Patent classifications
G01R27/32
SYSTEM FOR ANALYSING PASSIVE NETWORK
A system for analyzing a passive network is provided, the system being configured to extend the frequency band with the interpolation function of the low frequency band and the extrapolation function of the high frequency band for S-parameters with limited measurement band, adjust the propagation delay time for the band-extended S-parameter to derive the final band-extended S-parameter, and analyze the time response of the passive network on the basis of the output voltage waveform estimated by performing convolution on the impulse response to the derived final band-extended S-parameter and the input voltage waveform of the passive network, thereby improving the time response performance of the passive network without a complex circuit conversion process, and making it possible to be capable of lightweight structures. Furthermore, it is possible to improve the accuracy of the impulse response by adjusting the propagation delay time removed from the band-limited S-parameter.
Method for Calibrating Crosstalk Errors in System for Measuring on-Wafer S Parameters and Electronic Device
A method for calibrating crosstalk errors in a system for measuring on-wafer S parameters and an electronic device are provided. The method includes two parts. The first part is the pre-calibration part, which obtain eight error terms of an on-wafer S parameter measurement system by using a thru calibration standard, two defined load calibration standards, two pairs of undefined reflect calibration standards, and the reciprocity properties of a passive reciprocal element. The first part performs pre-calibration on an uncalibrated system according to the eight error terms. The second part uses the pre-calibrated system to obtain the crosstalk errors of the measurement system, and performs a further calibration on the pre-calibrated system according to the crosstalk errors.
RF signature detection for waveguide deformation
A radio frequency (RF) based waveguide health monitoring system is disclosed. The system employs an RF transmitter for launching a probe RF waveform into a waveguide. Reflections, etc., from the interior of the waveguide of the probe RF waveform create a signature RF waveform, with a health RF receiver receiving this resultant signature RF waveform. A health processing system analyzes the signature RF waveform, and when it detects a change indicative of a deformation of the waveguide, generates a warning signal. This change may be due to bends, flexes, vibrations (or changes in vibrations), or separations of the waveguide. The system may have low frequency, high frequency, or high frequency imaging modes. The system may employ a high-power probe RF waveform, thereby enabling a wireless charging system with power RF receivers located along the length of the waveguide providing additional functionality.
Method and apparatus for detecting circuit defects
The disclosure relates to an RFIC apparatus, and more particularly, to an RFIC circuit having a test circuit, a test apparatus, and a test method thereof. Further, the disclosure relates to a method for estimating or determining a DC gain using a test apparatus and an RF circuit in a DC/AC test stage, and detecting defects of the RF circuit based on the estimated or determined DC gain.
Method and apparatus for detecting circuit defects
The disclosure relates to an RFIC apparatus, and more particularly, to an RFIC circuit having a test circuit, a test apparatus, and a test method thereof. Further, the disclosure relates to a method for estimating or determining a DC gain using a test apparatus and an RF circuit in a DC/AC test stage, and detecting defects of the RF circuit based on the estimated or determined DC gain.
Signal detection circuit and sensor with interferometer circuit to sensitively detect small variation in signal size
The present exemplary embodiments provide a signal detection circuit and a sensor which improve a quality factor of a resonator by modeling an initial state of the resonator using an attenuator and a phase shifter which are modeling paths and significantly change a transmission coefficient of the resonator even with a small variation of an object to be measured.
MEASURING APPARATUS AND A MEASURING METHOD OF ELECTROMAGNETIC INTERFERENCE
The present invention relates to a measuring apparatus, comprising: an arbitrary waveform generator to generate, and inject to a coupling network, a combination of N test signals; the coupling network to couple the N test signals to an EUT, and the responses thereof and those signals generated by the EUT itself, to a measuring unit; the measuring unit to measure the electrical rn signals provided by the coupling network; and—a processing unit to process the N test signals and the measured electrical signals, to obtain: the electromagnetic signals, noise or EMI generated by the EUT; and—the Z, Y or S parameters of the EUT or any other meaningful set of parameters that can be computed from the aforementioned ones or from voltages and currents. The invention also relates to a measuring method adapted to perform method steps with the apparatus of the invention.
MEASURING APPARATUS AND A MEASURING METHOD OF ELECTROMAGNETIC INTERFERENCE
The present invention relates to a measuring apparatus, comprising: an arbitrary waveform generator to generate, and inject to a coupling network, a combination of N test signals; the coupling network to couple the N test signals to an EUT, and the responses thereof and those signals generated by the EUT itself, to a measuring unit; the measuring unit to measure the electrical rn signals provided by the coupling network; and—a processing unit to process the N test signals and the measured electrical signals, to obtain: the electromagnetic signals, noise or EMI generated by the EUT; and—the Z, Y or S parameters of the EUT or any other meaningful set of parameters that can be computed from the aforementioned ones or from voltages and currents. The invention also relates to a measuring method adapted to perform method steps with the apparatus of the invention.
Bio-impedance analyzer
Systems and methods relating to bio-impedance analysis. The system eliminates the need for hardware phase measurements by using the K-K transform to extract the phase from the magnitude detected. The system has a magnitude detection sub-system that includes a signal generation block, a DC cancellation block, and an amplitude control block. An A/D converter converts the detected magnitude into a digital signal and signal processing is performed to extract the phase of the signal from the magnitude detected.
Bio-impedance analyzer
Systems and methods relating to bio-impedance analysis. The system eliminates the need for hardware phase measurements by using the K-K transform to extract the phase from the magnitude detected. The system has a magnitude detection sub-system that includes a signal generation block, a DC cancellation block, and an amplitude control block. An A/D converter converts the detected magnitude into a digital signal and signal processing is performed to extract the phase of the signal from the magnitude detected.