G05B2219/40361

DEPENDABILITY PRIORITY NUMBER
20220043419 · 2022-02-10 ·

A computer-implemented method and an apparatus for determining an optimal system configuration out of a plurality of candidate system configurations j is provided. The method includes: receiving data indicating a plurality of candidate system configurations j; determining quantitative dependability metric value for each of the plurality of candidate system configurations j, wherein the quantitative dependability metric value for each of the plurality of candidate system configurations is a dependability property fulfilment value X.sub.ij for each list of dependability properties i for each individual candidate system configuration j; and further on b) a dependability property weighting factor K.sub.i for each of the list of dependability properties i for all of the plurality of candidate system configurations j; and determining an optimal system configuration out of the plurality of candidate system configurations j on a quantitative comparison between the quantitative dependability metric value for each of the candidate system configurations j.

PLANT PERFORMANCE MANAGEMENT METHOD, PLANT PERFORMANCE MANAGEMENT APPARATUS, AND NON-TRANSITORY COMPUTER READABLE MEDIUM
20230137431 · 2023-05-04 ·

A plant performance management method includes a step of evaluating performance of a plant based on a relationship between at least two items of data from operating data and a step of analyzing a cause that makes the performance of the plant abnormal based on the operating data in a case in which the performance of the plant is evaluated as abnormal.

Integrated circuits designed for multiple sets of criteria
10908598 · 2021-02-02 · ·

Examples described herein provide a method for designing an integrated circuit (IC) for meeting different sets of criteria. In an example, different sets of criteria are identified for an IC design. The IC design is designed to meet the different sets of criteria based on expected manufacturing variation. The IC design is caused to be manufactured as IC products. At least some of the IC products are caused to be tested. The IC products are characterized as meeting respective ones of the different sets of criteria based on testing the at least some of the IC products.

Centralized fleet management system for optimizing task assignment

A fleet management system may create and manage tasks within an environment associated with fulfilling, sorting, inducting, and/or distributing packages, such as a warehouse, packaging facility, sortation center, or distribution center. The fleet management system may assign the tasks to agents within the environment. Each of the agents may have capabilities or tasks that the agents are configured to perform and the fleet management system may use these capabilities to assign the tasks to the agents. Additionally, tasks may be assigned based on a location of the agents within the environment. As tasks are generated, the fleet management system may determine a suitable agent to perform the task and may transmit instructions to the agent for carrying out the task. The fleet management system may provide a centralized platform to manage agents, optimize the assignment of tasks, and increase productivity within the environments.

Dependability number

A computer-implemented method and an apparatus for determining an optimal system configuration out of a plurality of candidate system configurations j is provided. The method includes: receiving data indicating a plurality of candidate system configurations j; determining quantitative dependability metric value for each of the plurality of candidate system configurations j, wherein the quantitative dependability metric value for each of the plurality of candidate system configurations is a dependability property fulfilment value X.sub.ij for each list of dependability properties i for each individual candidate system configuration j; and further on b) a dependability property weighting factor K.sub.i for each of the list of dependability properties i for all of the plurality of candidate system configurations j; and determining an optimal system configuration out of the plurality of candidate system configurations j on a quantitative comparison between the quantitative dependability metric value for each of the candidate system configurations j.

Implementing resistance defect performance mitigation using test signature directed self heating and increased voltage

A method and system are provided for implementing resistive defect performance mitigation for integrated circuits. A test is generated for identifying resistive defects. A first self heating repair process is performed for repairing resistive defects. Testing is performed to identify a mitigated resistive defect and a functional integrated circuit. Responsive to identifying a resistive defect not being mitigated and a functional integrated circuit, a second repair process is performed, then testing is performed again.

Implementing resistance defect performance mitigation using test signature directed self heating and increased voltage

A method and system are provided for implementing resistive defect performance mitigation for integrated circuits. A test is generated for identifying resistive defects. A first self heating repair process is performed for repairing resistive defects. Testing is performed to identify a mitigated resistive defect and a functional integrated circuit. Responsive to identifying a resistive defect not being mitigated and a functional integrated circuit, a second repair process is performed, then testing is performed again.