A simulator can simulate a circuit design describing an electronic device using a single processing device of a computing system. The simulator can generate profile data associated with compilation of the circuit design and the single processing device simulation of the compiled circuit design. The profile data can identify multiple different ways to partition the circuit design and include information corresponding to the single processing device simulation of the compiled circuit design. A parallel simulation qualifier can determine a parallelism factor corresponding to an expected performance of the computing system in a multiple processing device simulation of the circuit design based on the profile data from the single processing device simulation of the circuit design. The simulator can utilize the parallelism factor to partition the circuit design in one of the different ways, and simulate the partitioned circuit design with multiple processing devices of the computing system.

A method for analyzing a specification parameter of an electronic component includes inputting a package type and at least one engineering drawing image of an electronic component; acquiring a probability value that in each view of the different viewing directions each of the plurality of specification parameter of the electronic component is labeled; taking the view of each of the plurality of specification parameters in the view direction with a highest probability value as a recommended view; performing a box selection on the plurality of specification parameters for at least one engineering drawing image with the same viewing direction as that of the recommended view by an object detection model; and identifying box-selected specification parameters to acquire a size value of identified specification parameters from the at least one engineering drawing image, and converting the size value into a corresponding editable text for output.

A method for analyzing a specification parameter of an electronic component includes inputting a package type and at least one engineering drawing image of an electronic component; acquiring a probability value that in each view of the different viewing directions each of the plurality of specification parameter of the electronic component is labeled; taking the view of each of the plurality of specification parameters in the view direction with a highest probability value as a recommended view; performing a box selection on the plurality of specification parameters for at least one engineering drawing image with the same viewing direction as that of the recommended view by an object detection model; and identifying box-selected specification parameters to acquire a size value of identified specification parameters from the at least one engineering drawing image, and converting the size value into a corresponding editable text for output.

A device including first nanosheet structures each including a first number of nanosheets, second nanosheet structures each including a second number of nanosheets that is different than the first number of nanosheets, and a plurality of rows including first rows and second rows. Where each of the first nanosheet structures is in a respective one of the first rows, each of the second nanosheet structures is in a respective one of the second rows, at least two of the first rows are adjacent one another, and at least two of the second rows are adjacent one another.

A device including first nanosheet structures each including a first number of nanosheets, second nanosheet structures each including a second number of nanosheets that is different than the first number of nanosheets, and a plurality of rows including first rows and second rows. Where each of the first nanosheet structures is in a respective one of the first rows, each of the second nanosheet structures is in a respective one of the second rows, at least two of the first rows are adjacent one another, and at least two of the second rows are adjacent one another.

The present disclosure relates to a method for electronic circuit design. Embodiments may include receiving, using a processor, an electronic circuit design and performing a deadlock check on the electronic circuit design using a using a linear temporal logic property and a proof engine. Embodiments may further include analyzing a counterexample associated with the electronic circuit design for a loop escape condition, wherein analyzing includes proving a cover trace of a liveness obligation. If the loop escape condition is reachable from the counterexample, embodiments may include extracting one or more events associated with the loop escape condition and adding a waiver constraint to the deadlock check to force a no deadlock outcome.

The present disclosure relates to a method for electronic circuit design. Embodiments may include receiving, using a processor, an electronic circuit design and performing a deadlock check on the electronic circuit design using a using a linear temporal logic property and a proof engine. Embodiments may further include analyzing a counterexample associated with the electronic circuit design for a loop escape condition, wherein analyzing includes proving a cover trace of a liveness obligation. If the loop escape condition is reachable from the counterexample, embodiments may include extracting one or more events associated with the loop escape condition and adding a waiver constraint to the deadlock check to force a no deadlock outcome.

Systems and techniques that facilitate electronic generation of three-dimensional quantum circuit diagrams are provided. In various embodiments, a system can comprise a data component that can access qubit topology data characterizing a quantum computing device. In various aspects, the system can further comprise a rendering component that can render a three-dimensional quantum circuit diagram based on the qubit topology data. In various instances, the qubit topology data can indicate which qubits of the quantum computing device are coupled together. In various cases, the rendering component can render the three-dimensional quantum circuit diagram by generating a two-dimensional qubit configuration model of the quantum computing device based on which qubits of the quantum computing device are coupled together, by extruding one or more qubit lines three-dimensionally outward from the two-dimensional qubit configuration model, and by rendering one or more quantum gates on the one or more qubit lines.

Disclosed herein are related to performing layout verification of a layout design of an integrated circuit having a slanted layout component. In one aspect, the slanted layout component having a side slanted from a base axis is detected. In one aspect, an offset angle of the side of the slanted layout component with respect to the base axis is determined. In one aspect, the slanted layout component is rotated according to the offset angle to obtain a rotated layout component. The rotated layout component may have a rotated side in parallel with or perpendicular to the base axis. In one aspect, layout verification can be performed on the rotated layout component with respect to the base axis.

Disclosed herein are related to performing layout verification of a layout design of an integrated circuit having a slanted layout component. In one aspect, the slanted layout component having a side slanted from a base axis is detected. In one aspect, an offset angle of the side of the slanted layout component with respect to the base axis is determined. In one aspect, the slanted layout component is rotated according to the offset angle to obtain a rotated layout component. The rotated layout component may have a rotated side in parallel with or perpendicular to the base axis. In one aspect, layout verification can be performed on the rotated layout component with respect to the base axis.