A method of operating an IC manufacturing system includes determining whether an n-type active region of a cell or a p-type active region of the cell is a first active region based on a timing critical path of the cell, positioning the first active region along a cell height direction in an IC layout diagram of a cell, the first active region having a first total number of fins extending in a direction perpendicular to the cell height direction. The method also includes positioning a second active region in the cell along the cell height direction, the second active region being the n-type or p-type opposite the n-type or p-type of the first active region and having a second total number of fins less than the first total number of fins and extending in the direction, and storing the IC layout diagram of the cell in a cell library.

A method of operating an IC manufacturing system includes determining whether an n-type active region of a cell or a p-type active region of the cell is a first active region based on a timing critical path of the cell, positioning the first active region along a cell height direction in an IC layout diagram of a cell, the first active region having a first total number of fins extending in a direction perpendicular to the cell height direction. The method also includes positioning a second active region in the cell along the cell height direction, the second active region being the n-type or p-type opposite the n-type or p-type of the first active region and having a second total number of fins less than the first total number of fins and extending in the direction, and storing the IC layout diagram of the cell in a cell library.

A computer-implemented method for comparing a first version of a floorplan of a design for an integrated circuit with a second version. The method comprises (i) generating a timing information for each net in the second version by determining whether timing information is available for the net in the first version; (ii) in case no timing information is available in the first version, generating the timing information for the second version by calculating a spatial distance and timing information between two points of the net using wire length differences between the first version and the second version; (iii) otherwise, generating the timing information for the second version by calculating a spatial distance and timing information between two points of the net using a wire reach table to obtain a wire delay.

A computer-implemented method for comparing a first version of a floorplan of a design for an integrated circuit with a second version. The method comprises (i) generating a timing information for each net in the second version by determining whether timing information is available for the net in the first version; (ii) in case no timing information is available in the first version, generating the timing information for the second version by calculating a spatial distance and timing information between two points of the net using wire length differences between the first version and the second version; (iii) otherwise, generating the timing information for the second version by calculating a spatial distance and timing information between two points of the net using a wire reach table to obtain a wire delay.

The following description is directed to a logic repository service. In one example, a method of a logic repository service can include receiving a first request to generate configuration data for configurable hardware using a specification for application logic of the configurable hardware. The method can include generating the configuration data for the configurable hardware. The configuration data can include data for implementing the application logic. The method can include receiving a second request to download the configuration data to a host server computer comprising the configurable hardware. The method can include transmitting the configuration data to the host server computer in response to the second request so that the configurable hardware is configured with the host logic and the application logic.

The following description is directed to a logic repository service. In one example, a method of a logic repository service can include receiving a first request to generate configuration data for configurable hardware using a specification for application logic of the configurable hardware. The method can include generating the configuration data for the configurable hardware. The configuration data can include data for implementing the application logic. The method can include receiving a second request to download the configuration data to a host server computer comprising the configurable hardware. The method can include transmitting the configuration data to the host server computer in response to the second request so that the configurable hardware is configured with the host logic and the application logic.

Microelectronic circuit com-prises a plurality of logic units and register circuits, arranged into a plu-rality of processing paths, and a plu-rality of monitoring units associated with respective ones of said processing paths. Each of said monitoring units is configured to produce an observation signal as a response to anomalous opera-tion of the respective processing path. Each of said plurality of logic units belongs to one of a plurality of delay classes according to an amount of delay that it is likely to generate. Said de-lay classes comprise first, second, and third classes, of which the first class covers logic units that are likely to generate longest delays, the second class covers logic units that are likely to generate shorter delays than said first class, and the third class covers logic units that are likely to generate shorter delays than said second class. At least some of said plurality of pro-cessing paths comprise logic units be-longing to said second class but are without monitoring units. At least some of said plurality of processing paths comprise logic units belonging to said third class but have monitoring units associated with them.

Microelectronic circuit com-prises a plurality of logic units and register circuits, arranged into a plu-rality of processing paths, and a plu-rality of monitoring units associated with respective ones of said processing paths. Each of said monitoring units is configured to produce an observation signal as a response to anomalous opera-tion of the respective processing path. Each of said plurality of logic units belongs to one of a plurality of delay classes according to an amount of delay that it is likely to generate. Said de-lay classes comprise first, second, and third classes, of which the first class covers logic units that are likely to generate longest delays, the second class covers logic units that are likely to generate shorter delays than said first class, and the third class covers logic units that are likely to generate shorter delays than said second class. At least some of said plurality of pro-cessing paths comprise logic units be-longing to said second class but are without monitoring units. At least some of said plurality of processing paths comprise logic units belonging to said third class but have monitoring units associated with them.

Disclosed in the present invention is a method for optimizing circuit timing based on a flexible register timing library. First, registers are simulated respectively in a case of a plurality of groups of an input signal conversion time, a clock signal conversion time, and a register load capacitance, corresponding actual propagation delays at this time are obtained by changing setup slack and hold slack of the registers, and actual propagation delays of the registers under specific input signal conversion time, clock signal conversion time, register load capacitances, setup slack, and hold slack are obtained through linear interpolation, to establish a flexible register timing library; and then static timing analysis is performed on all register paths in a circuit by using the library, a minimum clock cycle under a condition of satisfying that a setup time margin and a hold time margin are both greater than zero is found by changing the setup slack and hold slack of the registers, thereby improving the performance of the circuit without changing the design of the circuit and without increasing the area overheads of the circuit.

A detection unit (231) detects, based on synthesis result data obtained by logic synthesis on design data of a target circuit, a predicted place where a glitch is predicted to occur in the target circuit. An insertion unit (232) inserts a glitch removal circuit in an output side of the predicted place by making a change to at least one of the synthesis result data and the design data.