Patent classifications
G02B21/04
CATADIOPTRIC MICROSCOPY
An optical microscope apparatus includes: a sample interrogation system configured to probe a sample location; and a light collection system configured to collect light output from a sample due to being probed by the sample interrogation system. The light collection system includes: a mirror positioned along an imaging axis that passes through the sample location; and an optical lens system including a plurality of optical lenses arranged along the imaging axis, at least one of the lenses being a multiplet optical lens.
CATADIOPTRIC MICROSCOPY
An optical microscope apparatus includes: a sample interrogation system configured to probe a sample location; and a light collection system configured to collect light output from a sample due to being probed by the sample interrogation system. The light collection system includes: a mirror positioned along an imaging axis that passes through the sample location; and an optical lens system including a plurality of optical lenses arranged along the imaging axis, at least one of the lenses being a multiplet optical lens.
Compact microscope
A compact microscope including an enclosure, a support element, a primary optical support element located within the enclosure and supported by the support element, at least one vibration isolating mount between the support element and the primary optical support element, a sample stage supported on the primary optical support element to support a sample, a return optical system to receive returned light from a sample and transmit returned light to a detection apparatus, wherein the return optical system is mounted on the primary optical support element, and wherein the compact microscope include a at least one of the following elements; a) an objective lens system, b) a temperature-control system, and c) the return optical system being operable to separate returned light into at least a first wavelength band and a second wavelength band.
Compact microscope
A compact microscope including an enclosure, a support element, a primary optical support element located within the enclosure and supported by the support element, at least one vibration isolating mount between the support element and the primary optical support element, a sample stage supported on the primary optical support element to support a sample, a return optical system to receive returned light from a sample and transmit returned light to a detection apparatus, wherein the return optical system is mounted on the primary optical support element, and wherein the compact microscope include a at least one of the following elements; a) an objective lens system, b) a temperature-control system, and c) the return optical system being operable to separate returned light into at least a first wavelength band and a second wavelength band.
Flow cytometer
The disclosed flow cytometer includes a wavelength division multiplexer (WDM). The WDM includes an extended light source providing light that forms an object, a collimating optical element that captures light from the extended light source and projects a magnified image of the object as a first light beam, and a first focusing optical element configured to focus the first light beam to a size smaller than the object of the extended light source to a first semiconductor detector. The disclosed flow cytometer further includes a composite microscope objective to direct light emitted by a particle in a flow channel in a viewing zone of the composite microscope to the extended light source, a fluidic system and a peristaltic pump configured to supply liquid sheath and liquid sample to the flow channel, and a laser diode system to illuminate the particle in the flow channel.
Flow cytometer
The disclosed flow cytometer includes a wavelength division multiplexer (WDM). The WDM includes an extended light source providing light that forms an object, a collimating optical element that captures light from the extended light source and projects a magnified image of the object as a first light beam, and a first focusing optical element configured to focus the first light beam to a size smaller than the object of the extended light source to a first semiconductor detector. The disclosed flow cytometer further includes a composite microscope objective to direct light emitted by a particle in a flow channel in a viewing zone of the composite microscope to the extended light source, a fluidic system and a peristaltic pump configured to supply liquid sheath and liquid sample to the flow channel, and a laser diode system to illuminate the particle in the flow channel.
Nondestructive imaging and surface quality inspection of structured plates
A system includes a stage, a detector and a measuring device. The stage is configured to hold a substrate. The substrate includes a plurality of tapered structures, and each of the plurality of tapered structures includes a tapered wall between first and second openings at opposite ends of the plurality of tapered structures. The detector is tilted at a first angle and configured to measure light reflected from the tapered wall at about 90 degrees to the tapered wall. The first angle depends at least in part a second angle between the tapered wall and a longitudinal axis running through the tapered structure. The measuring device is configured to determine a characteristic of the tapered wall and whether the characteristic of the tapered wall is above or below a threshold.
Nondestructive imaging and surface quality inspection of structured plates
A system includes a stage, a detector and a measuring device. The stage is configured to hold a substrate. The substrate includes a plurality of tapered structures, and each of the plurality of tapered structures includes a tapered wall between first and second openings at opposite ends of the plurality of tapered structures. The detector is tilted at a first angle and configured to measure light reflected from the tapered wall at about 90 degrees to the tapered wall. The first angle depends at least in part a second angle between the tapered wall and a longitudinal axis running through the tapered structure. The measuring device is configured to determine a characteristic of the tapered wall and whether the characteristic of the tapered wall is above or below a threshold.
METHODS AND DEVICES FOR OPTIMIZING CONTRAST FOR USE WITH OBSCURED IMAGING SYSTEMS
A system for outputting partially spatially coherent light to an imaging system is disclosed herein, which includes a spatially coherent light source configured to output a spatially coherent signal, at least one optical device having an optical device body with a first device surface formed thereon and configured to reflect a portion of the spatially coherent signal to form at least one coherent reflected signal. The optical device body also includes a second device surface having one or more surface irregularities configured to diffuse a portion of the spatially coherent light source output signal transmitted through the optical device body, to produce at least one spatially incoherent signal. The combination of the coherent reflected signal and the spatially incoherent signal form the partially spatially coherent light signal.
Optical arrangement, multi-spot scanning microscope and method for operating a microscope
The invention relates to an optical arrangement, particularly for the detection beam path of a multi-spot scanning microscope, comprising a detection plane, in which a detector is positionable, comprising a dispersive device for spectrally splitting detection light. According to the invention, the optical arrangement is characterized in that a distorting optical unit is present for guiding the detection light into the detection plane, said distorting optical unit being arranged downstream of the dispersive device and upstream of a detection plane, and in that a rotating device is present for the relative rotation of a luminous field of the spectrally separated detection light and the distorting optical unit. The invention additionally relates to a multi-spot scanning microscope and a method for operating a microscope.