This disclosure relates generally to a system and method to identify at least one conflict and for controlling both static and dynamic variables in one or more operations of at least one subsystem of a plurality of building automation sub-systems. It includes a supervisory control layer that orchestrates multiple underlying sub-systems like heating, ventilation, and air-conditioning (HVAC) sub-systems and at least one access control sub-system. A test case generation framework is used to verify static and dynamic variables of operations of the sub-systems. It identifies conflicts in the static and dynamic variables. Therefore, the system provides controls to the sub-systems using the identified and adjusted conflict of static and dynamic variables on operations.

This disclosure relates generally to a system and method to identify at least one conflict and for controlling both static and dynamic variables in one or more operations of at least one subsystem of a plurality of building automation sub-systems. It includes a supervisory control layer that orchestrates multiple underlying sub-systems like heating, ventilation, and air-conditioning (HVAC) sub-systems and at least one access control sub-system. A test case generation framework is used to verify static and dynamic variables of operations of the sub-systems. It identifies conflicts in the static and dynamic variables. Therefore, the system provides controls to the sub-systems using the identified and adjusted conflict of static and dynamic variables on operations.

The invention relates to a system (1) for the automatic detection of a state of a device (2), comprising: a signal acquisition means (10) for acquiring defective measurement data (D) of a physical variable characterising the device (2); and an analysis unit (11) for identifying a specified pattern (M) in the measurement data (D) acquired by the signal acquisition means (10). The analysis unit (11) is designed: to compare at least two different pattern sections (M1-M14) of the specified pattern (M) separately from each other with the measurement data (D): on the basis of the respective comparison, to determine at least one position of each of the pattern sections (M1-M14) in the measurement data (D): on the basis of the positions determined and the order of the positions of the pattern sections (M1-M14), to detect the specified pattern (M) at one or more positions in the measurement data (D) and, on the basis of the one or more positions of the specified pattern (M), to determine the state of the device (2).