G21K1/02

FADING-IN OF A COLLIMATOR FIELD OF AN X-RAY SOURCE IN AN EXAMINATION AREA
20230050646 · 2023-02-16 · ·

One or more example embodiments of the present invention relates to a method for fading-in a collimator field of an X-ray source in an examination area of an X-ray recording with an X-ray system, the method including first fading-in of a first collimator field with a first light field in a first color, and second fading-in of a second collimator field with a second light field in a second color, the second color being different from the first color.

FADING-IN OF A COLLIMATOR FIELD OF AN X-RAY SOURCE IN AN EXAMINATION AREA
20230050646 · 2023-02-16 · ·

One or more example embodiments of the present invention relates to a method for fading-in a collimator field of an X-ray source in an examination area of an X-ray recording with an X-ray system, the method including first fading-in of a first collimator field with a first light field in a first color, and second fading-in of a second collimator field with a second light field in a second color, the second color being different from the first color.

ELECTRON BEAM RADIATION SYSTEM WITH ADVANCED APPLICATOR COUPLING SYSTEM HAVING INTEGRATED DISTANCE DETECTION AND TARGET ILLUMINATION

The present invention relates to linear, straight through electron beam machines that incorporate a rotary coupling system to easily attach and manually or automatically rotate field defining members such as applicators and/or shields to the electron beam machines. The rotary coupling systems also incorporate functionality for using different kinds of optical signals to automatically provide illumination, reference mark projection, and/or distance detection. The optical signals generated downstream from heavy collimator components and are transmitted along the central axis of the field defining elements so that function and accuracy are maintained as the components rotate.

X-ray micro-beam production and high brilliance x-ray production

An x-ray micro-beam radiation production system is provided having: a source of accelerated electrons, an electron focusing component configured to focus the electrons provided by the source, and a target which produces x-rays when electrons impinge thereon from the source. The electron focusing component is configured to focus the electrons provided by the source such that they impinge at a focal spot having a width δ formed on a surface of the target. The focusing component is configured to move the electron beam relative to the target such that the focal spot moves across the target surface in the width direction, and/or the target is movable relative to the focusing component such that the focal spot moves across the target surface in the width direction, the surface velocity of the focal spot across the target surface in the width direction being greater than v.sub.t where:formula (I), k, ρ and c denoting respectively the heat conductivity, the density and the heat capacity of the target material, and d denoting the electron penetration depth in the target material. v t = π k 4 ρ c .Math. δ d 2 ,

X-ray micro-beam production and high brilliance x-ray production

An x-ray micro-beam radiation production system is provided having: a source of accelerated electrons, an electron focusing component configured to focus the electrons provided by the source, and a target which produces x-rays when electrons impinge thereon from the source. The electron focusing component is configured to focus the electrons provided by the source such that they impinge at a focal spot having a width δ formed on a surface of the target. The focusing component is configured to move the electron beam relative to the target such that the focal spot moves across the target surface in the width direction, and/or the target is movable relative to the focusing component such that the focal spot moves across the target surface in the width direction, the surface velocity of the focal spot across the target surface in the width direction being greater than v.sub.t where:formula (I), k, ρ and c denoting respectively the heat conductivity, the density and the heat capacity of the target material, and d denoting the electron penetration depth in the target material. v t = π k 4 ρ c .Math. δ d 2 ,

COLLIMATOR

An N-M tomography system comprising: a carrier for the subject of an examination procedure; a plurality of detector heads; a carrier for the detector heads; and a detector positioning arrangement operable to position the detector heads during performance of a scan without interference or collision between adjacent detector heads to establish a variable bore size and configuration for the examination. Additionally, collimated detectors providing variable spatial resolution for SPECT imaging and which can also be used for PET imaging, whereby one set of detectors can be selectably used for either modality, or for both simultaneously.

SCANNING METHOD AND APPARATUS

The invention discloses a scanning method and apparatus suitable for scanning a pipeline or process vessel in which a beam of gamma radiation from a source is emitted through the vessel to be detected by an array of detectors which are each collimated to detect radiation over a narrow angle relative to the width of the emitted radiation beam.

SCANNING METHOD AND APPARATUS

The invention discloses a scanning method and apparatus suitable for scanning a pipeline or process vessel in which a beam of gamma radiation from a source is emitted through the vessel to be detected by an array of detectors which are each collimated to detect radiation over a narrow angle relative to the width of the emitted radiation beam.

Dynamically Adjustable Focal Spot
20180012724 · 2018-01-11 ·

Methods for maintaining a specified beam profile of an x-ray beam extracted from an x-ray target over a large range of extraction angles relative to the target. A beam of electrons is generated and directed toward a target at an angle of incidence with respect to the target, with the beam of electrons forming a focal spot corresponding to the cross-section of the electron beam. At least one of a size, shape, and orientation of the electron beam cross-section is dynamically varied as the extraction angle is varied, and the extracted x-ray beam is collimated. Dynamically varying the size, shape or orientation of the electron beam cross-section may be performed using focusing and stigmator coils.

X-RAY DIAGNOSIS APPARATUS AND CONSOLE

An X-ray diagnosis apparatus according to an embodiment includes an X-ray limiter having four diaphragm blades; and a console on which four physical operating units that correspond to the four diaphragm blades are placed at four positions. When viewed from the side of the operator of the console, the four operating units are placed on the far side, the near side, the left side, and the right side. The far-side operating unit, the near-side operating unit, the left-side operating unit, and the right-side operating unit correspond to the upper diaphragm blade, the lower diaphragm blade, the left-side diaphragm blade, and the right-side diaphragm blade, respectively, with reference to an X-ray image displayed in a display. An operation of moving the far-side operating unit in the far-side direction results in the movement of the upper diaphragm blade in the upward direction of the X-ray image displayed in the display, and an operation of moving the far-side operating unit in the near-side direction results in the movement of the upper diaphragm blade in the downward direction of the X-ray image displayed in the display. An operation of moving the near-side operating unit in the far-side direction results in the movement of the lower diaphragm blade in the upward direction of the X-ray image displayed in the display, and an operation of moving the near-side operating unit in the near-side direction results in the movement of the lower diaphragm blade in the downward direction of the X-ray image displayed in the display. An operation of moving the left-side operating unit in the leftward direction results in the movement of the left-side diaphragm blade in the leftward direction of the X-ray image displayed in the display, and an operation of moving the left-side operating unit in the rightward direction results in the movement of the left-side diaphragm blade in the rightward direction of the X-ray image displayed in the display. An operation of moving the right-side operating unit in the leftward direction results in the movement of the right-side diaphragm blade in the leftward direction of the X-ray image displayed in the display, and an operation of moving the right-side operating unit in the rightward direction results in the movement of the right-side diaphragm blade in the rightward direction of the X-ray image displayed in the display.