A holographic microscope configured to observe a sample is provided. The holographic microscope includes a light source, a light splitting element, a polarizing element, a phase modulation element, a light combining element, and a photosensitive element. The light source is configured to provide an illumination beam. The illuminating beam is transmitted through the light splitting element to form a first light beam and a second light beam, and the sample is disposed on a transmission path of the first light beam. The polarizing element and the phase modulation element are disposed on the transmission path of the first light beam or the second light beam. The first light beam and the second light beam are transmitted to the light combining element to form an interference beam. The photosensitive element is disposed on a transmission path of the interference beam to receive the interference beam to generate an optical signal.

A holographic security or identification device (10) comprises an object, or a flexible substrate (12) configured to be conformable to a desired, curved shape; and a plurality of structures (14) formed on or in the object to have a desired curved configuration, or formed in or associated with the substrate and arranged to adopt a desired curved configuration when the substrate is conformed to a desired shape, wherein the plurality of structures (14) are configured to receive light (20) of a selected at least one wavelength or range of wavelengths and to produce, using the received light, a desired holographic image (22) for security or identification purposes when in the desired configuration.

There are provided an image processing device and a processing method thereof. The image processing method includes obtaining an interference signal using a sample beam and a reference beam, transforming the interference signal by using a numerical signal processing method or an intensity mixing method to generate a transformed interference signal, and obtaining a three-dimensional (3D) phase image by using the interference signal and the transformed interference signal.

A method for performing color image reconstruction of a single super-resolved holographic sample image includes obtaining a plurality of sub-pixel shifted lower resolution hologram images of the sample using an image sensor by simultaneous illumination at multiple color channels. Super-resolved hologram intensity images for each color channel are digitally generated based on the lower resolution hologram images. The super-resolved hologram intensity images for each color channel are back propagated to an object plane with image processing software to generate a real and imaginary input images of the sample for each color channel. A trained deep neural network is provided and is executed by image processing software using one or more processors of a computing device and configured to receive the real input image and the imaginary input image of the sample for each color channel and generate a color output image of the sample.

A polarization holographic microscope system is disclosed. The polarization holographic microscope system can acquire a birefringence image and a three-dimensional phase image with high sensitivity by aperture synthesis of sample beams at various angles, and a sample image acquisition method using the microscope system.

The invention relates to a method for detecting a measured value (dϕ/dx, M). According to the invention, provision is made for a sinusoidal excitation signal (Ue) with a predetermined excitation frequency (f), with or without a superposed DC component (Uoffset), to be fed to an input of a component (100, C), for at least one electron holography measuring step to be carried out, in which an electron beam (Se) is directed on the component (100, C), said electron-beam penetrating and/or passing the component (100, C) and subsequently being superposed with a reference electron-beam (Sr), and for an electrical hologram (EHG) arising by interference of the two electron beams (Se, Sr) during a predetermined measurement window (F) to be measured and the phase image (PB) to be ascertained therefrom, and for the measured value (M) to be formed on the basis of the phase image (PB), wherein the temporal length (Tf) of the measurement window (F) of the electron holography measuring step is shorter than half the period (T) of the sinusoidal excitation signal (Uc).

A holographic three-dimensional multi-spot light stimulation device is provided with: a three-dimensional imaging holographic optical system A which employs fluorescent exciting light to acquire three-dimensional fluorescence distribution information resulting from fluorescent signal light from a plurality of stimulation target objects; and a three-dimensional light stimulation holographic optical system B which employs a light stimulation hologram generated on the basis of the acquired three-dimensional fluorescence distribution information to form a plurality of light spots in space, to impart stimulation simultaneously to the plurality of stimulation target objects. Furthermore, the three-dimensional light stimulation holographic optical system B is provided with a spatial light phase modulating element 22 and a control unit 25, wherein the control unit 25 generates the light stimulation hologram by controlling the spatial light phase modulating element 22 on the basis of the three-dimensional fluorescence distribution information.

A polarization holographic microscope system is disclosed. The polarization holographic microscope system can acquire a birefringence image and a three-dimensional phase image with high sensitivity by aperture synthesis of sample beams at various angles, and a sample image acquisition method using the microscope system.

A method for defect inspection of a transparent substrate comprises (a) providing an optical system for performing a diffraction process of object wave passing through a transparent substrate, (b) interfering and wavefront recording for the diffracted object wave and a reference wave to reconstruct the defect complex images (including amplitude and phase) of the transparent substrate, (c) characteristics analyzing, features classifying and sieving for the defect complex images of the transparent substrate, and (d) creating defect complex images database based-on the defect complex images for comparison and detection of the defect complex images of the transparent substrate.

A holographic security or identification device (10) comprises an object, or a flexible substrate (12) configured to be conformable to a desired, curved shape; and a plurality of structures (14) formed on or in the object to have a desired curved configuration, or formed in or associated with the substrate and arranged to adopt a desired curved configuration when the substrate is conformed to a desired shape, wherein the plurality of structures (14) are configured to receive light (20) of a selected at least one wavelength or range of wavelengths and to produce, using the received light, a desired holographic image (22) for security or identification purposes when in the desired configuration.