An inspection tool and associated methods for testing physical and electrical properties of a perforating gun and sending the perforating gun to a wellbore site with at least one of an electrical property and a dimension that has been previously verified. The perforating gun may be received in a perforating gun holder positioned between a first connecting portion and second connecting portion. The first connecting portion may be moved from a first position to a second position at which the at least one of the electrical property and the dimension is measured. Upon verification that the at least one of the electrical property and the dimension is within a predetermined specification, the perforating gun may be sent to the wellbore site.

A method for determining an emission coefficient of a device under test (DUT) using a test circuit comprises coupling a parameter measurement circuit associated with the test circuit to an input pin associated with the DUT, wherein the input pin is coupled to a diode element within the DUT and performing voltage and current measurements associated with the input pin using the parameter measurement circuit. In some embodiments, the method further comprises determining a plurality of contact resistance values respectively based on the voltage and current measurements and an emission coefficient estimate using a contact resistance estimation circuit; and determining an emission coefficient associated with the DUT based on the determined plurality of contact resistance values using an emission coefficient determination circuit.

A contact resistance test method and related devices are provided. When a MOS transistor working in a linear region is tested, a functional relationship between the channel width of the MOS transistor and total resistances of the MOS transistor at sampling temperatures is determined, to determine the contact resistance of the MOS transistor at the sampling temperatures. A calibration coefficient of the contact resistance at a current ambient temperature is determined based on the contact resistance of the MOS transistor at the sampling temperatures. A measurement result of the contact resistance is further adjusted based on the calibration coefficient of the contact resistance at the current ambient temperature, to obtain an accurate contact resistance at the current ambient temperature.

The disclosure includes a method of diagnosing a grounding system of a structure that includes a charge collecting structure conductively connected to the ground via a grounding path, where diagnosing involves an act of monitoring output of a voltage and/or a current and/or an electrostatic detector connected to the grounding path.

A method for measuring a resistance value of a contact plug is provided. The method includes: providing a structure to be tested, and the structure to be tested including: a plurality of transistors disposed on a substrate in sequence, each transistor including a gate and source-drain doping regions on the substrate and located at two sides of the gate, and two adjacent source-drain doping regions are electrically connected; and a plurality of contact plugs disposed on the substrate in sequence, each transistor being located between two adjacent contact plugs, and bottoms of the contact plugs being electrically connected to the source-drain doping regions; selecting at least two units to be tested from the structure to be tested; obtaining resistance values of respective units to be tested by performing measurement; and determining the resistance value of the contact plug based on the resistance values of the respective unit to be tested.

A contact resistance test method and related devices are provided. When a MOS transistor working in a linear region is tested, a functional relationship between the channel width of the MOS transistor and total resistances of the MOS transistor at sampling temperatures is determined, to determine the contact resistance of the MOS transistor at the sampling temperatures. A calibration coefficient of the contact resistance at a current ambient temperature is determined based on the contact resistance of the MOS transistor at the sampling temperatures. A measurement result of the contact resistance is further adjusted based on the calibration coefficient of the contact resistance at the current ambient temperature, to obtain an accurate contact resistance at the current ambient temperature.

An evaluation jig comprises a pair of female terminals connectable to a pair of male terminals of a charging connector, and an adjustment member that can adjust contact resistance of the female terminal and the male terminal. The female terminal is reducible in diameter. The adjustment member can apply an external force to the female terminal to reduce the female terminal in diameter.

Controller of power storage pack performs communication for authentication with controller of an electric moving body according to the pattern of a current flowing through a power line in a state where power storage pack is mounted to electric moving body. Controller of power storage pack measures contact resistance between power storage pack and the electric moving body based on voltage of the power line on power storage pack side, voltage of the power line on the electric moving body side received from controller of the electric moving body, and current when communication for authentication is performed according to the pattern of a current flowing through the power line.

In a method for the determination of an electrical contact property in a contact region between a first contact element of a first plug device and a second complementary contact element of a second plug device, a property of a current path including the first contact element, the contact region, and from the second plug device only the second contact element is evaluated and an induction voltage is generated in the current path for a measurement in the current path to thereby enable to draw a conclusion about the electrical contact property.

A filtering-based power supply apparatus used in a power sourcing equipment (PSE) includes a power supply control circuit and an adaptive filter circuit. The power supply control circuit includes a power supply channel and a detection module. The power supply channel includes a control switch configured to control on and off of the power supply channel. The detection module is configured to send a detection signal to the power supply channel to detect whether a peer device connected to the power supply channel is a valid powered device. The control switch is turned off in a detection process of the power supply channel. The adaptive filter circuit is configured to filter noise in the detection signal in the detection process of the power supply channel.