Patent classifications
G01R33/1292
APPARATUS AND METHOD FOR GENERATING MAGNETIC VORTEX SPIN STRUCTURES
An apparatus for generating magnetic vortex spin structures includes a device for moving at least one magnetic domain wall in a magnetic domain wall channel structure; and a device for generating and storing at least one magnetic vortex spin structure in response to the magnetic domain wall moved in the domain wall channel structure.
MAGNETIC SENSOR AND METHOD FOR MANUFACTURING MAGNETIC SENSOR
A magnetic sensor includes: plural sensitive elements 31 each including a soft magnetic material layer 105 having a longitudinal direction and a transverse direction and a conductor layer having higher conductivity than the soft magnetic material layer 105 and extending through the soft magnetic material layer 105 in a longitudinal direction, the sensitive element 31 having uniaxial magnetic anisotropy in a direction intersecting the longitudinal direction and being configured to sense a magnetic field by a magnetic impedance effect; and a connecting portion 32 continuous with the conductor layer of the sensitive element and configured to connect transversely adjacent sensitive elements 31 in series.
Magnetoresistance effect element including at least one Heusler alloy layer and at least one discontinuous non-magnetic layer
A magnetoresistance effect element includes a first ferromagnetic layer, a second ferromagnetic layer, a first non-magnetic layer; and a second non-magnetic layer, wherein, the first ferromagnetic layer and the second ferromagnetic layer are formed so that at least one of them includes a Heusler alloy layer, the first non-magnetic layer is provided between the first ferromagnetic layer and the second ferromagnetic layer, the second non-magnetic layer is in contact with any surface of the Heusler alloy layer and has a discontinuous portion with respect to a lamination surface, and the second non-magnetic layer is made of a material different from that of the first non-magnetic layer and is a (001)-oriented oxide containing Mg.
Method of monitoring a magnetic sensor
The present disclosure provides a method of monitoring the magnetic field in which a magnetic sensor is operating in to ensure that the sensor is operating within its defined magnetic window. For example, the method uses the sensor output of either a multi-turn sensor, or some other magnetoresistive sensor that is being used in conjunction with the multi-turn sensor, for example, a magnetic single turn sensor or a second multi-turn sensor, to monitor the operating magnetic field.
Magnetic domain image processing apparatus and magnetic domain image processing method
To provide a magnetic domain image processing apparatus and a magnetic domain image processing method by which strain of an electromagnetic steel sheet can be evaluated in more detail. The invention is a magnetic domain image processing apparatus that processes a magnetic domain image, and the magnetic domain image processing apparatus includes: an image acquisition unit configured to acquire a reference magnetic domain image and a positive magnetic domain image or acquire the reference magnetic domain image and a negative magnetic domain image, the reference magnetic domain image being a magnetic domain image that is obtained when a stimulus of a reference intensity that is an intensity serving as a reference is applied to a sample, the positive magnetic domain image being a magnetic domain image that is obtained when the stimulus of an intensity higher than the reference intensity is applied to the sample, and the negative magnetic domain image being a magnetic domain image that is obtained when the stimulus of an intensity lower than the reference intensity is applied to the sample; and an image generation unit configured to generate, based on the reference magnetic domain image and the positive magnetic domain image, or based on the reference magnetic domain image and the negative magnetic domain image, a stress distribution image indicating a distribution of a stress region that is a region where stress is generated.
Methods and devices for using multi-turn magnetic sensors with extended magnetic windows
A system includes a magnetic sensor that can store a magnetic state associated with a number of accumulated turns of a magnetic target. The magnetic sensor may work in conjunction with a magnetic target. The magnetic target may produce a magnetic field that, at some positions, drops below a magnetic window of the magnetic sensor. The magnetic target may produce a magnetic field that is within the magnetic window when needed to update the magnetic state of the sensor to keep track of the accumulated turns of the magnetic target. The magnetic sensor may be initialized with one or more domain walls.
Measuring device and method for determining magnetic properties of a magnetizable test specimen
A measuring device for determining magnetic properties of a magnetizable test specimen comprises a measuring coil winding which passes around a magnetizable measuring coil core. The measuring coil core comprises magnetic flux passage faces arranged at a distance from one another. The test specimen is arranged adjacently to the magnetic flux passage faces. A high-current pulse through the measuring coil winding causes a magnetic flux through the measuring coil core and the test specimen. A temporal profile of electrical characteristic variables of the measuring coil winding is detected using a sensor device. The electrical characteristic variables of the measuring coil winding detected by the sensor device are set in a ratio to additionally ascertained electrical characteristic variables of the measuring coil winding without the test specimen. A magnetic property of the test specimen is determined from the ratio of the electrical characteristic variables to one another.
MAGNETIC DISTRIBUTION DETECTION METHOD
A magnetic distribution detection method includes the steps of providing a magnetic sensor and a sample, selecting a multiple of measuring points on the sample, sensing the measuring points by the magnetic sensor, obtaining a multiple of sense data and a series of the heights of the magnetic sensor from each measuring point, using a signal decomposition algorithm to convert these sense data into data groups, and selecting one of the data groups as the magnetic distribution data of the sample.
Magnetic material observation method, and magnetic material observation apparatus
A magnetic material observation method in accordance with the present invention includes: an irradiating step including irradiating a region of a sample with an excitation beam and thereby allowing a magnetic element contained in the sample to radiate a characteristic X-ray; a detecting step including detecting intensities of a right-handed circularly polarized component and a left-handed circularly polarized component contained in the characteristic X-ray; and a calculating step including calculating the difference between the intensity of the right-handed circularly polarized component and the intensity of the left-handed circularly polarized component. Reference to such a difference enables precise measurement of the direction or magnitude of magnetization without strict limitations as to the sample.
Super resolution for magneto-optical microscopy
Sub-diffraction limited magneto-optical microscopy, such as Kerr or Faraday effect microscopy, provide many advantages to fields of science and technology for measuring, or imaging, the magnetization structures and magnetization domains of materials. Disclosed is a method and system for performing sub-diffraction limited magneto-optic microscopy. The method includes positioning a microlens or microlens layer relative to a surface of a sample to image the surface of the sample, forming a photonic nanojet to probe the surface of the sample, and receiving light reflected by the surface of the sample or transmitted through the sample at an imaging sensor. The methods and associated systems and devices enable sub-diffraction limited imaging of magnetic domains at resolutions 2 to 8 times the classical diffraction limit.