Patent classifications
G01N23/223
X-ray reflectometry apparatus and method thereof for measuring three dimensional nanostructures on flat substrate
This disclosure relates to an apparatus and methods for applying X-ray reflectometry (XRR) in characterizing three dimensional nanostructures supported on a flat substrate with a miniscule sampling area and a thickness in nanometers. In particular, this disclosure is targeted for addressing the difficulties encountered when XRR is applied to samples with intricate nanostructures along all three directions, e.g. arrays of nanostructured poles or shafts. Convergent X-ray with long wavelength, greater than that from a copper anode of 0.154 nm and less than twice of the characteristic dimensions along the film thickness direction, is preferably used with appropriate collimations on both incident and detection arms to enable the XRR for measurements of samples with limited sample area and scattering volumes.
X-ray reflectometry apparatus and method thereof for measuring three dimensional nanostructures on flat substrate
This disclosure relates to an apparatus and methods for applying X-ray reflectometry (XRR) in characterizing three dimensional nanostructures supported on a flat substrate with a miniscule sampling area and a thickness in nanometers. In particular, this disclosure is targeted for addressing the difficulties encountered when XRR is applied to samples with intricate nanostructures along all three directions, e.g. arrays of nanostructured poles or shafts. Convergent X-ray with long wavelength, greater than that from a copper anode of 0.154 nm and less than twice of the characteristic dimensions along the film thickness direction, is preferably used with appropriate collimations on both incident and detection arms to enable the XRR for measurements of samples with limited sample area and scattering volumes.
Polymeric additives made using base addition and related methods
A method for assessing polymeric additive content A in a polymeric particle mixture may comprise determining a concentration B of a metal cation in a polymeric particle mixture comprising parent polymeric particles and polymeric additive particles, wherein the metal cation is selected from alkali earth metals and alkali metals, other than sodium (Na), and the metal cation is capable of forming a water-soluble base; determining a concentration C of the metal cation in the parent polymeric particles; determining a concentration D of the metal cation in the polymeric additive particles; and calculating a polymeric additive content A using formula A=(B−C)/D.
Polymeric additives made using base addition and related methods
A method for assessing polymeric additive content A in a polymeric particle mixture may comprise determining a concentration B of a metal cation in a polymeric particle mixture comprising parent polymeric particles and polymeric additive particles, wherein the metal cation is selected from alkali earth metals and alkali metals, other than sodium (Na), and the metal cation is capable of forming a water-soluble base; determining a concentration C of the metal cation in the parent polymeric particles; determining a concentration D of the metal cation in the polymeric additive particles; and calculating a polymeric additive content A using formula A=(B−C)/D.
Estimating wear for BHA components using borehole hardness
Estimating wear on bottom hole assembly (BHA) components utilizes a rock hardness index using analysis of drill cutting. Estimating the amount of wear on borehole assembly components comprises measuring the rock properties in drilled cuttings from a borehole. A hardness value is assigned to each mineral present in the drilled cuttings. A hardness index is calculated for a drilled borehole interval. A wear resistance factor is assigned to each BHA component of the BHA. The wear resistance factor depends on the wear resistance of each BHA component. A wear value for each BHA component is calculated based on the hardness index for the drilled borehole interval, the wear resistance of the BHA component, and drilling parameters.
Estimating wear for BHA components using borehole hardness
Estimating wear on bottom hole assembly (BHA) components utilizes a rock hardness index using analysis of drill cutting. Estimating the amount of wear on borehole assembly components comprises measuring the rock properties in drilled cuttings from a borehole. A hardness value is assigned to each mineral present in the drilled cuttings. A hardness index is calculated for a drilled borehole interval. A wear resistance factor is assigned to each BHA component of the BHA. The wear resistance factor depends on the wear resistance of each BHA component. A wear value for each BHA component is calculated based on the hardness index for the drilled borehole interval, the wear resistance of the BHA component, and drilling parameters.
METHOD AND SYSTEM FOR ACQUIRING ELASTIC MODULUS OF ROCK CONTAINING SEDIMENTARY RHYTHMS
The present disclosure provides a method and system for acquiring an elastic modulus of a rock containing sedimentary rhythms, including: acquiring a rock sample containing sedimentary rhythms; measuring contents of rock elements in the rock sample at test points with an X-ray fluorescence (XRF) spectrometer, the test points being provided on different rhythms of the rock sample; determining a lithology of the rock sample according to the contents of the rock elements; determining an element-mineral relation equation according to the lithology; determining mineral components of the rock sample with the lithology and the element-mineral relation equation; determining a modulus coefficient of each of minerals according to the mineral components; and determining an elastic modulus of the rock sample according to the mineral components and the modulus coefficient of each of the minerals. The present disclosure can implement nondestructive testing on mechanical properties of rock samples.
METHOD AND SYSTEM FOR ACQUIRING ELASTIC MODULUS OF ROCK CONTAINING SEDIMENTARY RHYTHMS
The present disclosure provides a method and system for acquiring an elastic modulus of a rock containing sedimentary rhythms, including: acquiring a rock sample containing sedimentary rhythms; measuring contents of rock elements in the rock sample at test points with an X-ray fluorescence (XRF) spectrometer, the test points being provided on different rhythms of the rock sample; determining a lithology of the rock sample according to the contents of the rock elements; determining an element-mineral relation equation according to the lithology; determining mineral components of the rock sample with the lithology and the element-mineral relation equation; determining a modulus coefficient of each of minerals according to the mineral components; and determining an elastic modulus of the rock sample according to the mineral components and the modulus coefficient of each of the minerals. The present disclosure can implement nondestructive testing on mechanical properties of rock samples.
X-RAY FLUORESCENCE SPECTROMETER
An X-ray fluorescence spectrometer of the present invention includes: a determination module (21) configured to determine, with respect to every one of measurement lines that correspond to secondary X-rays having intensities to be measured, whether or not a ratio of a theoretical intensity in thin film calculated on the basis of an assumed thickness and known contents of respective components to a theoretical intensity in bulk calculated on the basis of the known contents of the respective components exceeds a predetermined threshold; and a saturation thickness quantification module (23) configured to, according to a positive determination by the determination module (21), calculate a saturation thickness with respect to each of the measurement lines, at which the theoretical intensity saturates, on the basis of the known contents of the respective components and to adopt a largest saturation thickness as a quantitative value of a thickness.
X-RAY FLUORESCENCE SPECTROMETER
An X-ray fluorescence spectrometer of the present invention includes: a determination module (21) configured to determine, with respect to every one of measurement lines that correspond to secondary X-rays having intensities to be measured, whether or not a ratio of a theoretical intensity in thin film calculated on the basis of an assumed thickness and known contents of respective components to a theoretical intensity in bulk calculated on the basis of the known contents of the respective components exceeds a predetermined threshold; and a saturation thickness quantification module (23) configured to, according to a positive determination by the determination module (21), calculate a saturation thickness with respect to each of the measurement lines, at which the theoretical intensity saturates, on the basis of the known contents of the respective components and to adopt a largest saturation thickness as a quantitative value of a thickness.