An ionizer for charging air in a motor vehicle with negative ions. The ionizer has an emitter with a pair of spaced electrodes, a high-voltage power supply, means connecting the power supply to the electrodes to apply a voltage differential across them and thereby ionize gas molecules adjacent the electrodes, and a sensor between the power supply and the electrodes for measuring current passing between the electrodes.

The present disclosure provides a method of testing a single device under test (DUT) through multiple cores in parallel, which includes steps as follows. The test quantity of the DUT is calculated; the test quantity of the DUT is evenly allocated to to a plurality of test cores, so as to control a period of testing the DUT through the test cores in parallel.

An adapter for testing electrical equipment can include a first receptacle end having at least one first coupling feature, where the at least one first coupling feature is configured to couple to a power source and a first electrical device, where the first receptacle end is configured to receive from the power source at least one first test signal and send the at least one first test signal to the first electrical device. The adapter can also include a sensing device configured to receive at least one first response signal from the first electrical device, where the at least one first response signal is in response to and based on the first electrical device receiving the at least one first test signal.

A diagnostic apparatus that diagnoses a cutter tool or a rotating machine based on electric power supplied to the rotating machine, includes: an electric power measurement unit that measures the electric power; and a filtering unit that filters noises input from an input side and an output side of the electric power measurement unit, the electric power measurement unit including a Hall element, and applied voltage of an electric power supply line, that supplies the electric power to the rotating machine from an inverter or a servo amplifier, is input in the Hall element, wherein the electric power is calculated based on Hall voltage that is generated, when Hall current flows through the Hall element and magnetic flux is applied to a sensor surface of the Hall element, the Hall voltage being proportional to a product of the magnetic flux and the Hall current.

A detection and protection circuit includes: a comparator, six resistors, and two diodes. A first resistor is connected to a second resistor. The second resistor (30) is grounded. A positive input end, a negative input end, a power supply end, a ground end, and an output end of the comparator are connected to a third resistor, a fourth resistor, a power management device power supply pin, the ground, and a main controller. The other end of the third resistor is connected between the first resistor and the second resistor. The other end of the fourth resistor is connected to the first resistor. A first power supply is connected between the fourth resistor and the first resistor. A fifth resistor is connected to a sixth resistor. The sixth resistor (70) is grounded. The other end of the fifth resistor is connected to the main controller.

Cochlear implant systems can include a cochlear electrode and a stimulator in electrical communication with the cochlear electrode. The stimulator can be in communication with a controller, which is in communication with a testing circuit and a switching network. The stimulator can include a plurality of source elements. The controller can control the switching network to place the plurality of source elements into communication with the testing circuit. The controller can further cause one of the plurality of source elements to emit an electrical current and can determine an amount of electrical current emitted from the source element using the testing circuit. The controller can compare the determined amount of electrical current emitted by the source element with a prescribed current. The controller can adjust the output of each of the plurality of source elements based on the determined amount of electrical current emitted by the stimulator.

An automatic testing system includes a platform; a carrier fixed on a surface of the platform for carrying a device under test (DUT); a function test module for testing functions of the DUT; and a shifting module for shifting the function test module.

An optical device is formed on an optical IC chip. The shape of the optical IC chip is rectangular or parallelogram. The optical device induces: an optical device circuit; a first optical waveguide that is coupled to the optical device circuit; a pad that is electrically connected to the optical device circuit; a grating coupler; and a second optical waveguide that is coupled to the grating coupler. The pad is formed in a region close to a first side of the optical IC chip. The grating coupler is formed in a specified region, which is not close to the first side, on the optical IC chip. The first optical waveguide and the second optical waveguide are respectively extended to an edge of the optical IC chip.

A noise reduction device according to one embodiment includes a noise reduction circuit and a failure diagnosis circuit. The noise reduction circuit generates an offset signal with reverse polarity of a noise component generated in a load. The failure diagnosis circuit detects a level of the offset signal. The failure diagnosis circuit determines whether or not a detected level of the offset signal deviates from an appropriate range. The failure diagnosis circuit diagnoses, on the basis of a determination result, whether or not a failure has occurred in the noise reduction circuit.

A microelectromechanical gyroscope which comprises one or more Coriolis masses driven by a drive transducer and a force-feedback system. The force-feedback circuit comprises first and second sideband modulators and the self-test circuit comprises first and second sideband demodulators.