G06F21/75

Machine learning model score obfuscation using time-based score oscillations
11580442 · 2023-02-14 · ·

An artefact is received. Features are later extracted from the artefact and are used to populate a vector. The vector is input into a classification model to generate a score. This score is then modified using a time-based oscillation function and is provided to a consuming application or process. Related apparatus, systems, techniques and articles are also described.

Scalable formal security verification of circuit designs
11556676 · 2023-01-17 · ·

A security verification system performs security verification of a circuit design. The security verification system simplifies formal security verification of the circuit design by replacing circuit blocks of the circuit with black box circuit blocks. The security verification system instruments the circuit design so that black-boxing can be performed for security verification without changing the security decision over the data paths. The security verification system uses dependence information of the inputs and outputs of the black box to connect inputs of the circuit block with outputs of the circuit block. The black-box circuit block keeps the logic inside the cone of influence of clocks and resets. The system performs security verification of the circuit design by proving a non-interference property of the instrumented circuit design.

Scalable formal security verification of circuit designs
11556676 · 2023-01-17 · ·

A security verification system performs security verification of a circuit design. The security verification system simplifies formal security verification of the circuit design by replacing circuit blocks of the circuit with black box circuit blocks. The security verification system instruments the circuit design so that black-boxing can be performed for security verification without changing the security decision over the data paths. The security verification system uses dependence information of the inputs and outputs of the black box to connect inputs of the circuit block with outputs of the circuit block. The black-box circuit block keeps the logic inside the cone of influence of clocks and resets. The system performs security verification of the circuit design by proving a non-interference property of the instrumented circuit design.

Method of processing secure data and electronic device supporting the same

An electronic device is provided. The electronic device includes a communication circuit, a display, a memory including a first display driver, a processor functionally connected with the communication circuit, the display, and the memory, and a secure module which is physically separated from the processor, and includes a secure processor and a second display driver, and the secure processor is configured to: when secure data is received from an external server through the communication circuit, disable the first display driver and enable the second display driver, and output a user interface including a first object corresponding to the secure data to the display by using the enabled second display driver.

Method of processing secure data and electronic device supporting the same

An electronic device is provided. The electronic device includes a communication circuit, a display, a memory including a first display driver, a processor functionally connected with the communication circuit, the display, and the memory, and a secure module which is physically separated from the processor, and includes a secure processor and a second display driver, and the secure processor is configured to: when secure data is received from an external server through the communication circuit, disable the first display driver and enable the second display driver, and output a user interface including a first object corresponding to the secure data to the display by using the enabled second display driver.

OPERATION OF A DUAL INSTRUCTION PIPE VIRUS CO-PROCESSOR
20180004945 · 2018-01-04 · ·

Circuits and methods are provided for detecting, identifying and/or removing undesired content. According to one embodiment, a method for performing content scanning of content objects is provided. A content object that is to be scanned is stored by a general purpose processor to a system memory of the general purpose processor. Content scanning parameters associated with the content object are set up by the general purpose processor. Instructions from a signature memory of a co-processor that is coupled to the general purpose processor are read by the co-processor based on the content scanning parameters. The instructions contain op-codes of a first instruction type and op-codes of a second instruction type. Those of the instructions containing op-codes of the first instruction type are assigned by the co-processor to a first instruction pipe of multiple instruction pipes of the co-processor for execution. An instruction of the assigned instructions containing op-codes of the first instruction type is executed by the first instruction pipe including accessing a portion of the content object from the system memory.

INTEGRATED CIRCUIT PROTECTION METHOD, AND CORRESPONDING INTEGRATED CIRCUIT

An integrated circuit includes a number of components disposed at a surface of a semiconductor body and an interconnect region connecting the components into a functional circuit. A metallic shield is also produced in the interconnect region. A configurable stage is configurable to operate in a receiving antenna configuration or in a detection configuration during which the integrated circuit is configured to detect a presence of an external electromagnetic radiation representative of an attack by injection of faults

Method of Writing Data to a Memory Device and Reading Data From the Memory Device
20180011995 · 2018-01-11 ·

A method of writing data to a memory device and reading data from the memory device includes issuing a challenge to a PUF device during a power-up process in order to derive a PUF response, error correcting the PUF response, providing delinearized addresses via a delinearization algorithm to the memory device using the error corrected PUF response, masking data, which is written to the memory device, via a masking module using the error corrected PUF response, de-masking data, which is read from the memory device, via the masking module (19) using the error corrected PUF response; and performing a check-sum verification of read data such that address delinearization and data masking are used together to obfuscate the memory content.

Method of Writing Data to a Memory Device and Reading Data From the Memory Device
20180011995 · 2018-01-11 ·

A method of writing data to a memory device and reading data from the memory device includes issuing a challenge to a PUF device during a power-up process in order to derive a PUF response, error correcting the PUF response, providing delinearized addresses via a delinearization algorithm to the memory device using the error corrected PUF response, masking data, which is written to the memory device, via a masking module using the error corrected PUF response, de-masking data, which is read from the memory device, via the masking module (19) using the error corrected PUF response; and performing a check-sum verification of read data such that address delinearization and data masking are used together to obfuscate the memory content.

Integrated circuit provided with decoys against reverse engineering and corresponding fabrication process

An integrated circuit includes a first domain supplied with power at a first supply voltage. A first transistor comprising in the first domain includes a first gate region and a first gate dielectric region. A second domain is supply with power at a second supply voltage and includes a second transistor having a second gate region and a second gate dielectric region, the second gate region being biased at a voltage that is higher than the first supply voltage. The first and second gate dielectric regions have the same composition, wherein that composition configures the first transistor in a permanently turned off condition in response to a gate bias voltage lower than or equal to the first supply voltage. The second transistor is a floating gate memory cell transistor, with the second gate dielectric region located between the floating and control gates.