertly and continuously measured and monitored in real time.

An analysis apparatus comprises: a moveable stage assembly; a sample holder on a top surface of the stage assembly; a first photon source and a first photon detector or detector array, the first photon source being configured to emit a first beam of photons that intercepts the surface of a sample at a first location on the sample and the first photon detector or detector array being configured to detect photons that are emitted from the first location; and a second photon source and a second photon detector or detector array, the second photon source being configured to emit a second beam of photons that intercepts the surface of the sample at a second location on the sample, the second location being spaced apart from the first location, and the second photon detector or detector array being configured to detect photons that are emitted from the second location.

An inspection system includes one or more processors and an infrared (IR) camera operably coupled to the one or more processors. The one or more processors control a microwave transmitter to sequentially emit microwaves having different frequencies within a designated frequency range into an object during a first sweep. The IR camera generates thermal image data of the object after the object is heated by each of the different frequencies of microwaves. The one or more processors analyze the thermal image data and determine a selected frequency within the designated frequency range that provides greater heating of the object than one or more other frequencies in the designated frequency range. The one or more processors also analyze select thermal image data of the object, responsive to heating of the object by the selected frequency of microwaves, to detect an element in the object.

The present disclosure describes an apparatus for identifying a refrigerant fluid contained in a tank or in a measuring cell of a system for recharging an air-conditioning plant. The apparatus includes at least one infrared source configured to emit at least radiations with a first emitting intensity at a first wavelength and a second emitting intensity at a second wavelength. A first photodetector is configured to detect a first intensity of infrared radiations at the first wavelength, and a second photodetector is configured to detect a second intensity of infrared radiations at the second wavelength. A processing unit is configured to: calculate a ratio between the first intensity detected by the first photodetector and the second intensity detected by the second photodetector; and according to the Lambert-Beer law, obtain from said ratio a physical magnitude representative of the refrigerant fluid.

Disclosed are methods and devices for confocal microscopy in the near-infrared. wavelength. The device uses a near-infrared (NIR) light producing source such as laser; optical components designed to reflect and transmit NIR from a sample; and an NIR detector coupled to a computer for constructing a focal plane image from a raster scan. The detector may be a photodiode or photo-multiplier tube for detecting fluorescence signals in the NIR (800-1700 nm) wavelength range using a variety of NIR-I (800-1000 nm) and NIR-II (1000-1700 nm) dyes and nanomaterials. An imaging method is described using the NIR-confocal microscope for slice by slice 3D imaging of biological tissues throughout a thickness up to, for example, 5 mm in the NIR-II window. The reduced scattering in NIR-II allows for tissue penetration up to about 5-10 mm, superior to 0.2 mm afforded by conventional imaging.