H01J2237/1526

Annular cooling fluid passage for magnets

A magnet having an annular coolant fluid passage is generally described. Various examples provide a magnet including a first magnet and a second magnet disposed around an ion beam coupler with an aperture there through. The first and second magnets each including a metal core having a cavity therein, one or more conductive wire wraps disposed around the metal core, and an annular core element configured to be inserted into the cavity, wherein an annular coolant fluid passage is formed between the cavity and the annular core element. Furthermore, the annular core element may have a first diameter and a middle section having a second diameter, the second diameter being less than the first diameter. Other embodiments are disclosed and claimed.

MULTICOLUMN CHARGED PARTICLE BEAM EXPOSURE APPARATUS

A multicolumn charged particle beam exposure apparatus includes a plurality of column cells which generate charged particle beams, and the column cell includes a yoke which is made of a magnetic material and generates a magnetic field of a predetermined intensity distribution around an optical axis of the column, and a coil which is wound around the yoke. The coil includes a plurality of divided windings, which are driven by different power sources.

Deflector and charged particle beam system
11251013 · 2022-02-15 · ·

There is provided a deflector that produces only a weak resulting combined hexapole field. The deflector (100) has first to sixth coils (11-16). The first to third coils (11-13) are equal in direction of energization. The fourth to sixth coils (14-16) are equal in direction of energization. The first coil (11) and fourth coil (14) are opposite in direction of energization. The first, third, fourth, and sixth coils (11, 13, 14, 16) are equal in electromotive force. The second coil (12) is equal in electromotive force to the fifth coil (15) and twice the electromotive force of the first coil (11).

Electron beam vaporizer and method for vaporizing a vaporization material by means of an electron beam
11133154 · 2021-09-28 · ·

According to various embodiments, a method for vaporizing a vaporization material by means of an electron beam may include the following: generating a first deflection pattern having a first power density at least on an end face of a rod-shaped vaporization material; and, subsequently, generating a second deflection pattern having a second power density on a portion of an outer edge of the rod-shaped vaporization material and a portion of an inner edge of a ring crucible, which encloses the rod-shaped vaporization material, wherein the second power density is greater than the first power density.

Control method for multi-phase winding deflection scanning device

The present invention discloses a control method for a multi-phase winding deflection scanning device, comprising: defining a rectangular coordinate system where deflection scanning tracks are located; sequentially decomposing the deflection scanning tracks into finite point rectangular coordinate data; translating the rectangular coordinate data into corresponding point resultant exciting current data; decomposing the resultant exciting current data into n-phase winding exciting current data; and translating the n-phase winding exciting current data into corresponding n-phase control instruction electrical signals and outputting same to a drive power supply, amplifying the output electrical signals by the drive power supply and providing same for the multi-phase winding deflection scanning device as exciting current.

Charged particle beam device

A charged particle beam device includes a deflection unit that deflects a charged particle beam released from a charged particle source to irradiate a sample, a reflection plate that reflects secondary electrons generated from the sample, and a control unit that controls the deflection unit based on an image generated by detecting the secondary electrons reflected from the reflection plate. The deflection unit includes an electromagnetic deflection unit that electromagnetically scans with the charged particle beam by a magnetic field and an electrostatic deflection unit that electrostatically scans with the charged particle beam by an electric field. The control unit controls the electromagnetic deflection unit and the electrostatic deflection unit, superimposes an electromagnetic deflection vector generated by the electromagnetic scanning and an electrostatic deflection vector generated by the electrostatic scanning, and controls at least a trajectory of the charged particle beam.

Deflector and Charged Particle Beam System
20200243297 · 2020-07-30 ·

There is provided a deflector that produces only a weak resulting combined hexapole field. The deflector (100) has first to sixth coils (11-16). The first to third coils (11-13) are equal in direction of energization. The fourth to sixth coils (14-16) are equal in direction of energization. The first coil (11) and fourth coil (14) are opposite in direction of energization. The first, third, fourth, and sixth coils (11, 13, 14, 16) are equal in electromotive force. The second coil (12) is equal in electromotive force to the fifth coil (15) and twice the electromotive force of the first coil (11).

CONTROL METHOD FOR MULTI-PHASE WINDING DEFLECTION SCANNING DEVICE

The present invention discloses a control method for a multi-phase winding deflection scanning device, comprising: defining a rectangular coordinate system where deflection scanning tracks are located; sequentially decomposing the deflection scanning tracks into finite point rectangular coordinate data; translating the rectangular coordinate data into corresponding point resultant exciting current data; decomposing the resultant exciting current data into n-phase winding exciting current data; and translating the n-phase winding exciting current data into corresponding n-phase control instruction electrical signals and outputting same to a drive power supply, amplifying the output electrical signals by the drive power supply and providing same for the multi-phase winding deflection scanning device as exciting current.

CHARGED PARTICLE BEAM DEVICE

A charged particle beam device includes a deflection unit that deflects a charged particle beam released from a charged particle source to irradiate a sample, a reflection plate that reflects secondary electrons generated from the sample, and a control unit that controls the deflection unit based on an image generated by detecting the secondary electrons reflected from the reflection plate. The deflection unit includes an electromagnetic deflection unit that electromagnetically scans with the charged particle beam by a magnetic field and an electrostatic deflection unit that electrostatically scans with the charged particle beam by an electric field. The control unit controls the electromagnetic deflection unit and the electrostatic deflection unit, superimposes an electromagnetic deflection vector generated by the electromagnetic scanning and an electrostatic deflection vector generated by the electrostatic scanning, and controls at least a trajectory of the charged particle beam.

ELECTRON BEAM VAPORIZER AND METHOD FOR VAPORIZING A VAPORIZATION MATERIAL BY MEANS OF AN ELECTRON BEAM
20190318909 · 2019-10-17 ·

According to various embodiments, a method for vaporizing a vaporization material by means of an electron beam may include the following: generating a first deflection pattern having a first power density at least on an end face of a rod-shaped vaporization material; and, subsequently, generating a second deflection pattern having a second power density on a portion of an outer edge of the rod-shaped vaporization material and a portion of an inner edge of a ring crucible, which encloses the rod-shaped vaporization material, wherein the second power density is greater than the first power density.