A focusing grating device (100) is described comprising a substrate (402) and a grating comprising a plurality of grating features (408) positioned on the substrate (402). The grating features (408) are positioned non-perpendicular to the substrate surface, thereby inducing a first focusing direction. The substrate (402) is curved, thereby inducing a second focusing direction, which is different from the first focusing direction. An X-ray system (300) comprising such a focusing grating device (100) as well as a method for producing such a focusing grating device (100) are also described.

An imaging system (IS) including device (G, IFD) for phase contrast and/or dark field imaging such as a grating (G). The device has a periodic structure with a spatial period p. The imaging system (IS) further includes a phase stepping mechanism (PSM) configured to facilitate a relative phase stepping motion between the device (G, IFD) and a focal spot (FS) of an X-ray source (XS) of the imaging system (IS). The relative phase stepping motion covers a distance greater than the said spatial period to reduce artifacts in dark-field or phase contrast imagery caused by defects in the grating.

A phase contrast X-ray imaging system includes: an illumination source adapted to illuminate a region of interest; a diffraction grating adapted to receive illumination from the illuminated region of interest, the diffraction grating comprising a spatial structure having a first periodicity superimposed with a second periodicity that is different from the first periodicity; and a detector adapted to detect illumination passing through the diffraction grating, wherein the spatial structure is defined by varying height and/or pitch, and wherein the spatial structure imparts a first phase dependence based on the first periodicity and an additional phase dependence based on the second periodicity on the illumination passing through the diffraction grating.

The present invention relates to a detector (10) for a dark-field and/or phase-contrast interferometric imaging system. The detector comprises a plurality of pixels (50), a plurality of first detector arrays (20), pixel a plurality of second detector arrays (30), and a processing unit (40). The plurality of pixels are arranged in a two-dimensional pattern. Each pixel comprises a first detector array and a second detector array. Each first detector array comprises a plurality of fingers (22). Each second detector array comprises a plurality of fingers (32). For each pixel the fingers of the first detector array are interleaved alternately with the fingers of the second detector array. For each pixel interaction with an incident X-ray photon can lead to charge generation in at least one finger of the first detector array of that pixel and can lead to charge generation in at least one finger of the second detector array of that pixel. For each pixel the first detector array is configured to detect a cumulative charge associated with the plurality of fingers of the first detector array and the second detector array is configured to detect a cumulative charge associated with the plurality of fingers of the second detector array. For each pixel the processing unit is configured to assign an X-ray interaction event to either the first detector array or the second detector array on the basis of the detector array that has the highest cumulative charge.

In accordance with the invention, an X-ray amplitude analyzer grating adapted for use in an interferometric imaging system, the interferometric imaging system comprising an X-ray source and an X-ray detector with an X-ray fringe plane between the X-ray source and the X-ray detector, wherein an X-ray fringe pattern is formed at the X-ray fringe plane, wherein the X-ray amplitude analyzer grating is provided. The X-ray amplitude analyzer grating comprises a plurality of grating pixels across two dimensions of the X-ray amplitude analyzer grating, wherein each grating pixels of the plurality of grating pixels has a different pattern with respect to all adjacent grating pixels to the grating pixel so that all adjacent grating pixels do not have a same pattern as the grating pixel.

An x-ray tube source is disclosed that allows differential phase shift, attenuation, and x-ray scattering features of an object to be acquired in a single exposure. Such multiplexed x-ray tube source includes multiple x-ray spot origins controlled in such a way that each slightly separated spot is temporally modulated “ON and OFF” at differing frequencies. In an x-ray interferometer system, such x-ray tube source forms multiple illumination beams of a single angular view of an object's feature but each with different interference fringe locations. A composite image can be acquired with a high frame-rate digital detector as a component element in such x-ray interferometer system. Such composite image can be subsequently de-multipexed and separately presented according to each spot-source illumination beam. Such isolated images of an object's feature, each having different fringe locations, allows for post-acquisition “fringe-mapping” analysis of the feature's full interaction with x-rays, including refraction, scattering, and absorption.

In order to improve the mechanical stability of an X-ray grating with top bridges for X-ray dark field imaging and/or X-ray phase contrast imaging, it is proposed to reduce or prevent the undesired high stress on the top bridges by a change in the manufacturing process. Specifically, it is proposed to electroplate the top bridges after the bending. In other words, the electroplating of the top bridges is performed on the bent geometry.

Disclosed herein is an x-ray interferometer for x-ray phase contrast imaging including an x-ray source, an x-ray source grating, two x-ray phase gratings, an x-ray analyzer grating and an x-ray detector. An alternative interferometer includes a periodically structured x-ray source, two x-ray phase gratings, an x-ray analyzer grating and an x-ray detector. The phase gratings are placed much closer to the x-ray detector than to the x-ray source and the image object is positioned upstream and close to the phase gratings to achieve high sensitivity and large field-of-view simultaneously.

A device for suspending an x-ray grid has a first rotating frame which can be rotated about a first axis. The x-ray grid is disposed in or on the rotating frame. Two first flexible hinge elements are connected to the first rotating frame and are aligned along the first axis. The first rotating frame is reversibly rotatable about the first axis. An x-ray arrangement has one or more such suspension devices between an x-ray emitter and an x-ray detector. The articulated flexible elements of the novel device are completely play-free and significantly more cost-effective that separate hinges.

An apparatus for movably suspending an x-ray grid. The apparatus has a carrier module, in or on which the x-ray grid is arranged, and a linkage. The linkage is configured to rotate the carrier module about an axis which is vertical to the x-ray grid and/or to translate the carrier module in the plane of the x-ray grid. An x-ray arrangement has an x-ray emitter, an x-ray detector and one or more apparatus for suspending the x-ray grid between the emitter and detector. The apparatus provides for play-free kinematics which is more cost-effective than the use of known precision drives.