Patent classifications
G05D3/1463
Methods, devices and systems for scanning tunneling microscopy control system design
Methods, devices, and systems for controlling a scanning tunneling microscope system are provided. In some embodiments, the methods, devices, and systems of the present disclosure utilize a control system included in or added to a scanning tunneling microscope (STM) to receive data characterizing a tunneling current between a tip of the scanning tunneling microscope system and a sample, to estimate, in real-time, a work function associated with the scanning tunneling microscope system, and to adjust, by a control system, a position of the tip based on an estimated work function. Associated systems are described herein.
Actuator control system with transient reduction after redundancy level changes
An example actuator control system includes an actuator, a plurality of motors configured to cooperatively operate the actuator, and a controller. The controller is configured to determine an output signal for controlling active ones of the motors during a current update cycle based on a first gain value, an integral contribution from the current update cycle, and an integral contribution from a preceding update cycle. The controller is configured to, based on a quantity of the motors that is active differing between the current and preceding update cycles, scale the integral contribution from the preceding update cycle for the output signal determination based on the first gain value and a second gain value from the preceding update cycle. A method of controlling a plurality of actuator motors is also disclosed.
METHODS, DEVICES AND SYSTEMS FOR SCANNING TUNNELING MICROSCOPY CONTROL SYSTEM DESIGN
Methods, devices, and systems for controlling a scanning tunneling microscope system are provided. In some embodiments, the methods, devices, and systems of the present disclosure utilize a control system included in or added to a scanning tunneling microscope (STM) to receive data characterizing a tunneling current between a tip of the scanning tunneling microscope system and a sample, to estimate, in real-time, a work function associated with the scanning tunneling microscope system, and to adjust, by a control system, a position of the tip based on an estimated work function. Associated systems are described herein.