G01Q60/22

Quantum-dot-based measuring system and method

A quantum-dot-based measuring system is disclosed. The quantum-dot-based measuring system includes a laser to emit excitation light, an optical fiber probe including a tail end and a tapered tip, and the tapered tip of the optical fiber probe is attached with one or more quantum dots, and the excitation light is injected from the tail end of the optical fiber probe and emitted from the tapered tip to a sample to be detected, an objective lens to collect optical signal reflected by the sample and a spectrometer to receive the optical signal.

Quantum-dot-based measuring system and method

A quantum-dot-based measuring system is disclosed. The quantum-dot-based measuring system includes a laser to emit excitation light, an optical fiber probe including a tail end and a tapered tip, and the tapered tip of the optical fiber probe is attached with one or more quantum dots, and the excitation light is injected from the tail end of the optical fiber probe and emitted from the tapered tip to a sample to be detected, an objective lens to collect optical signal reflected by the sample and a spectrometer to receive the optical signal.

INSPECTION APPARATUS AND METHOD OF INSPECTING WAFER
20230204503 · 2023-06-29 ·

An inspection apparatus includes: a first probe including a receiver antenna configured to detect the terahertz wave emitted by an inspection signal source and that has passed through the wafer, wherein the first probe includes: a first probe tip in which the receiver antenna is embedded, the receiver antenna including a first photoconductive switch; a first printed circuit board on which the first probe tip is mounted; a first optical bracket coupled to the first printed circuit board; a first optical connector configured to transmit a first laser beam into the first probe, and coupled to the first optical bracket, wherein the first laser beam is configured to excite the first photoconductive switch.

INSPECTION APPARATUS AND METHOD OF INSPECTING WAFER
20230204503 · 2023-06-29 ·

An inspection apparatus includes: a first probe including a receiver antenna configured to detect the terahertz wave emitted by an inspection signal source and that has passed through the wafer, wherein the first probe includes: a first probe tip in which the receiver antenna is embedded, the receiver antenna including a first photoconductive switch; a first printed circuit board on which the first probe tip is mounted; a first optical bracket coupled to the first printed circuit board; a first optical connector configured to transmit a first laser beam into the first probe, and coupled to the first optical bracket, wherein the first laser beam is configured to excite the first photoconductive switch.

SUBSTRATE UNIT OF NANOSTRUCTURE ASSEMBLY TYPE, OPTICAL IMAGING APPARATUS INCLUDING THE SAME, AND CONTROLLING METHOD THEREOF
20170363967 · 2017-12-21 ·

The present disclosure relates to a substrate unit of a nanostructure assembly type, an optical image apparatus including the same, and a controlling method thereof, and the substrate unit of the nanostructure assembly type according to an exemplary embodiment includes: a lower substrate; an upper substrate separated from the lower substrate, an observation object being able to be positioned at the upper substrate; and at least one metal nanostructure positioned on the lower substrate, wherein the at least one metal nanostructure is capable of being assembled on the lower substrate or separated from the lower substrate.

SUBSTRATE UNIT OF NANOSTRUCTURE ASSEMBLY TYPE, OPTICAL IMAGING APPARATUS INCLUDING THE SAME, AND CONTROLLING METHOD THEREOF
20170363967 · 2017-12-21 ·

The present disclosure relates to a substrate unit of a nanostructure assembly type, an optical image apparatus including the same, and a controlling method thereof, and the substrate unit of the nanostructure assembly type according to an exemplary embodiment includes: a lower substrate; an upper substrate separated from the lower substrate, an observation object being able to be positioned at the upper substrate; and at least one metal nanostructure positioned on the lower substrate, wherein the at least one metal nanostructure is capable of being assembled on the lower substrate or separated from the lower substrate.

METHOD AND SYSTEM FOR POSITIONING USING NEAR FIELD TRANSDUCERS, PARTICULARLY SUITED FOR POSITIONING ELECTRONIC CHIPS USING INTERPOSERS
20170365497 · 2017-12-21 ·

Method for positioning and orienting a first object relative to a second object. Method includes positioning a near field transducer having an aperture on the first object, and directing a laser light toward the aperture of the near field transducer on the first object to create an effervescent wave on the other side of the aperture. Positioning a sensor on the second object for detecting the effervescent wave from the near field transducer. Providing an algorithm, and using information obtained from the sensor on the second object in the algorithm to control a nanopositioning system to position one of the first and second objects in a desired position and orientation relative to the other one of the first and second objects. One or both of the first and second objects may be an interposer, such as a silicon or glass interposer.

Chemical nano-identification of a sample using normalized near-field spectroscopy

Apparatus and method for nano-identification a sample by measuring, with the use of evanescent waves, optical spectra of near-field interaction between the sample and optical nanoantenna oscillating at nano-distance above the sample and discriminating background backscattered radiation not sensitive to such near-field interaction. Discrimination may be effectuated by optical data acquisition at periodically repeated moments of nanoantenna oscillation without knowledge of distance separating nanoantenna and sample. Measurement includes chemical identification of sample on nano-scale, during which absolute value of phase corresponding to near-field radiation representing said interaction is measured directly, without offset. Calibration of apparatus and measurement is provided by performing, prior to sample measurement, a reference measurement of reference sample having known index of refraction. Nano-identification is realized with sub-50 nm resolution and, optionally, in the mid-infrared portion of the spectrum.

Chemical nano-identification of a sample using normalized near-field spectroscopy

Apparatus and method for nano-identification a sample by measuring, with the use of evanescent waves, optical spectra of near-field interaction between the sample and optical nanoantenna oscillating at nano-distance above the sample and discriminating background backscattered radiation not sensitive to such near-field interaction. Discrimination may be effectuated by optical data acquisition at periodically repeated moments of nanoantenna oscillation without knowledge of distance separating nanoantenna and sample. Measurement includes chemical identification of sample on nano-scale, during which absolute value of phase corresponding to near-field radiation representing said interaction is measured directly, without offset. Calibration of apparatus and measurement is provided by performing, prior to sample measurement, a reference measurement of reference sample having known index of refraction. Nano-identification is realized with sub-50 nm resolution and, optionally, in the mid-infrared portion of the spectrum.

METHOD AND SYSTEM FOR POSITIONING USING NEAR FIELD TRANSDUCERS, PARTICULARLY SUITED FOR POSITIONING ELECTRONIC CHIPS
20170356930 · 2017-12-14 ·

Method for positioning and orienting a first object relative to a second object. The method includes positioning a near field transducer having an aperture on the first object, and directing a laser light toward the aperture of the near field transducer on the first object to create an effervescent wave on the other side of the aperture. Positioning a sensor on the second object for detecting the effervescent wave from the near field transducer. Providing an algorithm, and using information obtained from the sensor on the second object in the algorithm to control a nanopositioning system to position one of the first object and the second object in a desired position and orientation relative to the other one of the first object and the second object.