Provided a method comprising: obtaining waveform data sets of a periodic electric waveform signal, with a length set to one cycle time; calculating a frequency spectrum for each waveform data set; extracting and separating odd and even frequency harmonics to create odd and even frequency harmonic matrices on which a canonical correlation analysis (CCA) being applied to obtain CCA features; performing linear transformation on the CCA features to obtain linear transformed features; generating a model based on the linear transformed features; performing magnitude quantization of frequency spectrums of waveform data sets to identify normal and anomalous waveform signals.

The present invention relates to a method and a measuring apparatus for testing a device under test. A measuring apparatus applies a first test signal to the device under test and measures at least one frequency response parameter of the device under test for a first plurality of frequency values lying in a first frequency range. The measuring apparatus applies a second test signal to the device under test and measures the at least one frequency response parameter of the device under test for a second plurality of frequency values lying in a second frequency range. The first frequency range at least partially overlaps with the second frequency range and the first plurality of frequency values at least partially differs from the second plurality of frequency values.

The present invention relates to a method and a measuring apparatus for testing a device under test. A measuring apparatus applies a first test signal to the device under test and measures at least one frequency response parameter of the device under test for a first plurality of frequency values lying in a first frequency range. The measuring apparatus applies a second test signal to the device under test and measures the at least one frequency response parameter of the device under test for a second plurality of frequency values lying in a second frequency range. The first frequency range at least partially overlaps with the second frequency range and the first plurality of frequency values at least partially differs from the second plurality of frequency values.

An accessory device has a test port, an instrument port to connect to an instrument having an operating bandwidth, and one or more configurable signal paths connectable between the test port and the instrument port to convert a signal from the test port having a first frequency range to a signal having a second frequency range different than the first frequency range. A test and measurement system has a test and measurement instrument having an operating bandwidth, and an accessory device. The accessory device has a first instrument port to connect the accessory device to the test and measurement instrument, a test port to connect the accessory device to a device under test, and one or more configurable signal paths connectable between the test port and the instrument port to down-convert a signal from the test port having a first frequency range to a signal having a second frequency range lower than the first frequency range.

Provided are an apparatus and a method for measuring a frequency of a broadband signal by using low-speed ADCs having sub-Nyquist sampling rates. A plurality of channels each including a low-speed ADC having a sub-Nyquist sampling rate (e.g. sampling frequency from several MHz to hundreds of MHz) are provided, and the frequency of an input signal corresponding to a combination of frequencies calculated through the respective channels is estimated. Therefore, as the number of channels increases, the range of measurable frequencies may be extended.

Provided are an apparatus and a method for measuring a frequency of a broadband signal by using low-speed ADCs having sub-Nyquist sampling rates. A plurality of channels each including a low-speed ADC having a sub-Nyquist sampling rate (e.g. sampling frequency from several MHz to hundreds of MHz) are provided, and the frequency of an input signal corresponding to a combination of frequencies calculated through the respective channels is estimated. Therefore, as the number of channels increases, the range of measurable frequencies may be extended.

Apparatus and associated method for unambiguously evaluating high-bandwidth, rapidly changing analog range data in real time using low-cost components that allow detection of the signal of interest using a sampling rate that is lower than the Nyquist rate required to directly evaluate the full range data bandwidth.

Apparatus and associated method for unambiguously evaluating high-bandwidth, rapidly changing analog range data in real time using low-cost components that allow detection of the signal of interest using a sampling rate that is lower than the Nyquist rate required to directly evaluate the full range data bandwidth.

A method for detecting frequency mismatch in microelectromechanical systems (MEMS) gyroscopes is described. Detection of the frequency mismatch between a drive signal and a sense signal may be performed by generating an output signal whose spectrum reflects the physical characteristics of the gyroscope, and using the output signal to determine the frequency f.sub.C of the sense signal. The output signal may be generated by cross-correlating a random or pseudo-random noise signal with a response signal, where the response signal can be obtained by allowing the noise signal to pass through a system designed to have a noise transfer function that mimics the frequency response of the gyroscope. Since the noise signal is random or pseudo-random, cross-correlating the noise signal with the response signal reveals spectral characteristics of the gyroscope. To improve computational efficiency, the cross-correlation can be performed on demodulated versions of the noise signal and the response signal.

The present invention relates to a method and a measuring apparatus for testing a device under test. A measuring apparatus applies a first test signal to the device under test and measures at least one frequency response parameter of the device under test for a first plurality of frequency values lying in a first frequency range. The measuring apparatus applies a second test signal to the device under test and measures the at least one frequency response parameter of the device under test for a second plurality of frequency values lying in a second frequency range. The first frequency range at least partially overlaps with the second frequency range and the first plurality of frequency values at least partially differs from the second plurality of frequency values.