An object of the present invention is to improve the accuracy of clustering by avoiding detection of false clusters when automatically clustering points on a scatter diagram. A surface analyzer according to a first aspect of the present invention includes a measurement unit (1-2, 4-8) configured to acquire a signal reflecting a quantity of a plurality of components or elements that are analysis targets at a plurality of positions on a sample (3), a scatter diagram generation unit (92) configured to generate a binary scatter diagram based on a measurement result by the measurement unit, a clustering unit (94) configured to perform clustering of points in the binary scatter diagram using a method of a density-based clustering, and a parameter adjustment unit (93) configured to adjust a distance threshold by utilizing distribution information on a signal value of the components or the elements on either axis in the binary scatter diagram, the distance threshold being one of parameters to be set in the density-based clustering.

A geological analysis system, device, and method are provided. The geological analysis system includes sensors, including an X-ray fluorescence (XRF) unit, which detect properties of geological sample materials, a sample tray which holds the geological sample materials therein, and a processor. The XRF unit includes a body and a separable head unit and an output port configured to emit helium onto the geological sample materials within the sample tray. The sample tray includes chambers formed in an upper surface, ports, and passages, each providing communication between an interior of a chamber and an interior of a port. The ports are configured to be attachable to vials. The processor is configured to automatically position at least one of the sensors and the sample tray with respect to the other of the at least one of the sensors and the sample tray and to control the sensors.

A geological analysis system, device, and method are provided. The geological analysis system includes sensors, including an X-ray fluorescence (XRF) unit, which detect properties of geological sample materials, a sample tray which holds the geological sample materials therein, and a processor. The XRF unit includes a body and a separable head unit and an output port configured to emit helium onto the geological sample materials within the sample tray. The sample tray includes chambers formed in an upper surface, ports, and passages, each providing communication between an interior of a chamber and an interior of a port. The ports are configured to be attachable to vials. The processor is configured to automatically position at least one of the sensors and the sample tray with respect to the other of the at least one of the sensors and the sample tray and to control the sensors.

Systems, devices, and methods according to the present disclosure are configured for use in additive manufacturing, e.g. 3D printing. Various materials, including thermoplastic materials, can be used with an additive manufacturing system to create a part composite. Systems, devices, and methods described herein can be used to identify a characteristic of a material or of a material container for use with an additive manufacturing system. The identified characteristic can be used to determine an authenticity of the material. Based on the authenticity, one or more features or functions of the additive manufacturing system can be updated. The characteristic of the material may be optical information on the container of the material, e.g. a bar code, may be identified by emitting x-ray radiation and receiving a spectral characteristic, may be an electrical or magnetic characteristic or may be engraved on the surface of the material itself.

Systems, devices, and methods according to the present disclosure are configured for use in additive manufacturing, e.g. 3D printing. Various materials, including thermoplastic materials, can be used with an additive manufacturing system to create a part composite. Systems, devices, and methods described herein can be used to identify a characteristic of a material or of a material container for use with an additive manufacturing system. The identified characteristic can be used to determine an authenticity of the material. Based on the authenticity, one or more features or functions of the additive manufacturing system can be updated. The characteristic of the material may be optical information on the container of the material, e.g. a bar code, may be identified by emitting x-ray radiation and receiving a spectral characteristic, may be an electrical or magnetic characteristic or may be engraved on the surface of the material itself.

For volumetric analysis of the elemental composition of a measured sample (3) the method of three-dimensional scanning is executing using fluorescence induced by electromagnetic radiation, in which the primary beam (1) of electromagnetic radiation is flattened and is directed at the measured sample (3) in which it irradiates the measured area (6). From the measured area (6) there exits fluorescence radiation, which is almost completely shielded by the shielding means (7) to a secondary beam (9), which is released towards the shielded detector (4) through the permeable area (8) formed in the shielding means (7). The secondary beam (9) projects the image of the measured area (6) onto the shielded detector (4), which records the data of the measured area (6) and subsequently uses the data to obtain an elemental composition of the measured sample (3), including the distribution of concentration of elements in the sample volume.

For volumetric analysis of the elemental composition of a measured sample (3) the method of three-dimensional scanning is executing using fluorescence induced by electromagnetic radiation, in which the primary beam (1) of electromagnetic radiation is flattened and is directed at the measured sample (3) in which it irradiates the measured area (6). From the measured area (6) there exits fluorescence radiation, which is almost completely shielded by the shielding means (7) to a secondary beam (9), which is released towards the shielded detector (4) through the permeable area (8) formed in the shielding means (7). The secondary beam (9) projects the image of the measured area (6) onto the shielded detector (4), which records the data of the measured area (6) and subsequently uses the data to obtain an elemental composition of the measured sample (3), including the distribution of concentration of elements in the sample volume.

Provided is an electrode catalyst in which the contents of chlorine (Cl) species and bromine (Br) species are reduced to a predetermined level or lower, capable of exhibiting sufficient catalyst performance. The electrode catalyst has a core-shell structure including a support, a core part formed on the support and a shell part formed to cover at least a part of the surface of the core part. A concentration of bromine (Br) species of the electrode catalyst as measured by X-ray fluorescence (XRF) spectroscopy is 400 ppm or less, and a concentration of chlorine (Cl) species of the electrode catalyst as measured by X-ray fluorescence (XRF) spectroscopy is 900 ppm or less.

A doubly bent X-ray spectroscopic device (1) according to the present invention includes: a glass plate (3) which is deformed into a shape having a doubly bent surface by being sandwiched between a doubly curved convex surface (21a) of a convex forming die (21) and a doubly curved concave surface (22a), of a concave forming die (22), that matches the doubly curved convex surface (21a), and being heated to a temperature of 400° C. to 600° C.; and a reflection coating (5) configured to reflect X-rays, which is formed on a concave surface (3a) of the deformed glass plate (3 ).

A method of inspecting a material includes examining a surface of a test material with an eddy current sensor and applying an X-ray fluorescence analysis to the surface of the test material at the same location at which the eddy current examination was performed.