G02B21/365

Apparatuses, Methods and Computer Programs for Controlling a Microscope System
20230046644 · 2023-02-16 ·

Examples relate to apparatuses, methods and computer programs for controlling a microscope system, and to a corresponding microscope system. An apparatus for controlling a microscope system comprises an interface for communicating with a camera module. The camera module is suitable for providing camera image data of a head of a user of the microscope system. The apparatus comprises a processing module configured to obtain the camera image data from the camera module via the interface. The processing module is configured to process the camera image data to determine information on an angular orientation of the head of the user relative to a display of the microscope system. The processing module is configured to provide a control signal for a robotic adjustment system of the microscope system based on the information on the angular orientation of the head of the user.

PATHOLOGICAL DIAGNOSIS ASSISTING METHOD USING AI, AND ASSISTING DEVICE
20230045882 · 2023-02-16 ·

Diagnosis is assisted by acquiring microscopical observation image data while specifying the position, classifying the image data into histological types with the use of AI, and reconstructing the classification result in a whole lesion. There is provided a pathological diagnosis assisting method that can provide an assistance technology which performs a pathological diagnosis efficiently with satisfactory accuracy by HE staining which is usually used by pathologists. Furthermore, there are provided a pathological diagnosis assisting system, a pathological diagnosis assisting program, and a pre-trained model.

In-Vitro Contractile Force Indicator

Devices and methods to measure cells and/or tissue's contractile force are disclosed. Included is a mount with rigid, and non-rigid posts sized to flex. Determined is force exerted by contractile cells and tissues in a multiwell plate. The device is designed to fit inside individual wells with posts directed downwards. Posts are attached to a 3D printed circular mount with tabs for depth within the well. The mount has a window for medium changes while the device is positioned inside the well. The cells are seeded within a hydrogel. As the hydrogel condenses, cells/tissue wrap around the post's outside pulling non-rigid post toward rigid post. Inverted light microscope is used to determine deflection of non-rigid post inside the multiwell plate. Movement of the non-rigid post is measured using an acrylic ruler on an underside of the multiwell plate. Contractile forces of cells/tissue are determined using cantilever mechanics.

Microscope system, control method, and recording medium

A microscope system is provided with a microscope that acquires images at least at a first magnification and a second magnification higher than the first magnification, and a processor. The processor is configured to specify a type of a container in which a specimen is placed, and when starting observation of the specimen placed in the container at the second magnification, the processor is configured to specify an observation start position by performing object detection according to the type of container on a first image that includes the container acquired by the microscope at the first magnification, and control a relative position of the microscope with respect to the specimen such that the observation start position is contained in a field of view at the second magnification of the microscope.

HIGH CONTENT IMAGING SYSTEM AND A METHOD OF OPERATING THE HIGH CONTENT IMAGING SYSTEM
20180003941 · 2018-01-04 ·

A high content imaging system and a method of operating the high content imaging system are disclosed. A microscope has a first objective lens and a second objective lens, and an objective lens database has first and second transformation values associated with the first and the second objective lenses, respectively. A microscope controller operates the microscope with the first objective lens to develop first values of acquisition parameters. A configuration module automatically determines second values of the acquisition parameters using the first values of the acquisition parameters, first transformation values associated with the first objective lens, and second transformation values associated with the second objective lens. The microscope controller operates the microscope using the second objective lens and the second values of the acquisition parameters.

Quality Control of Automated Whole-slide Analyses
20180012360 · 2018-01-11 ·

The subject disclosure presents systems and methods for automatically selecting meaningful regions on a whole-slide image and performing quality control on the resulting collection of FOVs. Density maps may be generated quantifying the local density of detection results. The heat maps as well as combinations of maps (such as a local sum, ratio, etc.) may be provided as input into an automated FOV selection operation. The selection operation may select regions of each heat map that represent extreme and average representative regions, based on one or more rules. One or more rules may be defined in order to generate the list of candidate FOVs. The rules may generally be formulated such that FOVs chosen for quality control are the ones that require the most scrutiny and will benefit the most from an assessment by an expert observer.

Analyzing and using motility kinematics of microorganisms
11708596 · 2023-07-25 · ·

Among other things, motility of at least one individual microorganism or a change in motility of at least one individual microorganism or both is or are characterized. The characterized motility or change in motility is used to detect the presence or count of the at least one individual microorganism, or determine the identity of a species or strain of the at least one individual microorganism, or determine a susceptibility of the at least one individual microorganism to one or more antibiotics or other antimicrobials.

Sample observation device and sample observation method
11709350 · 2023-07-25 · ·

A sample observation device includes: an emission optical system that emits planar light to a sample on an XZ plane; a scanning unit that scans the sample in a Y-axis direction so as to pass through an emission surface of the planar light; an imaging optical system that has an observation axis inclined with respect to the emission surface and forms an image of observation light generated in the sample; an image acquisition unit that acquires a plurality of pieces of XZ image data corresponding to an optical image of the observation light; and an image generation unit 8 that generates XY image data based on the plurality of pieces of XZ image data. The image generation unit extracts an analysis region of the plurality of pieces of XZ image data acquired in the Y-axis direction, integrates brightness values of at least the analysis region in a Z-axis direction to generate X image data, and combines the X image data in the Y-axis direction to generate the XY image data.

SYSTEMS AND METHOD FOR IMAGING DEVICES WITH ANGULAR ORIENTATION INDICATIONS
20180011305 · 2018-01-11 ·

Exemplary embodiments of the present invention relate generally to the fields for indicating a location on an image in a multi-viewer display. In particular embodiments, the multi-viewer display may be a multi-viewer microscope.

SINGLE-PARTICLE LOCALIZATION MICROSCOPE
20230236401 · 2023-07-27 ·

A single-particle localization microscope, including an optical system configured to illuminate a sample region with a sequence of light patterns having spatially different distributions of illumination light adapted to cause a single particle located in the sample region to emit detection light, a detector configured to detect a sequence of intensities of the detection light emerging from the sample region in response to the sequence of illuminating light patterns, and a processor configured to determine, based on the sequence of intensities of the detection light, an arrangement of potential positions for locating the particle. The processor further illuminates the sample region with at least one subsequent light pattern, causes detection of at least one subsequent intensity, and decides, based on the at least one subsequent intensity of the detection light, which one of the multiple potential positions represents an actual position of the particle in the sample region.