G01R13/029

SWEPT PARAMETER OSCILLOSCOPE
20230019734 · 2023-01-19 · ·

A test and measurement instrument has a user interface configured to allow a user to provide one or more user inputs, a display to display results to the user, a memory, one or more processors configured to execute code to cause the one or more processors to receive a waveform array containing waveforms resulting from sweeping one or more parameters from a set of parameters, recover a clock signal from the waveform array, generate a waveform image for each waveform, render the waveform images into video frames to produce an image array of the video frames, select at least some of the video frames to form a video sequence, and play the video sequence on a display. A method of animating waveform data includes receiving a waveform array containing waveforms resulting from sweeping one or more parameters from a set of parameters, recovering a clock signal from the waveforms, generating a waveform image from each of the waveforms, rendering the waveform images into video frames to produce an image array of the video frames, selecting at least some of the video frames to play as a video sequence, and playing the video sequence on a display.

AUTOMATIC DETERMINATION OF SPECTRUM AND SPECTROGRAM ATTRIBUTES IN A TEST AND MEASUREMENT INSTRUMENT
20230221352 · 2023-07-13 ·

A test and measurement instrument includes a spectrogram generator for producing a first spectrogram image from an input signal, a display for showing the spectrogram image, and a user interface operating in conjunction with the display, the user interface including one or more user controllable inputs and the user interface configured to detect a user action, where the spectrogram generator is structured to produce a second spectrogram image, different from the first spectrogram image, based on the detected user action by the user interface. Methods of automatically generating spectrograms based on user actions are also described.

TEST AND MEASUREMENT INSTRUMENT HAVING SPECTROGRAM WITH CURSOR TIME CORRELATION
20230221353 · 2023-07-13 ·

A test and measurement instrument includes an input port for accepting an input signal for measurement, a display having a first window for showing measurements of the input signal in a time domain, and having a second window for showing measurements of the input signal in a frequency domain, where the time domain of the first window and the frequency domain of the second window are related through a transform having a pre-determined resolution bandwidth, a cursor generator structured to generate a cursor at a specific location in time in the first window, a spectral generator to produce a spectral display of a portion of the input signal that is centered around the cursor and has the pre-determined resolution bandwidth, and an image generator configured to present the generated spectral display in the second window. Methods of generating spectral displays based on user-defined cursor locations are also described.

Method, a diagnosing system and a computer program product for diagnosing a fieldbus type network
11544163 · 2023-01-03 · ·

The invention relates to a method for diagnosing a fieldbus type network. The method comprises the steps of measuring, using a signal measuring device such as an oscilloscope, a bus signal of the fieldbus type network, providing the measured bus signal to a computer system, and generating, by the computer system, a diagnosis. The diagnosis is performed by executing a step of comparing, by the computer system, the measured bus signal with signals in a database of bus signals and corresponding diagnoses; and/or feeding, by the computer system, the measured bus signal to a trained statistical model trained to diagnose the fieldbus type network; as well as a step of outputting the diagnosis based on the output of the comparison and/or the output of the statistical model.

OSCILLOSCOPE AND SIGNAL ANALYSIS METHOD
20220397589 · 2022-12-15 · ·

An oscilloscope includes a signal input circuit, a switching matrix circuit, and a downconverter circuit. The signal input circuit is configured to receive M input signals, wherein at least one of the input signals is a signal comprising at least two carriers. The switching matrix circuit is configured to selectively forward at least one input signal from at least one of the switching matrix inputs to the switching matrix outputs. The downconverter circuit includes a local oscillator and at least two downconverter sub-circuits. The at least two downconverter sub-circuits are configured, for example, to: down-convert a first signal component of the signal that is associated with a first one of the least two carriers based on a local oscillator signal and down-convert a second signal component of the signal that is associated with a second one of the least two carriers based on the local oscillator signal, respectively.

Voltage Monitoring Circuit for Interface

A voltage monitoring circuit is disclosed. An apparatus includes a first physical interface circuit and a real-time oscilloscope circuit configured to monitor a first voltage provided to the first physical interface circuit. The real-time oscilloscope is configured to receive an indication that an error was detected in data transmitted from the first physical interface to a second physical interface circuit. The real-time oscilloscope is further configured to provide for debug, to a host computer external to the first interface, information indicating a state of the first voltage at a time at which the error was detected.

SHORT PATTERN WAVEFORM DATABASE BASED MACHINE LEARNING FOR MEASUREMENT
20220373598 · 2022-11-24 · ·

A test and measurement system includes a test and measurement device configured to receive a signal from a device under test, and one or more processors configured to execute code that causes the one or more processors to generate a waveform from the signal, apply an equalizer to the waveform, receive an input identifying one or more measurements to be made on the waveform, select a number of unit intervals (UIs) for a known data pattern, scan the waveform for the known data patterns having a length of the number of UIs, identify the known data patterns as short pattern waveforms, apply a machine learning system to the short pattern waveforms to obtain a value for the one or more measurements, and provide the values of the one or more measurements for the waveform. A method includes receiving a signal from a device under test, generating a waveform from the signal, applying an equalizer to the waveform, receiving an input identifying one or more measurements to be made on the waveform, selecting a number of unit intervals (UIs), scanning the waveform to identify short pattern waveforms having a length equal to the number of UIs, applying a machine learning system to the short pattern waveforms to obtain a value for the one or more measurements, and providing the values of the one or more measurements for the waveform from the machine learning system.

AUTOMATED TEST EQUIPMENT AND METHOD USING DEVICE SPECIFIC DATA
20230100093 · 2023-03-30 ·

An automated test equipment comprises a tester control configured to broadcast and/or specific upload to matching module input data and/or device-specific data including keys and/or credentials and/or IDs and/or configuration information. The automated test equipment further comprises a channel processing unit configured to transform input data using device specific data in order to obtain device-under-test adapted data for testing the device under test. The channel processing unit further configured to process the DUT data using device specific data in order to evaluate the DUT data. A method and a computer program for testing one or more devices under test in an automated test equipment are also disclosed.

Oscilloscope noise floor de-embedding for high speed toggle signal measurement

A scheme for noise floor de-embedding by identifying a link or relationship between noise floor from an oscilloscope and phase jitter impact on a toggling signal. The scheme uses phase or electrical spectrum and phase detection for noise floor recognition. The scheme de-embeds the impact from random noise and also removes deterministic noise or jitter from the oscilloscope. The scheme provides accurate jitter analysis for a circuit (e.g., clock data recovery circuit) after de-embedding noise floor for the oscilloscope.

INFORMATION PROCESSING APPARATUS, COMPUTER-READABLE MEDIUM, AND INFORMATION PROCESSING METHOD
20230034939 · 2023-02-02 ·

An information processing apparatus includes an extraction unit, a determination unit, a display control unit, and a display unit. The extraction unit is configured to extract, by predetermined pattern matching, candidate peaks in a certain arbitrary period of time from among at least one or more pieces of waveform data. The determination unit is configured to determine, from among the candidate peaks of the waveform data, a single peak based on a score related to the pattern matching. The display control unit is configured to output display information for displaying a position of the peak. The display unit is configured to display the display information.