G01R33/323

Selective Characterization of Material Under Test (MUT) with Electromagnetic Impedance Tomography and Spectroscopy
20180011040 · 2018-01-11 ·

A method of extracting complex impedance from selected volumes of the material under test (MUT) combined with various embodiments of electrode sensor arrays. Configurations of linear and planar electrode arrays provide measured data of complex impedance of selected volumes, or voxels, of the MUT, which then can be used to extract the impedance of selected sub-volumes or sub-voxels of the MUT through application of circuit theory. The complex impedance characteristics of the sub-voxels may be used to identify variations in the properties of the various sub-voxels of the MUT, or be correlated to physical properties of the MUT using electromagnetic impedance tomography and/or spectroscopy.

MULTI-FREQUENCY EXCITATION SCHEMES FOR HIGH SENSITIVITY MAGNETOMETRY MEASUREMENT WITH DRIFT ERROR COMPENSATION

A system for magnetic detection includes a nitrogen vacancy (NV) diamond material, a radio frequency (RF) excitation source that provides RF excitation to the NV diamond material, an optical excitation source that provides optical excitation to the NV diamond material, an optical detector that receives an optical signal emitted by the NV diamond material, a magnetic field generator that generates a magnetic field applied to the NV diamond material, and a controller. The controller controls the RF excitation source to apply a first RF excitation having a first frequency and a second RF excitation having a second frequency. The first frequency is associated with a first slope point of a fluorescence intensity response of an NV center orientation of a first spin state, and the second frequency is associated with a second slope point of the fluorescence intensity response of the NV center orientation of the first spin state.

Geolocation of Magnetic Sources Using Vector Magnetometer Sensors

System and methods for determining an angle and/or geolocation of a dipole magnetic source relative to one or more DNV sensors. The system may include one or more DNV sensors, and a controller. The controller is configured to activate the DNV sensors, receive a set of vector measurements from the DNV sensors, and determine an angle of a magnetic source relative to the one or more DNV sensors based on the received set of vector measurements from the DNV sensors.

Real-time methods for magnetic resonance spectra acquisition

The invention pertains to advances in real-time methods in nuclear magnetic resonance by offering a new dual-frequency dynamic nuclear polarization (DNP) method that uses a microwave beam to polarize the spins of electrons and concomitantly act as a NMR transmitter.

Proteomic assay using quantum sensors

Apparatus and methods for the detection of proteins in biological fluids such as urine using a label-free assay is described. Specific proteins are detected by their binding to highly specific capture reagents such as SOMAmers that are attached to the surface of a substrate. Changes to these capture reagents and their local environment upon protein binding modify the behavior of color centers (e.g., fluorescence, ionization state, spin state, etc.) embedded in the substrate beneath the bound capture reagents. These changes can be read out, for example, optically or electrically, for an individual color center or as an average response of many color centers.

Magnetic field source detecting apparatus and magnetic field source detecting method
11543467 · 2023-01-03 · ·

In a magnetic field source detecting apparatus, a magnetic sensor unit detects an intensity and a direction of a measurement target magnetic field on or over a surface of a test target object; and a position estimating unit estimates a position in a depth direction of a magnetic field source that exists at an unspecified position inside a test target object on the basis of the intensities and the directions of the measurement target magnetic field detected by the magnetic sensor at at least two 2-dimensional positions of the surface.

NANOSCALE SCANNING SENSORS

A sensing probe may be formed of a diamond material comprising one or more spin defects that are configured to emit fluorescent light and are located no more than 50 nm from a sensing surface of the sensing probe. The sensing probe may include an optical outcoupling structure formed by the diamond material and configured to optically guide the fluorescent light toward an output end of the optical outcoupling structure. An optical detector may detect the fluorescent light that is emitted from the spin defects and that exits through the output end of the optical outcoupling structure after being optically guided therethrough. A mounting system may hold the sensing probe and control a distance between the sensing surface of the sensing probe and a surface of a sample while permitting relative motion between the sensing surface and the sample surface.

SAMPLE HOLDER FOR MEASUREMENTS OF OPTICALLY DETECTED MAGNETIC RESONANCE
20220404444 · 2022-12-22 · ·

The invention is related to a sample holder for measurements of optically detected magnetic resonance, including a bottom plate, a top plate and a middle plate, wherein all the plates are made of a dielectric material. The top plate is provided with at least one top opening, enabling continuous optical access to the studied sample during measurements. The sample is placed in the central opening provided in the middle plate. The non-magnetic conductive strips provided on the surfaces of the bottom plate, the middle plate and the top plate ensure formation of an electrical circuit, which allows coupling of the studied sample with the generated microwave radiation to be achieved once the microwave sources is switched on. The invention also includes a sample holder for measurements of optically detected magnetic resonance, enabling formation of at least one loop of the electrical circuit.

SENSOR FOR MEASURING A MAGNETIC FIELD

An embodiment of the invention relates to a sensor comprising a sensor element (10) for measuring a magnetic field, the sensor element (10) comprising a set of at least two first input ports (I1), a set of at least two exit ports (E) each of which is connected to one of the first input ports (I1) via a corresponding first beam path (B1), a set of at least two second input ports (I2) each of which is connected to a second beam path (B2), wherein the first beam paths (B1) extend through a common plane (CP) located inside the sensor element (10), said plane (CP) comprising a plurality of magneto-optically responsive defect centers, wherein the second beam paths (B2) also extend through said common plane (CP), but are angled with respect to the first beam paths (B1) such that a plurality of intersections between the first and second beam paths (B2) is defined, and wherein each intersection forms a sensor pixel (P) located at at least one of said magneto-optically responsive defect centers.

High-resolution magnetic field fingerprinting of integrated circuit activity with a quantum diamond microscope

Devices for determining a state of a magnetic field-generating article are provided. In various embodiments, a device comprises: a single crystal diamond having a plurality of NV centers, the single crystal diamond configured to be disposed adjacent to a magnetic field-generating article, and configured to generate a fluorescent signal in response to being illuminated by a light source; a coherent light source configured to generate a light beam directed at the single crystal diamond; a microwave (MW) radiation source configured to irradiate the single crystal diamond with a MW signal; a magnetic field source configured to apply a bias magnetic field to the single crystal diamond; a photosensor configured to collect the fluorescent signal generated by the single crystal diamond; and a computing node operatively coupled to each of the coherent light source, the MW radiation source, the magnetic field source, and the photosensor.