An X-ray high-absorptivity detection system and an image imaging method are provided. The system comprises a fluorescent layer, a light source for emitting X-rays towards the fluorescent layer, a first visible light sensor, a second visible light sensor, a first image acquisition device, a second image acquisition device. First visible photons moving towards the first visible light sensor and second visible photons moving towards the second visible light sensor are generated under the excitation of X photons; the first image acquisition device is configured for obtaining a first image signal by the first visible light sensor acquiring a first visible photon signal, and the second image acquisition device is configured for obtaining a second image signal by the second visible light sensor acquiring a second visible photon signal; an X-ray image signal is obtained by an addition operation on the two image signals.

An imaging apparatus and related method comprising a detector located a distance from a source and positioned to receive a beam of radiation in a trajectory; a detector positioner that translates the detector to an alternate position in a direction that is substantially normal to the trajectory; and a beam positioner that alters the trajectory of the radiation beam to direct the beam onto the detector located at the alternate position.

The disclosure relates to a Mobile Fluoroscopic Device consisting of a Mini-C Arm assembly containing a stepless collimating apparatus which is adjustable using pairs of linear translating, opaque to x-ray plates (2). Each pair of plates are operated by a drive mechanism including a motor (3), gears (4, 6), and racks (5) making it possible to increase or decrease the cross-sectional area of the x-ray beam relative to the x-ray sensor surface area.

X-ray imaging systems and methods comprising, at least, an x-ray source, an x-ray detector, and a collimator assembly. The collimator assembly comprising a computer, a display, a camera, an x-ray source to object (patient) measuring device to measure source to object distance (SOD), and a plurality of metallic barriers used to manipulate a size and shape of X-ray beams, thereby also reducing the volume of irradiated tissue in the patient. The collimator may comprise computer-controlled motorized shutters to admit radiation into the region defined by the adjustable beam-defining components of the collimator of an X-ray apparatus. In some embodiments, the plurality of metallic barriers may be a fixed cone, or a cone comprised of movable plates.

In one embodiment, an X-ray inspection system may access a first set of X-ray images of one or more first samples that are labeled as being non-conforming. The system may adjust a classification algorithm based on the first set of X-ray images. The classification algorithm may classify samples into conforming or non-conforming categories based on an analysis of corresponding X-ray images. The system may analyze a second set of X-ray images of a number of second samples using the adjusted classification algorithm. The second samples may be previously inspected samples that have been classified as conforming by the classification algorithm during a previous analysis before the classification algorithm is adjusted. The system may identify one or more of the second samples from the second set of X-ray images. Each identified second sample may be classified as non-conforming by the adjusted classification algorithm.

In the rotation mechanism for an X-ray inspection apparatus, a plurality of adjustment members configured to adjust the shape of an outer race of a bearing by deforming the outer race are arranged in a circumferential direction of the bearing. The adjustment members are movable relative to an adjustment member holder in a diameter direction of the bearing and contactable with an outer circumferential surface of the outer race. A gap S configured to allow deformation of the outer race is formed between the outer circumferential surface of the outer race and the adjustment member holder in the diameter direction of the bearing.

In one embodiment, a computing system may access design data of a printed circuit board to be produced by a manufacturing process. The system may determine one or more corrections for the design data of the printed circuit board based on one or more correction rules for correcting one or more parameters associated with the printed circuit board. The system may automatically adjust one or more of the parameters associated with the design data of the printed circuit board based on the one or more corrections. The adjusted parameters may be associated with an impedance of the printed circuit board. The one or more corrections may cause the impendence of the printed circuit board to be independent from layer thickness variations of the printed circuit board to be produced by the manufacturing process.

Provided is a tube weld X-ray inspection device for inspecting an abnormality, such as a tube welding part crack, of a heat exchanger by using X-rays.

Method for detecting at least one critical defect in a ceramic rolling element providing the steps of capturing a plurality of two-dimensional digital radiographic images of the ceramic rolling element; digitally filtering each radiographic image; delineating, on the basis of the filtered image, at least one region liable to comprise the critical defect; constructing stereoscopically a virtual model of the ceramic rolling element having the region; comparing the dimensions of the delineated region with a plurality of predetermined threshold values, and, when the dimensions are greater than the threshold values, generating an alarm signal.

In one embodiment, an X-ray inspection system may nondestructively inspect a printed circuit board to measure a number of dimensions at a number of pre-determined locations of the printed circuit board. The X-ray inspection system may generate a data set for the printed circuit board based on the measured dimensions. The X-ray inspection system may calculate one or more drilling values based on the data set of the printed circuit board. The X-ray inspection system may provide, to a drilling machine, instructions for drilling a number of plated-through vias based on the calculated drilling values for the printed circuit board.