Techniques are provided for operating a memory package and more specifically to increasing bandwidth of a system having stacked memory. In an example, a system can include a storage device having a first type of volatile memory and a second type of volatile memory, and a host device coupled to the storage device. The host device can issue commands to the storage device to store and retrieve information of the system. The host device can include a memory map of the storage device and latency information associated with each command of the commands. The host can sort and schedule pending commands according to the latency information and can intermix commands for the first type of volatile memory and commands for the second type of volatile memory to maintain a high utilization or efficiency of a data interface between the host device and the storage device.

Described herein are two transistor (2T) memory cells that use TFTs as access and gain transistors. When one or both transistors of a 2T memory cell are implemented as TFTs, these transistors may be provided in different layers above a substrate, enabling a stacked architecture. An example 2T memory cell includes an access TFT provided in a first layer over a substrate, and a gain TFT provided in a second layer over the substrate, the first layer being between the substrate and the second layer (i.e., the gain TFT is stacked in a layer above the access TFT). Stacked TFT based 2T memory cells allow increasing density of memory cells in a memory array having a given footprint area, or, conversely, reducing the footprint area of the memory array with a given memory cell density.

Examples herein relate to a memory device comprising an eDRAM memory cell, the eDRAM memory cell can include a write circuit formed at least partially over a storage cell and a read circuit formed at least partially under the storage cell; a compute near memory device bonded to the memory device; a processor; and an interface from the memory device to the processor. In some examples, circuitry is included to provide an output of the memory device to emulate output read rate of an SRAM memory device comprises one or more of: a controller, a multiplexer, or a register. Bonding of a surface of the memory device can be made to a compute near memory device or other circuitry. In some examples, a layer with read circuitry can be bonded to a layer with storage cells. Any layers can be bonded together using techniques described herein.

A pseudo static memory device includes multiple memories, an arbiter and a controller. The memories respectively generate multiple self-refresh request signals. Each of the self-refresh request signals indicates a time period for performing self-refresh operation of corresponding memory. The arbiter receives the self-refresh request signals and generates a latency synchronize flag during the memories being enabled. The controller decides an accessing latency for accessing the memories during an accessing operation according to the latency synchronize flag.

Examples herein relate to a memory device comprising an eDRAM memory cell, the eDRAM memory cell can include a write circuit formed at least partially over a storage cell and a read circuit formed at least partially under the storage cell; a compute near memory device bonded to the memory device; a processor; and an interface from the memory device to the processor. In some examples, circuitry is included to provide an output of the memory device to emulate output read rate of an SRAM memory device comprises one or more of: a controller, a multiplexer, or a register. Bonding of a surface of the memory device can be made to a compute near memory device or other circuitry. In some examples, a layer with read circuitry can be bonded to a layer with storage cells. Any layers can be bonded together using techniques described herein.

Some examples relate to a method. In this method, a metal isolation test circuit, which is disposed on a semiconductor substrate, is received. The metal isolation test circuit includes a plurality of transistors and an interconnect structure coupled to the plurality of transistors. The interconnect structure includes a plurality of pins. A first voltage bias is applied across first and second pins of the plurality of pins, and a first leakage current is measured while the first voltage bias is applied. A process or a design rule by which the metal isolation test circuit is made is characterized based on the first leakage current.

A pseudo static memory device includes multiple memories, an arbiter and a controller. The memories respectively generate multiple self-refresh request signals. Each of the self-refresh request signals indicates a time period for performing self-refresh operation of corresponding memory. The arbiter receives the self-refresh request signals and generates a latency synchronize flag during the memories being enabled. The controller decides an accessing latency for accessing the memories during an accessing operation according to the latency synchronize flag.

A memory system and an operating method thereof are provided. The memory system includes a plurality of pseudo static random access memory chips and a memory controller. The pseudo static random access memory chips are coupled to each other. When receiving an action command, each of the pseudo static random access memory chips determines whether a refresh collision occurs in itself, and generates a collision signal accordingly. The memory controller controls the pseudo static random access memory chips according to the collision signal. All of the pseudo static random access memory chips share their respective collision signals to perform a same latency synchronously.

Examples herein relate to a memory device comprising an eDRAM memory cell, the eDRAM memory cell can include a write circuit formed at least partially over a storage cell and a read circuit formed at least partially under the storage cell; a compute near memory device bonded to the memory device; a processor; and an interface from the memory device to the processor. In some examples, circuitry is included to provide an output of the memory device to emulate output read rate of an SRAM memory device comprises one or more of: a controller, a multiplexer, or a register. Bonding of a surface of the memory device can be made to a compute near memory device or other circuitry. In some examples, a layer with read circuitry can be bonded to a layer with storage cells. Any layers can be bonded together using techniques described herein.

A semiconductor memory device is provided. The semiconductor memory device can suppress increases in power consumption. As a result, damage to the data normally caused by row hammer problem can be prevented. The semiconductor memory device includes a control unit. The control unit controls a refresh operation for a memory to be performed at any interval, wherein there are a plurality of possible intervals. When read/write access to the memory is required, the control unit controls the refresh operation for the memory to be performed with a shortest interval among the intervals, until a predetermined condition is met.