A beam shaping assembly (10) used in a neutron capture system and capable of changing an irradiation range of a neutron beam. The beam shaping assembly includes: a beam inlet (11), a target (12), a moderator (13) adjoining the target (12), a reflector (14) surrounding the moderator (13), a thermal neutron absorber (15) adjoining the moderator (13), a radiation shield (16) arranged inside the beam shaping assembly (10), and a beam outlet (17). The beam shaping assembly (10) further includes replacement components (21, 22) that can be attached to and detached from the beam shaping assembly (10) to change the irradiation range of the neutron beam.

A beam shaping assembly (10) used in a neutron capture system and capable of changing an irradiation range of a neutron beam. The beam shaping assembly includes: a beam inlet (11), a target (12), a moderator (13) adjoining the target (12), a reflector (14) surrounding the moderator (13), a thermal neutron absorber (15) adjoining the moderator (13), a radiation shield (16) arranged inside the beam shaping assembly (10), and a beam outlet (17). The beam shaping assembly (10) further includes replacement components (21, 22) that can be attached to and detached from the beam shaping assembly (10) to change the irradiation range of the neutron beam.

The disclosure relates to an electron-optical module of an electron-optical apparatus. The electron-optical module comprises a vacuum chamber, a high voltage shielding arrangement located within the vacuum chamber, and an aperture array configured to form a plurality of beamlets from an electron beam and located within the high voltage shielding arrangement. Wherein the electron-optical module can be configured to be removable from the electron-optical apparatus.

The disclosure relates to an electron-optical module of an electron-optical apparatus. The electron-optical module comprises a vacuum chamber, a high voltage shielding arrangement located within the vacuum chamber, and an aperture array configured to form a plurality of beamlets from an electron beam and located within the high voltage shielding arrangement. Wherein the electron-optical module can be configured to be removable from the electron-optical apparatus.

Phase contrast and dark-field X-ray imaging enable imaging of objects that absorb or reflect very little X-ray light. Disclosed is a method and systems for performing coded-mask-based multi-contrast imaging (CMMI). The method includes providing radiation to a coded mask that has a known phase and absorption profile according to a pre-determined pattern. The radiation is then impingent upon a sample, and the radiation is detected to perform phase-reconstruction and image processing. The method and associated systems allow for the use of maximum-likelihood and machine learning methods for reconstruction images of the sample from the detected radiation.

Phase contrast and dark-field X-ray imaging enable imaging of objects that absorb or reflect very little X-ray light. Disclosed is a method and systems for performing coded-mask-based multi-contrast imaging (CMMI). The method includes providing radiation to a coded mask that has a known phase and absorption profile according to a pre-determined pattern. The radiation is then impingent upon a sample, and the radiation is detected to perform phase-reconstruction and image processing. The method and associated systems allow for the use of maximum-likelihood and machine learning methods for reconstruction images of the sample from the detected radiation.

A focusing grating device (100) is described comprising a substrate (402) and a grating comprising a plurality of grating features (408) positioned on the substrate (402). The grating features (408) are positioned non-perpendicular to the substrate surface, thereby inducing a first focusing direction. The substrate (402) is curved, thereby inducing a second focusing direction, which is different from the first focusing direction. An X-ray system (300) comprising such a focusing grating device (100) as well as a method for producing such a focusing grating device (100) are also described.

A mask for use in compressed sensing of incoming radiation includes a material that modulates an intensity of incoming radiation, a plurality of mask aperture regions, and one or more axes of rotational symmetry with respect to the mask aperture regions. Each mask aperture region includes at least one mask aperture that allows a higher transmission of the incoming radiation relative to other portions of the mask aperture region. The relative transmission sufficient to allow a reconstruction of compressed sensing measurements and has a shape that provides a symmetry under rotation about the one or more axes of rotational symmetry. A mutual coherence of a sensing matrix generated by a rotation of the plurality of mask aperture regions is less than one. An imaging system for compressed sensing of incoming radiation including such a mask is also provided.

A compensating device for use in ion-based radiotherapy may comprise a disk with a number of protrusions may be placed in a radiation beam to affect the ions in the beam in different ways to create an irradiation field from a broad beam. This is particularly useful in FLASH therapy because of the limited time available or modulating the beam. A method of designing such a compensating device is proposed, comprising the steps of obtaining characteristics of an actual treatment plan comprising at least one beam, determining at least one parameter characteristic of the desired energy modulation of the actual plan by performing a dose calculation of the initial plan and, based on the at least one parameter, computing a shape for each of the plurality of elongated elements to modulate the dose of the delivery beam to mimic the dose of the initial plan per beam.

In some variations, an interferometric frequency-reference apparatus comprises: an atom source configured to supply neutral atoms; a collimator configured to form a collimated beam of the neutral atoms; one or more probe lasers; and a Doppler laser configured to determine a ground-state population of the neutral atoms. Other variations provide a method of creating a stable frequency reference, comprising: forming a collimated beam of neutral atoms; illuminating the neutral atoms with first and second probe lasers; adjusting the frequencies of the first probe laser and second probe laser using Ramsey spectroscopy to an S.fwdarw.D transition of the neutral atoms; and determining a ground-state population of the neutral atoms with another laser. The interferometric frequency-reference apparatus may provide an optical frequency reference or a microwave frequency reference.