A circuit tester includes an interposer transfer board, a mounting plate, at least one sensor plate, and at least one receptacle and probe assembly. The interposer transfer board includes a first surface and a second surface opposite to the first surface, at least one amplifier holder, and at least one input header and at least one output header. The at least one amplifier holder, the at least one input header, and the at least one output header are disposed on the first surface of the interposer transfer board. The at least one receptacle and probe assembly is fixed on the at least one sensor plate. The at least one receptacle and probe assembly passes through and is mounted on the mounting plate. The at least one input header is connected to the at least one receptacle and probe assembly via wires.

An anisotropic conductive sheet has an insulation layer having a plurality of through-holes and a plurality of conductive layers each arranged on an inner wall surface of each of the plurality of through-holes. Each of the conductive layers has a base layer arranged on the inner wall surface of each of the through-holes and a metal plating layer arranged so as to contact with metal nanoparticles or a metal thin film in the base layer or the metal thin film. The base layer includes metal nanoparticles or a metal thin film and a binder, wherein at least a portion of the binder is arranged between the inner wall of each of the through-holes and the metal nanoparticles or the metal thin film. The binder is a sulfur-containing compound having a thiol group, a sulfide group or a disulfide group.

A non-transitory computer-readable storage medium storing an electromagnetic field analysis program that causes at least one computer to execute a process, the process includes specifying a dimension of a width of wiring included in first circuit information and a dimension of a thickness of the wiring; generating second circuit information obtained by changing value of one selected from the dimension of the width and the dimension of the thickness to zero based on a ratio between the dimension of the width and the dimension of the thickness; and executing an electromagnetic field analysis based on the second circuit information.

The present invention provides a circuit board testing system, including a computer host and a meter electrically connected to the computer host. A testing program is built in the computer host and displays a testing interface on a screen of the computer host. When a user inputs a circuit board serial number of a circuit board on the testing interface, the testing program displays at least one testing point name corresponding to the circuit board on the testing interface, and when the meter transmits an electrical value of the testing point to the computer host, records the electrical value in a testing result record chart. In the present invention, no jig is needed, and a testing result of a circuit board can be automatically recorded.

A method for setting testing thresholds applied by a testing device to products being made includes obtaining an initial lower threshold for testing the products and counting, followed by manual review, first, second, third, and fourth type product qualities as being quantities under the initial lower threshold. The method adds a minimum product parameter of defective products, the initial lower threshold, and a number of values between the minimum product parameter and the initial lower threshold into a set, repeating the application of one selected element from the set as an experiment threshold. First to fourth type quantities of the current products are counted again under the experiment threshold, an effectiveness of each element of the set is calculated, and an element of the set with the maximum effectiveness is defined as a suggested lower threshold for testing the products.

In one example, an apparatus comprises a backplane to attach an array of light emitting diodes (LED), the backplane comprising an array of display driver circuits, each display driver circuit of the array of display driver circuits corresponding to an LED of the array of LEDs and comprising: a current driver circuit configured to supply to a current to the corresponding LED; a control signal generator circuit configured to supply a driver control signal to the current driver circuit to control the current; and one or more monitor circuits controllable to provide access to at least one of: the current, or an internal voltage of at least one of the current driver circuit or the control signal generator circuit.

An integrated circuit detection method, apparatus, and system are disclosed, which relate to the field of electronics and resolve a problem of detecting an electrical parameter of an integrated circuit on a printed circuit board in a power-on state. A specific solution is as follows: N detection circuits (101) are disposed, where each detection circuit (101) is connected to a different integrated circuit (102), the detection circuit (101) is provided with a first detection point (a) and a second detection point (b), and the detection circuit (101) is configured to detect the electrical parameter of the integrated circuit (102) that is connected to the detection circuit (101); and N is an integer greater than or equal to 1. The solution is used in a process of detecting the electrical parameter of the integrated circuit on the printed circuit board.

A stub of a via formed in a printed circuit board is backdrilled to a predetermined depth. A capacitance probe is positioned within the via. Then the capacitance probe is used to obtain a test capacitance measurement. The test capacitance measurement is compared to a predetermined baseline capacitance measurement. Residual conductive plating material in the backdrilled stub causes the test capacitance measurement to exceed the predetermined baseline capacitance measurement. An indication is made that the predetermined baseline capacitance measurement has been exceeded.

A display module and its formation method are provided in the present disclosure. The display module includes a main flexible circuit board, including a first binding terminal, a second binding terminal, a first test point and a second test point, where the first test point is electrically connected to the first binding terminal, and the second test point is electrically connected to the second binding terminal; and further includes an auxiliary flexible circuit board, including a third binding terminal and a fourth binding terminal, where the third binding terminal is electrically connected to the fourth binding terminal, the first binding terminal is disposed corresponding to the third binding terminal, and the second binding terminal is disposed corresponding to the fourth binding terminal.

An inspection jig may include a frame, an electrode body provided with electrodes, conductive contactors having a wire shape, a support block having a facing surface opposite to which an inspection circuit board is disposed, guiding one ends of the contactors to the inspection points of the circuit board mounted on the facing surface, guiding other ends to the electrodes, and configured to move relatively to the frame in a moving direction which crosses the facing surface, biasing parts configured to bias the support block in a direction moving away from the electrode body and close to the circuit board, and a regulating plate disposed between the support block and the frame so as to extend in a direction from the support block to the frame, having elasticity, and having regulation of deformation in a first direction which is parallel to the facing surface and which crosses the extending direction.