A microscope for imaging a sample is disclosed that may include at least one illumination objective arranged to eject an illumination light beam along an illumination path to illuminate the sample; an imaging objective arranged to receive detection light including at least a portion of the light ejected from the sample, wherein the detection light is propagated along a detection axis and the imaging objective has an imaging focal plane; an adjustment arrangement to linearly displace the illumination light beam and the imaging focal plane relative to each other along the detection axis; a sample holder arranged to receive a sample and having a portion which is transparent to the illumination light beam and to the detection light; and a holder support arranged to receive the sample holder and displace the sample holder relative to the imaging objective such that the imaging focal plane is positioned inside the sample holder.

A microscope for imaging a sample is disclosed that may include at least one illumination objective arranged to eject an illumination light beam along an illumination path to illuminate the sample; an imaging objective arranged to receive detection light including at least a portion of the light ejected from the sample, wherein the detection light is propagated along a detection axis and the imaging objective has an imaging focal plane; an adjustment arrangement to linearly displace the illumination light beam and the imaging focal plane relative to each other along the detection axis; a sample holder arranged to receive a sample and having a portion which is transparent to the illumination light beam and to the detection light; and a holder support arranged to receive the sample holder and displace the sample holder relative to the imaging objective such that the imaging focal plane is positioned inside the sample holder.

Described herein are methods and systems for the optical imaging of a physical specimen of interest that is in contact with, or in close proximity to, the backplane of a high refractive index solid-immersion lens (SIL), wherein the specimen comprises features of interest that act as a local high-refractive index regions. The SIL lens preferably comprises fiducial markers.

An optical microscope apparatus includes: a sample interrogation system configured to probe a sample location; and a light collection system configured to collect light output from a sample due to being probed by the sample interrogation system. The light collection system includes: a mirror positioned along an imaging axis that passes through the sample location; and an optical lens system including a plurality of optical lenses arranged along the imaging axis, at least one of the lenses being a multiplet optical lens.

An optical microscope apparatus includes: a sample interrogation system configured to probe a sample location; and a light collection system configured to collect light output from a sample due to being probed by the sample interrogation system. The light collection system includes: a mirror positioned along an imaging axis that passes through the sample location; and an optical lens system including a plurality of optical lenses arranged along the imaging axis, at least one of the lenses being a multiplet optical lens.

An immersion objective includes a correction group or correcting a spherical aberration. The displacement of the correction group along the optical axis leads to a substantially negligible defocus aberration.

An immersion objective includes a correction group or correcting a spherical aberration. The displacement of the correction group along the optical axis leads to a substantially negligible defocus aberration.

A device for imaging one dimension nanomaterials is provided. The device includes an optical microscope with a liquid immersion objective, a laser device, and a spectrometer. The laser device is configured to provide an incident light beam with a continuous spectrum. The spectrometer is configured to obtain spectral information of the one dimensional nanomaterials.

A device for imaging one dimension nanomaterials is provided. The device includes an optical microscope with a liquid immersion objective, a laser device, and a spectrometer. The laser device is configured to provide an incident light beam with a continuous spectrum. The spectrometer is configured to obtain spectral information of the one dimensional nanomaterials.

A fluid immersion control system may use a common electrode along with a plurality of sensor electrodes at a distal portion of an immersion microscope objective to monitor electrical resistance of a fluid as an indication of presence of a fluid layer used for immersion microscopy. The fluid immersion control system may activate replenishment of the fluid when the resistance indicates that a diameter of the microscope objective is not immersed in the fluid.