Patent classifications
G01N23/046
DETECTION SYSTEM FOR X-RAY INSPECTION OF AN OBJECT
A detection system serves for X-ray inspection of an object. An imaging optical arrangement serves to image the object in an object plane illuminated by X-rays generated by an X-ray source. The imaging optical arrangement comprises an imaging optics to image a transfer field in a field plane into a detection field in a detection plane. A detection array is arranged at the detection field. An object mount holds the object to be imaged and is movable relative to the light source via an object displacement drive along at least one lateral object displacement direction in the object plane. A shield stop with a transmissive shield stop aperture is arranged in an arrangement plane in a light path and is movable via a shield stop displacement drive in the arrangement plane. A control device has a drive control unit, which is in signal connection with the shield stop displacement drive and with the object displacement drive for synchronizing a movement of the shield stop displacement drive and the object displacement drive. The result is an optimization of an X-ray illumination of the object to achieve a high-resolution object imaging.
METHOD AND SYSTEMS FOR ALIASING ARTIFACT REDUCTION IN COMPUTED TOMOGRAPHY IMAGING
Various methods and systems are provided for computed tomography imaging. In one embodiment, a method includes acquiring, with an x-ray detector and an x-ray source coupled to a gantry, a three-dimensional image volume of a subject while the subject moves through a bore of the gantry and the gantry rotates the x-ray detector and the x-ray source around the subject, inputting the three-dimensional image volume to a trained deep neural network to generate a corrected three-dimensional image volume with a reduction in aliasing artifacts present in the three-dimensional image volume, and outputting the corrected three-dimensional image volume. In this way, aliasing artifacts caused by sub-sampling may be removed from computed tomography images while preserving details, texture, and sharpness in the computed tomography images.
SUCTION-CONTROLLABLE TRIAXIAL TEST SYSTEM FOR STUDYING THE MICRO-HYDROMECHANICAL BEHAVIOR OF UNSATURATED SOILS WITH IN-SITU X-RAY MICRO COMPUTED TOMOGRAPHY SCANNING
The subject invention pertains to a suction-controllable triaxial test system and a method for studying the micro-hydro-mechanical behavior of unsaturated soils through the visualization of the in-situ evolution of three-dimensional (3D) microstructure upon triaxial loading in a ((p-u.sub.a), q, s) space. The triaxial apparatus can be small enough to be operated within a micro-focus or nano-focus X-ray CT scanner. Internal characteristics and 3D movements of soil particles and the water and air in soil pores can be visualized during in-situ controllable hydro-mechanical loading processes without disturbing the soil sample. The evolution of 3D micro-structure of unsaturated soil samples of varying matric suction can be directly related with their element-scale behavior for conducting cross-scale fundamental studies.
SUCTION-CONTROLLABLE TRIAXIAL TEST SYSTEM FOR STUDYING THE MICRO-HYDROMECHANICAL BEHAVIOR OF UNSATURATED SOILS WITH IN-SITU X-RAY MICRO COMPUTED TOMOGRAPHY SCANNING
The subject invention pertains to a suction-controllable triaxial test system and a method for studying the micro-hydro-mechanical behavior of unsaturated soils through the visualization of the in-situ evolution of three-dimensional (3D) microstructure upon triaxial loading in a ((p-u.sub.a), q, s) space. The triaxial apparatus can be small enough to be operated within a micro-focus or nano-focus X-ray CT scanner. Internal characteristics and 3D movements of soil particles and the water and air in soil pores can be visualized during in-situ controllable hydro-mechanical loading processes without disturbing the soil sample. The evolution of 3D micro-structure of unsaturated soil samples of varying matric suction can be directly related with their element-scale behavior for conducting cross-scale fundamental studies.
SYSTEMS AND METHODS FOR AUTOMATED X-RAY INSPECTION
A computer-implemented method of automated X-ray inspection during the production of printed circuit board, PCB, assemblies. The method includes capturing an X-ray image of a PCB assembly, determining a first error indicator based on image processing of the captured X-ray image, determining, in case the first error indicator indicates the PCB assembly as faulty, a second error indicator based on the captured X-ray image using a trained adaptive algorithm, and outputting the second error indicator as a result of the inspection.
SYSTEMS AND METHODS FOR AUTOMATED X-RAY INSPECTION
A computer-implemented method of automated X-ray inspection during the production of printed circuit board, PCB, assemblies. The method includes capturing an X-ray image of a PCB assembly, determining a first error indicator based on image processing of the captured X-ray image, determining, in case the first error indicator indicates the PCB assembly as faulty, a second error indicator based on the captured X-ray image using a trained adaptive algorithm, and outputting the second error indicator as a result of the inspection.
IMAGING OPTICAL ARRANGEMENT TO IMAGE AN OBJECT ILLUMINATED BY X-RAYS
An imaging optical arrangement serves to image an object illuminated by X-rays. An imaging optics serves to image a transfer field in a field plane into a detection field in a detection plane. A layer of scintillator material is arranged at the transfer field. A stop is arranged in a pupil plane of the imaging optics. The imaging optics has an optical axis. A center of a stop opening of the stop is arranged at a decentering distance with respect to the optical axis. Such imaging optical arrangement ensures a high quality imaging of the object irrespective of a tilt of X-rays entering the transfer field. The imaging optical arrangement is part of a detection assembly further comprising a detection array and an object mount. Such detection assembly is part of a detection system further comprising a X-ray source.
X-RAY INSPECTION APPARATUS, X-RAY INSPECTION SYSTEM, IMAGE MANAGEMENT METHOD AND PROGRAM
An X-ray inspection apparatus is used for an inspection of a substrate, and the X-ray inspection apparatus includes an image acquisition unit that acquires a plurality of tomographic images for the substrate, an image extraction unit that extracts, from a data set obtained based on the plurality of tomographic images, an inspection tomographic image that is a target for determining whether the substrate is acceptable or not, a saved data generation unit that generates predetermined saved data including at least the inspection tomographic image, and a saved data storage unit that stores the saved data.
APPARATUS FOR PEELING LOGS
Apparatus for peeling a log (5) comprising a cutting station (3), a loading station (2) and a device (4) for transferring logs (5) from the loading station (2) to the cutting station (3), the cutting station (3), the loading station (2) and the transfer device (4), in use, interacting with each other to position the log (5) in the cutting station (3). The loading station (2) comprises a device (10) for axially rotating the log (5) about a second rotation axis (11) and a radiographic examination device (19) configured to generate, in use, radiographic scans of the log (5). An electronic unit is connected both to the radiographic examination device (19), to receive digital-format data from it relating to each radiographic scan generated by it, and to the axial rotation device (10), and which is programmed to use said digital-format data to control the operation of the transfer device (4) and/or the cutting station (3).
APPARATUS FOR PEELING LOGS
Apparatus for peeling a log (5) comprising a cutting station (3), a loading station (2) and a device (4) for transferring logs (5) from the loading station (2) to the cutting station (3), the cutting station (3), the loading station (2) and the transfer device (4), in use, interacting with each other to position the log (5) in the cutting station (3). The loading station (2) comprises a device (10) for axially rotating the log (5) about a second rotation axis (11) and a radiographic examination device (19) configured to generate, in use, radiographic scans of the log (5). An electronic unit is connected both to the radiographic examination device (19), to receive digital-format data from it relating to each radiographic scan generated by it, and to the axial rotation device (10), and which is programmed to use said digital-format data to control the operation of the transfer device (4) and/or the cutting station (3).