A method for analyzing microorganisms arranged in a sample is provided, the sample including a viability marker to modify an optical property of the microorganisms in different ways depending on whether they are dead or alive, the method including illumination of the sample and acquisition of an image of the latter by an image sensor, the image sensor then being exposed to an exposure light wave; determining positions of different microorganisms from the acquired image; applying a propagation operator to calculate at least one characteristic value of the exposure light wave at each radial position and at a plurality of distances from the detection plane representing a change in the characteristic value between the image sensor and the sample; and identifying living microorganisms according to each profile.

According to an aspect of the present inventive concept there is provided an imaging system for imaging of a sample, comprising a light source, an interference filter and a detector, the light source generates illumination light of a single wavelength to induce elastic scattering of the light by the sample, the interference filter selectively reduces transmittance of light having an incident angle on the interference filter corresponding to non-scattered light, the detector is configured to detect a two-dimensional representation of the elastically scattered light transmitted by the interference filter.

A method for observing a sample (10), the sample lying in a plane of the sample defining radial coordinates, the method comprising the following steps: a) illuminating the sample using a light source (11), able to emit an incident light wave (12) that propagates toward the sample along a propagation axis (Z); b) acquiring, using an image sensor (16), an image (I.sub.0) of the sample (10), said image being formed in a detection plane (P.sub.0), the sample being placed between the light source (11) and the image sensor (16), such that the incident light wave sees an optical path difference, parallel to the propagation axis (Z), by passing through the sample; c) processing the image acquired by the image sensor;
wherein the processing of the acquired image comprises taking into account vectors of parameters, respectively defined at a plurality of radial coordinates, in the plane of the sample, each vector of parameters being associated with one radial coordinate, and comprising a term representative of an optical parameter of the sample, at least one optical parameter being an optical path difference induced by the sample at the radial coordinate, the vectors of parameters describing the sample.

Embodiments described herein relate to a large area lens-free imaging device. One example is a lens-free device for imaging one or more objects. The lens-free device includes a light source positioned for illuminating at least one object. The lens-free device also includes a detector positioned for recording interference patterns of the illuminated at least one object. The light source includes a plurality of light emitters that are positioned and configured to create a controlled light wavefront for performing lens-free imaging.

Both a hologram and fluorescence are simultaneously captured in a state in which they can be reconstructed separately. A recording device (10) includes: a laser light source (LS1) which irradiates a subject (13) with object illumination light so that object light is generated; and an image capturing device (12) which captures (i) a hologram formed by interference between reference light and object light and (ii) an image of fluorescence, and the object illumination light further excites a fluorescent material (14) contained in the subject (13).

A focus adjustment method for acquiring an image of a surface of interest of a sample by a holographic imager includes the steps of: placing the sample including at least one reference object having a known shape and described by characterising parameters having at least position parameters acquiring an image and determining the position of the reference object with respect to the acquisition plane, by applying a light diffraction model involving the spatial parameters of the reference object estimated by approximating the appearance of the reference object in the holographic image acquired, and determining the position of the surface of interest with respect to the acquisition plane from a position of the reference object and focus adjustment of the image acquisition.

An apparatus and method to produce a hologram of an object includes an electromagnetic radiation assembly configured to receive a received electromagnetic radiation, such as light, from the object. The electromagnetic radiation assembly is further configured to diffract the received electromagnetic radiation and transmit a diffracted electromagnetic radiation. An image capture assembly is configured to capture an image of the diffracted electromagnetic radiation and produce the hologram of the object from the captured image.

According to an embodiment, a holographic microscope comprises a light source emitting light to an object, a beam splitter reflecting the light emitted from the light source to the object and transmitting object light reflected from the object, a holographic image sensor sensing information, including a holographic image, by receiving the object light and allowing the object light to coherently interfere with reference light, and an image processor obtaining three-dimensional (3D) information about the object based on the information sensed by the holographic image sensor. The holographic image sensor includes a lens focusing the object light to the holographic image sensor, a filter transmitting a predetermined wavelength band of light of the focused object light, a light receiving unit receiving interference light to sense a holographic image, and a reference light source directly emitting the reference light having the predetermined wavelength band to the light receiving unit.

The present invention relates to a system and method for digital holographic microscopy. According to an aspect of the invention there is provided an off-axis digital holographic microscope comprising: a light emitter configured to provide a divergent light beam; a sensor position to receive light from the light emitter in a first path and a second path, and thereby to detect a holographic image; a reflector positioned partially in the divergent light beam so that light that encounters the reflector extends towards the sensor in the first path, and light that does not encounter the reflector extends towards the sensor in the second path; and a support structure configured to support a sample in the first path or the second path.

The holographic lens system includes a geometric phase lens located on plane of an aperture, a front lens and a rear lens respectively located at the front and behind of the aperture, a polarizer located between the geometric phase lens and the front lens, and an image sensor that is located behind the rear lens and acquires an interference fringe generated by the geometric phase lens.