Herein disclosed is a voltage isolation circuit coupled to power supplies. The voltage isolation circuit comprises a series switch group controlled by a first control signal, a parallel switch group controlled by a second control signal, and a first high impedance element. The series switch group comprises a transistor arranged in a first current loop and having two channels connected to one of the power supplies respectively. The first high impedance element, coupled to the transistor in parallel, has a measurement terminal and two ends, connected to one of the power supplies respectively. When the series switch group is conducted, the power supplies are coupled in series in the first current loop. When the parallel switch group is conducted, the power supplies are coupled in parallel in a second current loop. Impedance values measured from the measurement terminal to each end of the first high impedance element are identical.

A test system for measuring electrical current consumption of a device under test (DUT) includes a capacitor with power and ground terminals; a voltage regulator with input and output terminals; first and second switching elements; and a controller. The voltage regulator generates a DUT operating voltage based on its input voltage. The first switching element is arranged between a direct current (DC) voltage source and the regulator input, and the second switching element is arranged between the DC voltage source and the capacitor. The controller operates the switching elements to charge the capacitor, and to configure the test system for measuring operating current of the DUT using the capacitor as the power source.

A test circuit includes a pull-up device, a pull-down device, a switch circuit and a voltage-setting unit. The pull-up device is used to receive a first control signal and coupled to a first end of the device-under-test. The pull-down device is used to receive a second control signal and coupled to the first end of the device-under-test. The switch unit is controlled by a switch signal, used to receive a testing signal and coupled to a second end of the device-under-test. The voltage-setting unit is controlled by a third control signal, used to pull the second end of the device-under-test to a predetermined voltage.

A test system for measuring electrical current consumption of a device under test (DUT) includes a capacitor with power and ground terminals; a voltage regulator with input and output terminals; first and second switching elements; and a controller. The voltage regulator generates a DUT operating voltage based on its input voltage. The first switching element is arranged between a direct current (DC) voltage source and the regulator input, and the second switching element is arranged between the DC voltage source and the capacitor. The controller operates the switching elements to charge the capacitor, and to configure the test system for measuring operating current of the DUT using the capacitor as the power source.

An arrangement includes a plurality of peripheral units and with a sensor, each of the plurality of peripheral units being provided with a connection for connecting the sensor to a supply voltage, includes a sensor input for connecting the sensor, and also includes a measuring resistor for acquiring a sensor current that represents a signal state, where a redundant acquisition and evaluation of the sensor current or a redundant operation of the sensor is permitted on the plurality of peripheral units via suitable measures.

A field device I/O connector includes a base and an I/O module removably mounted on the base for transmitting I/O signals along an I/O channel. A set of electrical connectors mounted on the base connect the base to a field device. The electrical connectors, the base, and the I/O module mounted on the base cooperate to define the I/O channel. The I/O channel includes a conversion circuit to convert between I/O signals and a digital data format output from the field device I/O connector. The base and I/O module also cooperate to define a diagnostic circuit connected to the portion of the I/O channel extending through the I/O module. The diagnostic circuit extends to a diagnostic logic circuit that may be included on the base, in the I/O module, or away from the field device I/O connector.

The present disclosure relates to a measuring system including: an automation field device embodied for determining and/or monitoring a process variable of a medium; a connection unit, which includes a connection plug, which is electrically connected with the field device, and a cable, which is connected to the connection plug with a cable connection and which serves for supplying the field device with electrical energy and/or for transmitting information between the field device and a superordinated unit; and a protective cover, which surrounds the connection unit and the field device connected with the connection unit in a protection section, wherein by means of the protective cover the impact resistance of the measuring system in the protection section is increased.

The disclosure relates to a measuring device for measuring a physical variable. The measuring device has a converter, which is designed to convert an input variable present at a measurement input, into a measurement signal and to provide the same as an output variable. The measuring device comprises a processing unit, which is configured to process the output variable of the converter, and a signal generator, which is designed to generate a test signal on the basis of a specification which test signal corresponds to an output variable of the converter to an input variable of the converter corresponding to the specification. The processing unit can be connected via a switching element either to an output of the converter or to an output of the signal generator. The disclosure further relates to a method for testing a measuring device.

To prevent deterioration of current detection accuracy due to a difference in deterioration between a main MOS and a sense MOS. The load drive device includes a main MOS (101) for supplying a load current to a load, a sense MOS (102) to be used for detection of the load current, and an equalizer circuit (110) and a switch (120) which are provided in parallel between the source terminal of the main MOS and the source terminal of the sense MOS. The drain terminal of the main MOS and the drain terminal of the sense MOS have a common connection, and when a current is detected, the terminal voltage of the main MOS and the terminal voltage of the sense MOS are equalized by the equalizer circuit, and the switch is opened. When a current is not detected, the equalizer circuit is stopped and the switch short-circuits the source terminal of the main MOS and the source terminal of the sense MOS.

The present invention discloses an external battery short-circuit testing device, configured to perform short-circuit test on a battery pack under test. The external battery short-circuit testing device comprises a plurality of fuses; a Hall current transducer, coupled to the plurality of fuses; a current meter, coupled to the Hall current transducer and the battery pack under test; a voltmeter, coupled to the battery pack under test; a variable resistor, coupled to the Hall current transducer; an electromagnetic switch, coupled to the variable resistor and the battery pack under test; and an operation unit, comprising a voltage measurement unit, a current measurement unit, a temperature measurement unit and a switch control unit.