A test fixture for testing magnetic heads to be used in a magnetic data recording system. The test fixture includes a test fixture body that includes lead terminals. The lead terminals, which can be constructed of Si have a top surface and first and second laterally opposed sides. An electrically conductive material is formed over the lead terminal and extends down the sides of the lead terminal. Extending the lead terminal down the sides of the lead terminal as well as over the top surface provides improved adhesion of the electrically conductive lead material to the lead terminal. This improved adhesion is especially beneficial for use in such a test fixture, because the test fixture is designed to flex during use, which would otherwise contribute to de-lamination of the electrically conductive lead material from the lead terminal.

A method of forming a read head. The method includes forming first and second read sensors that are substantially trapezoidal in shape. A first read measurement is performed on a storage medium using the first read sensor. A second read measurement is performed on the storage medium using the second read sensor. Based on a comparison of the first and second read measurements to a predetermined quantity, either the first read sensor or the second read sensor is selected to be operational in a data storage device.

A dual perpendicular magnetic recording writer is disclosed wherein first and second dynamic fly height (DFH) heaters WDFH1 and WDFH2, are formed in first and second writers, respectively, on a slider in a head gimbal assembly. In one embodiment, WDFH1 and WDFH2 have front sides that are recessed behind first and second back gap connections (BGC), respectively, and join together at their respective backsides behind the interconnect which connects a bucking coil and driving coil each symmetrically disposed about a center plane separating the two writers. In another embodiment with a separate bucking coil in each writer, WDFH1 and WDFH2 are formed behind separate interconnects. Magnetic spacing loss is reduced compared with a single DFH heater spread across both writers. Close point at touchdown in a cross-track direction and the size of the touchdown area are controlled by applying a WDFH1:WDFH2 power ratio from 100:0 to 0:100.

A method of forming a read head. The method includes forming first and second read sensors that are substantially trapezoidal in shape. A first read measurement is performed on a storage medium using the first read sensor. A second read measurement is performed on the storage medium using the second read sensor. Based on a comparison of the first and second read measurements to a predetermined quantity, either the first read sensor or the second read sensor is selected to be operational in a data storage device.

A method of forming a read head. The method includes forming first and second read sensors that are substantially trapezoidal in shape. A first read measurement is performed on a storage medium using the first read sensor. A second read measurement is performed on the storage medium using the second read sensor. Based on a comparison of the first and second read measurements to a predetermined quantity, either the first read sensor or the second read sensor is selected to be operational in a data storage device.

A method that includes supplying a predetermined signal to a write head having side shields. The method also includes performing, by the write head, a recording operation on a surface of a data storage medium, when the predetermined signal is supplied to the write head, to provide a recorded magnetization pattern. The method further includes carrying out measurements on a portion of the recorded magnetization pattern influenced by a magnetization of the side shields. The measurements are employed to determine whether a reversed side shield magnetization condition is present in the write head.

A method is provided for manufacturing a magneto-resistive device, comprising the steps of: extracting at least one subset of bars from at least one bar section of a wafer; obtaining a magnetic performance of the at least one subset of the bars; determining an angle based on the magnetic performance; and processing remaining bars from the at least one bar section of the wafer based on the determined angle.

A test fixture for testing a slider configured for heat assisted magnetic recording. The test fixture has a three dimensional structure with contact pads configured to make contact with electrically conductive contact pads at the trailing edge of the slider. The test fixture also has a structure with a contact pad configured to make electrical contact with a contact pad formed at a backside surface of the slider.