A magnet having an annular coolant fluid passage is generally described. Various examples provide a magnet including a first magnet and a second magnet disposed around an ion beam coupler with an aperture there through. The first and second magnets each including a metal core having a cavity therein, one or more conductive wire wraps disposed around the metal core, and an annular core element configured to be inserted into the cavity, wherein an annular coolant fluid passage is formed between the cavity and the annular core element. Furthermore, the annular core element may have a first diameter and a middle section having a second diameter, the second diameter being less than the first diameter. Other embodiments are disclosed and claimed.

Various methods and systems are provided for an X-ray tube cathode focusing element. In one example, a focusing element is configured with three electron emission filaments, an integrated edge focusing, and a bias voltage. The integrated edge focusing may include a continuous single architecture with rounded edges, and a voltage of the focusing element may be negatively biased relative to a voltage of the electron emission filaments.

An object detector and a sensing apparatus are provided. The object detector includes a light source, a light deflector configured to deflect light emitted from the light source, and a photodetector configured to detect the light that is deflected by the light deflector and then is reflected at an object, where the light deflector includes a plurality of reflection planes that rotate on a rotation axis, the reflection planes are oblique to the rotation axis and are rotationally symmetrical about the rotation axis, and the light that is emitted from the light source enters the light deflector in a direction parallel to the rotation axis. The sensing apparatus includes the object detector, and a monitoring controller configured to determine whether an object is present, and obtain movement information of the object including at least one of moving direction and moving speed of the object.

The phase modulation device 3 includes a first phase modulation element 11 which modulates a phase of a light flux in accordance with a voltage applied to each of a plurality of first electrodes in accordance with a first ratio of a second aberration component to a first aberration component of a wave front aberration generated by an optical system including an objective lens 4; a second phase modulation element 12 which modulates a phase of a light flux in accordance with a voltage applied to each of a plurality of second electrodes in accordance with a second ratio of the second aberration component to the first aberration component; and a control circuit 13 which controls voltages applied to each of first electrodes and each of second electrodes in accordance with a distance from the objective lens to a light focusing position of the light flux.

The phase modulation device 3 includes a first phase modulation element 11 which modulates a phase of a light flux in accordance with a voltage applied to each of a plurality of first electrodes in accordance with a first ratio of a second aberration component to a first aberration component of a wave front aberration generated by an optical system including an objective lens 4; a second phase modulation element 12 which modulates a phase of a light flux in accordance with a voltage applied to each of a plurality of second electrodes in accordance with a second ratio of the second aberration component to the first aberration component; and a control circuit 13 which controls voltages applied to each of first electrodes and each of second electrodes in accordance with a distance from the objective lens to a light focusing position of the light flux.

The extraction electrode has a pair of sub-assemblies that define a gap. Each sub-assembly has a suppression plate and ground plate secured together in spaced relation by pairs of insulating assemblies. A plate assembly extends perpendicularly from the ground plate. The gap between the subassemblies is set by tabs on a centering fixture extension.

Methods and systems for acquiring and/or projecting images from and/or to a target area are provided. Such a method or system can includes an optical fiber assembly which may be driven to scan the target area in a scan pattern. The optical fiber assembly may provide multiple effective light sources (e.g., via a plurality of optical fibers) that are axially staggered with respect to an optical system located between the optical fiber and the target area. The optical system may be operable to focus and/or redirect the light from the multiple light sources onto separate focal planes. A composite image may be generated based on light reflected from and/or projected onto the separate focal planes. The composite image may have an extended depth of focus or field spanning over a distance between the separate focal planes while maintaining or improving image resolution.

An example embodiment includes a cathode assembly. The cathode assembly includes a cathode head, a filament, a focusing structure, and a non-rectilinear focusing aperture. The cathode head defines a filament slot. The filament is positioned in the filament slot that is capable of emitting electrons by thermionic emission. The focusing structure is positioned at least partially between the filament and an anode. The non-rectilinear focusing aperture is defined in the focusing structure. The non-rectilinear focusing aperture is configured to shape an emission profile of electrons emitted by the filament.

An example embodiment includes a cathode assembly. The cathode assembly includes a cathode head, a filament, a focusing structure, and a non-rectilinear focusing aperture. The cathode head defines a filament slot. The filament is positioned in the filament slot that is capable of emitting electrons by thermionic emission. The focusing structure is positioned at least partially between the filament and an anode. The non-rectilinear focusing aperture is defined in the focusing structure. The non-rectilinear focusing aperture is configured to shape an emission profile of electrons emitted by the filament.

A system for extending the life of a repeller in an IHC ion source is disclosed. The system includes an IHC ion source wherein the back surface of the repeller has been shaped to reduce the possibility of electrical shorts. The separation distance between the back surface of the repeller and the chamber wall behind the repeller is increased along its outer edge, as compared to the separation distance near the center of the repeller. This separation distance reduces the possibility that deposited material will flake and short the repeller to the chamber wall. Further, in certain embodiments, the separation distance between the back surface of the repeller and the chamber wall near the center of the repeller is unchanged, so as to minimize the flow of gas that exits from the chamber. The back surface of the repeller may be tapered, stepped or arced to achieve these criteria.