A method for calibrating an ionising radiation detector, with the aim of determining a correction factor in order to establish an amplitude-energy correspondence. The invention first relates to a method for calibrating a device for detecting ionising radiation, the detector comprising a semiconductor or scintillator detection material capable of generating a signal S of amplitude A upon interaction between ionising radiation and the detection material, the method including the determination of a weighting factor at the amplitude A.

The invention relates to a detector of charged particles made of silicon carbide and capable of performing dosimetric measurements in the field of quality controls of the beam lines at proton-therapy centres. With such detector it is further possible to perform measurements on beams of high- intensity charged particles produced by laser-matter interaction.

A method is provided including, acquiring detection events with a radiation detector including a semiconductor plate and configured to produce electrical signals in response to absorption of ionizing radiation in the semiconductor plate, wherein electrons and holes are generated responsive to absorption of the ionizing radiation. The semiconductor plate includes a first surface opposed to a second surface, with sidewalls interposed between the first surface and the second surface. A cathode electrode is disposed on the first surface and pixelated anode electrodes are disposed on the second surface. The method also includes optically coupling infrared (IR) radiation into a first portion of at least one of the sidewalls of the semiconductor plate of the radiation detector, and not coupling IR radiation into a second portion of the at least one of the sidewalk.

A method for calibrating an ionising radiation detector, with the aim of determining a correction factor in order to establish an amplitude-energy correspondence The invention first relates to a method for calibrating a device for detecting ionising radiation, the detector comprising a semiconductor or scintillator detection material capable of generating a signal S of amplitude A upon interaction between ionising radiation and the detection material, the method including the determination of a weighting factor of amplitude A.

An electronic cassette has a detection panel (light detection substrate) in which pixels for accumulating electric charges corresponding to radiation are arranged. The electronic cassette includes two gate control circuits that control an operation of a gate drive circuit, a power supply circuit that supplies power to the gate control circuits, a first wiring line, and a second wiring line. The first wiring line connects the power supply circuit and each of two gate control circuits to each other, and supplies each of two gate control circuits with the power supplied from the power supply circuit. The second wiring line connects two gate control circuits to each other. The power supplied from the power supply circuit to one of two gate control circuits is diverted to the other, through the second wiring line.

A system (100) includes a photon counting detector array (116) including a direct conversion material (118) and a plurality of detector pixels (120) affixed thereto, and a split signal corrector (126) that corrects the output of the plurality of detector pixels for split signals. A method includes receiving an output signal of each of a plurality of detector pixels affixed to a direction conversion material of photon counting detector array, and correcting the output of the plurality of detector pixels for split signals. A computer readable storage medium encoded with computer readable instructions, which, when executed by a processer, cause the processor to: receive an output signal of each of a plurality of detector pixels affixed to a direction conversion material of photon counting detector array, and correct the output of the plurality of detector pixels for split signals.

The disclosure is directed at a method and apparatus for improving method and apparatus for improved modulation transfer function and detective quantum efficiency of X-ray detectors. The method and apparatus include digitizing microelement outputs obtained by micro sensor elements and the generating pixel outputs from these digitized microelement outputs. Each pixel output is the sum of a plurality of weighting factored microelement outputs.

Disclosed herein is a method for forming a radiation detector. The method comprises forming a radiation absorption layer and bonding an electronics layer to the radiation absorption layer. The electronics layer comprises an electronic system configured to process electrical signals generated in the radiation absorption layer upon absorbing radiation photons. The method for forming the radiation absorption layer comprises forming a trench into a first surface of a semiconductor substrate; doping a sidewall of the trench; forming a first electrical contact on the first surface; forming a second electrical contact on a second surface of the semiconductor substrate. The second surface is opposite the first surface. The method further comprises dicing the semiconductor substrate along the trench.

A radiation detector assembly is provided that includes a semiconductor detector having a surface, plural pixelated anodes, and at least one processor. The pixelated anodes are disposed on the surface. Each pixelated anode is configured to generate a primary signal responsive to reception of a photon by the pixelated anode and to generate at least one secondary signal responsive to an induced charge caused by reception of a photon by at least one adjacent anode. The at least one processor is operably coupled to the pixelated anodes. The at least one processor configured to define sub-pixels for each pixelated anode; acquire signals corresponding to acquisition events from the pixelated anodes; determine sub-pixel locations for the acquisition events using the signals; and apply at least one calibration parameter on a per sub-pixel basis for the acquisition events based on the determined sub-pixel locations.

Disclosed herein are apparatuses for detecting radiation and methods of making them. The method comprises forming a recess into a semiconductor substrate, wherein a portion of the semiconductor substrate extends into the recess and is surrounded by the recess; depositing semiconductor nanocrystals into the recess, the semiconductor nanocrystals having a different composition from the semiconductor substrate; forming a first doped semiconductor region in the semiconductor substrate; forming a second doped semiconductor region in the semiconductor substrate; wherein the first doped semiconductor region and the second doped semiconductor region form a p-n junction that separates the portion from the rest of the semiconductor substrate.