The present disclosure provides a detection apparatus for a display panel component and a method for detecting a display panel component, the detection apparatus of the display panel component including a reflectance measuring device for measuring the light reflectance of the display panel component along a preset path, the preset path passing through a first position and a second position, and a distance measuring device for acquiring a distance between the first position and the second position according to the measured data of the reflectance measuring device, wherein there is a light reflectance abrupt change in the first position and the second position, respectively.

Provided are a light-emitting apparatus that can suppress manufacturing cost to a low level and perform light emission with high uniformity using a simple configuration, a calibration coefficient calculation method using the light-emitting apparatus, and a method for calibrating a captured image of an inspection target object. A plurality of light-emitting diodes arranged at equal intervals on the circumference of a virtual circle, and a milky white-colored emission window, which is provided on a top surface portion separated from the light-emitting diodes, has an outer edge that is smaller than the circumference on which the light-emitting diodes are arranged, and allows light of the light-emitting diodes to pass therethrough, are included. The diameter of the virtual circle on which the light-emitting diodes are arranged and a separation distance between the light-emitting diodes and the emission window are set to predetermined distances.

An electronic device is provided. The electronic device includes a first electronic device unit. The first electronic device unit includes a first substrate and a second substrate disposed opposite to the first substrate. The first substrate includes a protruding part which protrudes outward a boundary of the second substrate along a protruding direction perpendicular to a normal direction of the first substrate. The protruding part includes a first side surface having a portion that has been grinded and a portion that has been ungrinded, and a surface roughness of the portion that has been grinded is different from a surface roughness of the portion that has been ungrinded.

An apparatus for testing an edge portion of a substrate, includes a first illumination source configured to irradiate light to an end portion of the edge portion of the substrate; a second illumination source configured to irradiate light to a lower portion of the edge portion; a third illumination source configured to irradiate light to an upper portion of the edge portion; and first to third photographing portions, respectively corresponding to the first to third illumination sources, wherein the first illumination source comprises a C-shaped cross-section and comprises a first curved surface facing the end portion of the edge portion, the second illumination source comprises a half C-shaped cross-section and comprises a second curved surface facing the lower portion of the edge portion, and the third illumination source comprises a half C-shaped cross-section and comprises a third curved surface facing the upper portion of the edge portion.

Electrochromic devices and methods may employ the addition of a defect-mitigating insulating layer which prevents electronically conducting layers and/or electrochromically active layers from contacting layers of the opposite polarity and creating a short circuit in regions where defects form. In some embodiments, an encapsulating layer is provided to encapsulate particles and prevent them from ejecting from the device stack and risking a short circuit when subsequent layers are deposited. The insulating layer may have an electronic resistivity of between about 1 and 10.sup.8 Ohm-cm. In some embodiments, the insulating layer contains one or more of the following metal oxides: aluminum oxide, zinc oxide, tin oxide, silicon aluminum oxide, cerium oxide, tungsten oxide, nickel tungsten oxide, and oxidized indium tin oxide. Carbides, nitrides, oxynitrides, and oxycarbides may also be used.

A laser irradiation apparatus includes a stage on which a substrate is provided, a laser irradiation unit which irradiates a laser to the substrate on the stage, an image acquiring unit which acquires an image of a predetermined region of the substrate, and a control unit electrically connected to the laser irradiation unit and the image acquiring unit, where the control unit calculates a brightness value corresponding to an average value of grayscale values of the image provided from the image acquiring unit, compares a calculated brightness value with a reference brightness value, and outputs data on performance of the laser based on a result of comparing the calculated brightness value with the reference brightness value.

A display inspection system for inspecting a light beam emitted from a panel with pixels positioned at several focal planes is provided. The display inspection system includes a focus tunable lens adjustable in a focal distance for focusing at the panel, a first sensing unit for receiving the light beam, a reduced aberration optical system arranged between the focus tunable lens and the first sensing unit for focusing at the first sensing unit, and one or more optical elements placed within a back focal length of the reduced aberration optical system. The reduced aberration optical system comprises a first serial cascade lens group of a first aplanatic lens and a first doublet lens for correcting an optical aberration. The first aplanatic lens and the first doublet lens are co-configured that the back focal length is extended in a manner that the light beam is incident to the first sensing unit.

Methods, apparatus, and systems for mitigating pinhole defects in optical devices such as electrochromic windows. One method mitigates a pinhole defect in an electrochromic device by identifying the site of the pinhole defect and obscuring the pinhole to make it less visually discernible. In some cases, the pinhole defect may be the result of mitigating a short-related defect.

A display device can include a display panel including a display area in which sub-pixels are disposed, and a non-display area adjacent to the display area and in which a second pad portion is disposed, a printed circuit board including a first pad portion for outputting voltages to the display panel, and a circuit film including a first end connected to the first pad portion of the printed circuit board and a second end connected to the second pad portion of the display panel. The display device can further include an analog-to-digital converter to receive a voltage output from the first pad portion or the second pad portion through a line in the circuit film electrically connecting the first pad portion with the second pad portion, and output a value corresponding to the voltage input for detecting a bonding state of at least one internal component within the display device.

A light emitting display device can include a display panel configured to display an image; a driver configured to drive the display panel; a controller configured to control the driver; and a defect sensing circuit configured to sense a current through a driving voltage line transmitting a driving voltage for driving of the display panel, and output a sensing value based on the current for determining whether an element in a subpixel of the display panel is defective.